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Optical VisionInspection System
NIDEC-READ's inspection systems serve to locate open/leak circuits on printed substrates forming different conductor patterns within inner/outer layers. These vision inspection systems are also used to measure the shape of via holes and solder bumps and to find scratches and stains on them.
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Test Suite
IEC 61850
The Test Suite is a group of Windows application that support IEC 61850 as well as IEC 60870-6 (TASE.2/ ICCP). New InSight functionality allows creation of custom graphical displays and scripted simulation design/debug via flowchart GUI. The Test Suite is comprised of three separate products.
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Material Testing
Materials testing, measurement of the characteristics and behavior of such substances as metals, ceramics, or plastics under various conditions. The data thus obtained can be used in specifying the suitability of materials for various applications, building or aircraft construction, machinery, packaging etc.
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Pre-Certification Testing
Gain confidence that your product passes certificationVerify your product qualityTest specific areas
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Cable Identification System & Cable Phasing System
Impulse Phaser
With the introduction of direct buried, solid dielectric primary voltage cables, the IMPULSE PHASER has come into greater prominence for safely and accurately identifying buried primary cables, including jacketed neutral designs. The IMPULSE PHASER has been accurately used on paper insulated, lead covered feeders in excess of 20 miles and even on submarine cable 300 feet underwater.
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EMI/EMC Testing
EMI/EMC testing can reliably predict product performance in any electromagnetic environment. Testing can also determine the possibility of interference with other equipment, possibly degrading performance. Testing may be required in order to comply with regulations or for informational and product improvement purposes.
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GC System
Gas Chromatography System
Shanghai Selon Scientific Instrument Co. Ltd.
An analytical tool used to separate, identify, and quantify individual compounds in a complex mixture.
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Components for System Integration
Bh offers a wide range of accessories to improve your photon counting experiment such as experimental control modules, optomechanics or implantable fiber probes for in-vivo applications. For PMTs and MCPs we offer different preamplifiers and a variety of routing devices for multi-detector operation. For a perfect SYNC signal, trigger modules and a SYG are available.
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Surge Voltage and Surge Current Testing Systems
HIGHVOLT Prüftechnik Dresden GmbH
Pulse Voltage Test Systems are used for surge testing on transformers, cables, gas insulated switchgear (GIS), arresters, and other high voltage equipment.
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Test Systems
This measurement system is the state-of-the-art acoustical analyser from Norsonic. Using the experiences and accumulated know-how from the previous generations of analysers, Norsonic is offering a multi-channel system with focus on user friendliness, high efficiency, and accurate reporting. The system has been designed for field testing as well as demanding accredited lab measurements.
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Environmental Testing
DATASYST Engineering & Testing Services, Inc.
Simulate real-world environmental conditions to know how your product or component measures up. DATASYST evaluates how your product responds to environmental stressors, including temperature, thermal shock, humidity and altitude.
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Equipment Failure Diagnosis System and Safety Management System
A system for diagnosing failures of rotating machinery such as turbines, motors, pumps, fans, and compressors, which are major facilities in nuclear power, hydropower, thermal power plants, petrochemical plants, shipbuilding, and aviation, through displacement sensors.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Augmented Reality Systems
ARTIST replaces current limited, live-fire or laser-based training, while enhancing both training effectiveness and efficiency. Our system saves ammunition costs and cuts logistics, giving personnel quality training time.
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Integrated I-V Test Systems
The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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Flexible Switching System
S6400D
Universal Switching Corporation
High performance and expandable, the third generation S6400D offers coaxial switching configurations as small as 8x8 and can be expanded to a full 64x64. Simply install more modules in the field. Configurable for Video, RF, IF, Data and many other types of signals.
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Radar level sensors: applications & products
Our radar level sensors offer reliable, fast level measurement with micrometer-level accuracy. This opens up new applications for level measurement – for example, in the level control of molten steel or aluminum for the metal industry or in the high-precision flow measurement of bulk material on conveyor belts for the mining industry.
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Version Control System
Helix Core
Perforce Helix Core is the leading version control system for teams who need to accelerate innovation at scale. Store and track changes to all your digital assets, from source code to binary to IPs. Connect your teams and empower them to move faster and build better.
