Bias Test
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FADEC/EEC Test Platform
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Benchtop Communication Test System
ATS3000A
The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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DC Bias Injector
J2130A
When using the network analyzer to measure impedance, such as the capacitance and ESR or a capacitor, or the DCR of an inductor, etc., it is often necessary to provide a voltage bias to the device being tested. This is true of semiconductor junction capacitances, varactors, and some ceramic capacitors (especially X5R). In these cases the impedance is a function of the DC bias on the device. The Picotest DC bias injector (J2130A) is used for this purpose during impedance measurements.
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Mixed Signal, Multi-Functional Test Module
PXIe-ScanIO-112
The PXIe-ScanIO-112 delivers a powerful combination of digital, analog, and AC-coupled testing in a single PXIe module. With 104 boundary-scan controllable digital I/O channels and 8 analog I/O channels ranging from –15V to +15V, engineers gain the flexibility to test a wide variety of board-level designs. The module supports IEEE-1149.6 AC-coupled interconnect testing, configurable single-ended and differential pin operation, and integrates seamlessly with the Corelis ScanExpress™ suite.
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Conformance Test System
TS-RRM
The R&S®TS-RRM 5G and LTE test system is a test solution for running 5G NR and LTE inter-RAT RRM test cases for certification of wireless devices.It is a fully automated conformance test system for running validated RRM conformance test cases. In addition to the RRM test cases required by GCF/PTCRB, the R&S®TS-RRM also supports carrier acceptance specific RRM tests.
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Off-Line Testing Platform
6TL29
6TL29 Testing platforms are based on the modularity concept; its construction is completely modular and scalable, allowing the user to take advantage of a powerful and reliable platform with a minimum investment.The platform is compact and due to its reduced footprint can be integrated easily into any production line. It’s ideal for High-Mix Low-Mid Volume production environments.
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Tunnel Diode Zero Bias Detectors
A tunnel diode zero-bias detector is a device that converts microwave and millimeter-wave radio frequency (RF) signals into a DC voltage without requiring an external power source
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Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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High Power Switch and Bias Module
Macom Technology Solutions Holdings Inc.
MACOM’s High-Power Switch and Bias modules are extensively used in 4G and 5G TDD base stations as well as aerospace and defense applications. The PIN Diode Switch features high power handling, low insertion loss, and super board band performance. The integrated bias controller utilizes a boost circuit and provide the driver circuitry to the switch. The modules require only a single 5 V supply, and a single TX / RX control signal which greatly reduced the customer design complexity.
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Bias Tee's
A bias "T" consists of a feed inductor to deliver DC to a connector on the device side and a blocking capacitor to keep DC from passing through to the receiver.
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EVSE Test Platform
To manage both the challenging high-power requirements of electric vehicle supply equipment and the market demand, it is crucial to rely on a test system that performs to your specs. The right system needs to combine the tools for reliable asset communication, microgrid management, effective protocol simulation and high-power testing. This EVSE platform combines the right energy regeneration equipment with 25+ years of test experience to deliver the results you need to meet conformance in the time you need it.
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RF Amplifiers Bias Controllers
RF amplifier bias controllers generate a regulated drain voltage and actively adjusts the gate voltage of an external amplifier to achieve constant bias current. It can be used to bias any enhancement and depletion type amplifier operating in Class-A regime with drain voltages (VDRAIN) as specified. These devices achieve excellent bias stability over supply, temperature and process variations, and eliminates the required calibration procedures used to prevent RF performance degradation due to such variations.
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Communications Test System for Frontline Diagnostics
ATS3000P
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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PCI Express 3.0 Test Platform with SMBus Support
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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6TL29 Semi-Automated Test Platform
AQ377
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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DC Bias Current Power Supply
TH1775
Shenzhen Chuangxin Instruments Co., Ltd.
TH1775 is a DC Bias Current Source (or DC Magnetization Current Source) used for inductance measurement of inductors and transformer windings with DC bias current. Except for constant current output, low additional error and wide frequency response range are important for bias current inductance measurement. High frequency LCR meter could be used, when the frequency response range is wide enough. MPU controlled auto current balance technology is adopted to realize AC+DC current overlap and constant current output from 0 to ±20A. Two TH1775 can be paralleled to supply a maximum current up to 40A.TH1775 permits high frequency measurement up to 1 MHz and can be directly controlled by TH2816A, TH2817A, TH2818 and TH2819. TH1773/TH1775 with its low additional error, wide frequency response range and sweep output function is widely used in DC biased inductance measurement. TH1775 also provides a perfect solution for magnetic material analysis.
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Dual Channel, Low-Noise DC Bias Card
PI-41701
The PI-41701 is a dual channel bipolar DC Bias supply that can provide an output current up to 100 mA per channel. The output voltage ranges from –8 V to +8 V and features programmable current limits with LED indicators and software interrupt to show/alert the user if the channel is in current limit. This card has special filter circuitry to reduce the output noise for those applications that require a low noise bias output.
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110 GHz Frequency Extender, Pulsed DC Bias
N5293AX52
The Keysight N5293AX52 is a broadband frequency extension module designed for use with Keysight’s new PNA / PNA-X-based millimeter-wave solutions. It is a compact, lightweight, and ruggedize frequency extender module with built-in bias tee for pulsed DC bias operation. It interfaces with the Keysight N5292A test set controller. The modules allow users to extend the frequency coverage of a base PNA / PNA-X Series network analyzers to a range of 10 MHz to 110 GHz. For more information about cable and accessories for use with network analyzers, please visit Network Analyzer Accessories.
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Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Bias Tees for Radio Amateurs
Bias Tee for remote power supply of preamplifiers and converters via the coaxial cable.
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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POGO-1 High Performance Bias Ball Probe
POGO-1
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Bias Network, 45 MHz to 26.5 GHz
11612A
The Keysight 11612A broadband high power bias network can be used in a wide variety of biasing applications for test and measurement requirements in laboratory and production environments. Bias networks provide the means of supplying DC bias to the center conductor of the coax connector for your device while blocking the DC to the RF port.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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DC Bias Current Source
TH1778B
Changzhou Tonghui Electronic Co., Ltd.
■ Test Frequency: 0Hz - 2MHz ■ Provide 0~20A of constant current output ■ No support of output extension
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DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
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Bias Tees From 0.03 MHz To 85 GHz
Pulsar offers a large variety of bias tees that cover frequencies from DC to in both surface mount and connectorized packages. Many models are available with voltages up to 100 volts and currents up to 8 amps and custom requirements are welcomed. Options include higher voltage and current, higher RF input power and a choice of either an RF connector or a feedthrough connection for the DC input port.
