Test Programming
Consulting companies that provide/develop complete testing solutions or specific software capabilities or tools, and even end-product operation and maintenance training. Using a combination of original and generic capabilities, they save time, resources, and costs of the production company. (teradyne.com)
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Product
Programable Power Supply & Programable Electronic Load
PW-8033P
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*DC 0~32V / 0~3A X 2 + Fix 5V/3A*Triple Output 207 VA High Power*4 Digits, 4 Display*Programable Control, 9 Memory*Built In USB Interface*Series 0~64V / 0~3A Operation
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Product
Integration of Flash / Controller Programming
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Flash or microcontroller programming can be integrated in a wide variety of ways, depending on the type and scope of the application.
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Product
Scalable Tester System for Functional Testing
UTP6010
Functional Test
The UTP6010 is a scalable tester system for functional testing, comprising an integrated main switching unit, a keyboard drawer and a swivelling monitor. It is the reliable, modular, low priced UTP starter kit. The system is suitable for tester applications, where space-saving devices are required, because its construction height is only 12 HU (excluding keyboard drawer and main switching unit).
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Product
Test System
BMS HIL
Test System
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Product
Memory Test Systems
T5503HS2
Test System
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
High Speed Test Bench
AT444
Test Platform
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Product
Flash Programming for Functional Test Systems
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Flash programming stations allow you to offload flash programming from functional test systems, increasing test throughput while improving capital utilization. Circuit Check flash programmer fixtures support multiple programmer types and multiple I/O configurations.
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Product
Bottom Electrode SMD Test Fixture
16198A
Test Fixture
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Product
Regenerative Battery Pack Test System
17040E
Test System
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
Testing & Programming Solution - Electronic Assemblies
BARCUDA VP230
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The BARCUDA VP230 is the right system if you are looking for a complete turnkey solution for flexible testing and programming of your electronic assemblies. The stand-alone unit uses the technologies of embedded JTAG solutions such as VarioTAP or ChipVORX. However, you can also expand these to meet the functional test requirements of your electronics production.
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Product
Explosive Test Site Range Instrumentation
test
Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Product
Programable Power Supply & Programable Electronic Load
EL-820P
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*Digital button control and easy operation*High resolution(20mV, 10mA, 0.1W, 0.1Ω)*Overload prevention function*9 sets programmable memory*4 sets real time display*Voltage range: 1V~63V*Current range: 10mA~15A*Maximum power: 200W*Operation mode: CV, CC, CP and CR*Built in USB interface
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Product
SoC Test System
V93000 SoC / Smart Scale
Test System
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
Universal In-System Programming Tool
ScanExpress JTAG Programmer
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ScanExpress JTAG Programmer is a universal in-system programming (ISP) solution designed for convenience and versatility—a modular, multi-functional, and high-performance tool to program, read, and verify Flash memories, serial EEPROMs, CPLDS, FPGAs, and more.Like all Corelis ScanExpress family products, ScanExpress Programmer is a tool for all phases of the product life cycle—whether programming early code during product development, programming production code during manufacturing, or reprogramming units out in the field, ScanExpress Programmer is designed to fit all in-system-programming needs.
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Product
Total Substation Maintenance Program
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S. D. Myers' Solutions offers Substation Maintenance Services which provide the means to solve your substation and transformer needs. One phone call gives you access to the S. D. Myers' team, our expertise and experience, as well as our network of partnerships, all working toward the goal of extending the relaible and cost-effective life of your substation equipment.
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Product
Sealed Beam Bulb Testing System
H710019SSL
Test Platform
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Product
DVB / MPEG Stream Analyzer program
dvbsnoop
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dvbsnoop is a DVB / MPEG stream analyzer program, which enables you to watch (live) stream information in human readable form. Its purpose is to debug, dump or view digital stream information (e.g. digital television broadcasts) send via satellite, cable or terrestrial. Streams can be SI, PES or TS. Basically you can describe dvbsnoop as a "swiss army knife" analyzing program for DVB, MHP, DSM-CC or MPEG
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Product
6TL36 Inline Handler
AM304
Test Handler
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
Battery Test Platform
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Product
Application Programming Interface Software
AltaAPI
Interface
Alta’s 1553 and ARINC cards include the most advanced Application Programming Interface (API) library tools in the avionics industry, AltaAPI. The API architecture is a properly OSI modeled development package that provides an extremely flexible design to provide quick porting to various operating systems (such as VxWorks 5.X/6.X/7/MILS, Integrity, LynxOS RTOS), Linux 32- and 64-bit, Solaris 10, LabVIEW and 32- and 64-bit Windows 7/8/8.1/10.
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Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
Premier Automated Programming System
PSV7000
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The world’s premier automated programming system with the speed, flexibility and fast changeover to handle any job at the lowest total cost of ownership.
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Product
4-Module ICT System, I307x Series 6
E9903G
In-Circuit Test System
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
CPE Design Verification System
Jupiter 310
Test System
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