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Cable Fault and Test System Vans
Whether you are working on-site, in the countryside or an urban environment, having the right equipment available when conducting fault location operations is vital. When the correct tools can be accessed easily, fault-location time speeds up dramatically, and faults can be dealt with more efficiently. Megger’s range of cable test vans offer solutions to the challenges of fault location in the real world, no matter the environment. Our test van systems have been developed in collaboration with end users to ensure that they live up to the standards of daily fieldwork. Our vans are designed to be adaptable to the end users needs so that the most appropriate tests may be carried out for the cable in question, regardless of whether it is low, medium or high voltage.
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Test Adapter
cPCI/VME/VME64x
The test adapter is used for measurement and testing of test specimen boards, which gives optimal access of signals, address lines as well as power from backplane assembly. Usually the test adapter includes fields for voltage and amp, current measurements and in some cases also some pins for wire wrap to conduct custom connections.
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Microwave Testing
110H
The PICOPROBE® MODEL 110H is a high performance microwave probe which incorporates our patented coaxial design techniques and has inherent low loss and low dispersion characteristics.
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Dimensional Metrology System
PINNACLE PLUS
Pinnacle+ Plus elevates Pinnacle performance to the next level. Pinnacle+ Plus features a rigid granite optical support structure and a high performance Z-axis motion assembly to produce the lowest possible uncertainty on micro-electronic parts and assemblies/
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Test System
NFC Xplorer
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Probe System for Life
PS4L
The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.
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Sonar systems
For surface ship applications Ultra has developed a comprehensive, fully-integrated sonar system, comprising both on-board sonars such as hull-mounted and towed arrays. This modular system fuses data from own-ship and off-board sensors to build a complete underwater tactical picture delivering a bi-static sonar capability.
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Test Equipment
ST9020G3
Shenzhen Star Instrument Co., Ltd.
The ST9020G3 single-phase meter test equipment is compact, lightweight and portable. It tests 1 to 3 single-phase active energy meter simultaneously. Users may operate the test equipment via keyboard or PC-based software. It also simultaneously measures the errors of three energy meters. It connects to a meter rack via its COM port.
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Condition Monitoring System
Cut costs and boost productivity with a condition-monitoring tool designed for ease of use and scalability. The Dynapar OnSite™ system is a powerful predictive maintenance system targeted at preventing failures before they occur. It can slash unscheduled downtime, improve efficiency of route-based vibration analysis, and provide real-time analytics and trending to warn of possible machine failures.
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Mobil Cable Test and Fault Location System
SWG-12 (SWG-32)
• testing cable insulation with DC (rectified) voltage up to 32 kV;• conditioning faults by burning faulty cable insulation with current up to 100 mA;• pre-locating cable faults with the reflectometer RIF-9 based on the pulse reflection method (TDR), voltage wave oscillation method (DECAY), impulse current envelope (ICE) method and arc reflection method (ARC / ARC multi-shot);• pinpointing cable faults with the acoustic method with up to 2000 J surge wave generator and a suitable signal receiver.
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Power System Operations
Schweitzer Engineering Laboratories, Inc.
Automate data collection, concentrate phasor data, and analyze data with real-time analytics.
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Radar Water Level Gauge
HR7310
HighReach Measuring & Controlling System Co.,Ltd
The this Series of Products's IS A Liquid Level Detection Instrument a using Microwave Technology. It IS the Designed to Monitor Natural Water or Auxiliary Water treatment the Operations and the Provide Accurate Water Level Information for Monitoring or Operating Units. At The Product absorbs at The 24GHz Planar microstrip Radar Technology of InnoSent, The signal processing adopts its own patented method, which can work solutions around the clock, and the measurement result is accurate and reliable. At the same time, the advantages of non-contact detection, strong anti-interference and low power consumption make It is even more versatile and can be used in complex water environments with contaminants or sediments such as rivers, lakes, reservoirs or sewage treatments.





























