Test Programming
Consulting companies that provide/develop complete testing solutions or specific software capabilities or tools, and even end-product operation and maintenance training. Using a combination of original and generic capabilities, they save time, resources, and costs of the production company. (teradyne.com)
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Product
Programming Software
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- IO-Link data from the sensor into the cloud- Safe data transfer- Web-based dashboard for visualization and analysis of cloud data
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Product
WaferPro Express On-Wafer Measurement Program Software
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WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its new user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.
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Product
2-Module ICT System, I317x Series 6
E9902G
In-Circuit Test System
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
In-Circuit Tester
Sparrow MTS 30
In-Circuit Test System
The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
ATG Program
FS-ATG
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FS-ATG is the world's easiest ATG program - pull-down menus, online help, and test generation wizard guide new users step-by-step through the process. It takes less than 2 minutes to 'point & click' a setup program for a board full of devices.Generates Vectors Faster Than EverFS-ATG is a 32-bit Windows 98/NT/2000 application that takes full advantage of today's powerful PC's. Small devices finish in seconds and most FPGAs / CPLDs, even the largest and most complex, can develop great tests after in just a few hours.
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Product
Remote Assisted Programming in Your Shop with Guaranteed Results!
RAP®2
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*Free up your technicians to do higher-skilled work and increase your profitability, with Opus IVS' team of experts doing the programming for you remotely.*No need to send complex vehicles to the dealership or call a mobile technician for flashing.*Have confidence that all vehicles will be successfully programmed and your customers will leave your shop satisfied.
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Product
Mixed Signal, Multi-Functional Test Module
PXIe-ScanIO-112
Test Module
The PXIe-ScanIO-112 delivers a powerful combination of digital, analog, and AC-coupled testing in a single PXIe module. With 104 boundary-scan controllable digital I/O channels and 8 analog I/O channels ranging from –15V to +15V, engineers gain the flexibility to test a wide variety of board-level designs. The module supports IEEE-1149.6 AC-coupled interconnect testing, configurable single-ended and differential pin operation, and integrates seamlessly with the Corelis ScanExpress™ suite.
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Product
SPICE-Based Analog Simulation Program
TINA-TI
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TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages and waveforms. TINA''s schematic capture is truly intuitive-a real "quickstart."
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Product
Scienlab Combined Battery Test Solution
SL1133A
test
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Product
NI Semiconductor Test Systems
Test System
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Product
PCIe 5.0 Test Platform
PXP-500A
Test Platform
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Product
Automotive Ethernet Test Fixture
AE6941A
Test Fixture
The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
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Product
Universal Automated Programming System
4900
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The 4900 is powered by the newest BPM 9th generation technology, which delivers the fastest programming speeds in the industry for MCU’s, eMMC HS400, NAND, NOR and Serial Flash devices. BPM 9th generation technology produces 200 MHz signals, allowing each byte of data to transfer in up to 2.5 ns. Up to 9 times faster than competing programmers. 3D Vision option inspects BGA, CSP, QFP, TSOP, SOIC and J-Lead devices for coplanarity, bent lead, pitch, width, diameter, standoff and XY errors.
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Product
Iridium Physical Layer Test Systems
PLTS
Test System
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
HV Test System for Patient Monitors
Test System
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
In-Line RF Test Platform
AR925
Test Platform
This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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Product
Programming of Fast Data Acquisition
ADbasic
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ADbasic is the solution for flexible and simple programming of fast data acquisition, open-loop and closed-loop control procedures. The ADbasic programs are executed on the real-time CPU of the ADwin hardware after the occurrence of an event signal.
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Product
ASCA Pilot Program Participation
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Compatible Electronics, Inc. is a testing laboratory participant under the United States Food and Drug Administration’s Accreditation Scheme for Conformity Assessment (FDA ASCA) pilot program. We are listed under ASCA ID# TL-80, TL-81 and TL-82.
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Product
Cartridge Testing
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Print Quality Text and Graphics. Seal Evaluation. Toner Hopper Seal Performance. Remanufactured and Recharged Cartridges. Machines and Multifunctional Products
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Product
Testing Automation
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Zhengzhou SMS Electric Co.,Ltd
Three-phase electric energy meter automatic calibration pipeline.
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Product
Laser Testing
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CI Systems provides a wide range of laser testers, whether stand-alone systems, such as Depot Field Laser Tester, Depot Laser Tester or integrated in a multi-sensor electro-optical test bench. These testers can also be integrated with CI Systems' standard Laser Tester software and PC package to serve as the necessary testing tool for a larger system comprising a Laser Range Finder, Laser Marker and Laser Designator.
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Product
Test Patterns
DisplayMate Multimedia Edition
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DisplayMate Technologies Corporation
DisplayMate Multimedia Edition is the most advanced and powerful version of DisplayMate ever, with lots of proprietary and highly innovative suites of test patterns for setting up, tuning-up, calibrating, testing, evaluating, diagnosing, and analyzing CRTs, analog and digital LCD, Plasma, DLP, LCoS, and SXRD monitors and projectors, microdisplays, video boards, color printers, TVs and HDTVs, NTSC/PAL Television encoders and decoders, and more.
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Product
Test Clips
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Angled Nose allows tight hold on 66 blockUse on 110 block with jumper and bed of nailsUse on larger cables with single piercing nail
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Product
Test Tool
Iron - IEC 60870-6
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Iron is a Windows™ application that creates compliant IEC 60870-6 (TASE.2/ICCP) Applications, both unidirectional and bidirectional. Iron is a highly configurable tool with multiple simulation options for changing Data Model values and generating valid message traffic. Support for Read, Write, Reporting, Discovery, Controls, and Dynamic DataSets are built into the tool.
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Product
Wafer Test
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Silicon Turnkey Solution, Inc.
Most foundries provide wafers already probed to a set of DC parameters at room temperature to ensure they meet a basic subset of the package-part specification. Beyond this basic set of tests, more rigorous testing is often needed to meet specifications requiring die to be 100 percent probed, identify and segregate devices with higher performance levels and guarantee that parts will perform to a certain specification level.
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Product
DIP Program Header
Series 675
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DIP Program Headers. Aries DIP programmable headers offer unusual versatility for programming within the header itself. They can be individually programmed using cutters or Aries programming tool, Part No. T-675, available separately, to remove the interconnecting sections. Consult Data Sheet No. 22002 for Aries programming tool.
