DDR
Double Data Rate memory achieved by reading both the rising and falling edge of clock.
See Also: Memory, Memory Test, NAND, DRAM, Memory Device, DDR4
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Product
DRAM DDR2 Memory
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Enable better electrical performance and speed (compared to DDR) with Advantech. We offers DDR2 800/667 memory with 30μ" gold plating connector (240 pin) featuring 1.8v operating voltage and better bandwidth. With rigorous reliability, vibration tests, and 0 ~ 85℃ (32 ~ 185℉) wide operating temperature range, our certified DIMM are fully suitable for enterprise, embedded, automotive, data centers, and networking applications.
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Product
SO-DIMM DDR5 Memory
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the 5th generation of DDR memory designed as a small-form-factor module for laptops, notebooks, and mini-PCs.
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Product
Multifunction Data Collection and Analysis System
2002
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The Model 2002 DME System is a state of the art, multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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Product
DH Series High-Sensitivity Solder-In Tip, 30 GHz BW, 2.0 Vpp Range
DH-SI-HS
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Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Product
Training Board
JT 2156
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The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
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Product
DH Series Tip - CrossSync PHY PCIe5 CEM x16
DH-CSPHY-PCIE5-CEMX16
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Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Product
AXIe Logic Analysis & Protocol Test
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Keysight's AXIe Modular Logic Analysis and Protocol test modules and powerful analysis software provide essential capabilities for engineers working on fast digital designs and chipsets using high speed parallel and serial buses, such as DDR and PCI Express Gen 3.
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Product
IDM+
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Multi-functional fault recorder including: -- Disturbance fault record (DFR)- Dynamic disturbance recording (DDR) - Phasor measurement unit (PMU C37-118)- Power Quality (PQ Class A)- Travelling wave fault location (TWS to +/-60m) - Impedance fault location- Protocols (61850, Modbus, DNP3) - Sequence of event recording (SOE)- GPS, IRIG and NTP time sync- iQ+ masterstation software.
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Product
Production PCB Combinational Tester
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The PT100Pro combines ARM Functional Test, Analog Test and Boundary Scan in one platform for testing up to 32 PCBs at a time. The PT100 Pro solves the test challenges and cost requirements of testing small, high-volume PCBs used in the home, mobile, entertainment, automotive and embedded markets. PCBs in these markets are cost sensitive yet require high volume, high fault coverage on leading edge technologies such as WiFi, DDR Memory, USB, Bluetooth, Nand Flash, MPEG decoders, Power Management Units, and MMC/Smart Cards interfaces.
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Product
3.5" Embedded SBC With AMD LX800, Dual LANs, 4 COM, 4 USB 2.0 And VGA/TTL (-40°C To +85°C)
SBC84620
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The SBC84620 supports AMD LX800 500MHz processor and full feature I/Os. It is an ideal entry level PC-based embedded platform and be able to be fanless operation for industrial applications. The new integrated graphic controller, 4 COM, 4 USB 2.0 ports and 1GB DDR memory features empower the system value without extra development cost. In the meanwhile, for the expansion interface, the SBC84620 provides PCI with Mini PCI socket and ISA bus through PC/104 interfaces. Also, SBC84620 gives the best TCO (Total-Cost-of-Ownership) for system design due to DDR memory supported.
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Product
Multifunction Data Collection and Analysis System
9000
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The Model 9000 DME System is a high performance multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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Product
Infrared Microscope
DDR200/300 NIR
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The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Product
Infrared Microscope
DDR200 & DDR300
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The McBain DDR200 and DDR300 for 200mm and 300mm wafer defect detection and review are unmatched in value and features in this special application and price category. The systems offer significant and unique advantages for both production and engineering use, and provide an ideal solution when both defect detection and dimensional metrology are required.
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Product
Functional/Protocol Debug and Analysis Reference Solution
DDR4
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Highest confidence in measurement accuracy! Industry’s fastest triggering and data capture for DDR4 analysis, test, and debug.
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Product
Data Recording System
Director DII - DFR DDR
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Using the Microsoft Windows 10® operating system, DII features complete Transient and Long-Term Phasor Data Recording, Analysis, and Transmission. E-MAX DII has a maximum capacity of 128 Analog and 256 Digital directly connected channels.
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Product
Detective Logic Analyzer
DDR3
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Provides logic analyzer like deep transaction Listing and Waveform capture Can store up to 1G of captured States Continuous, real time analysis, not post-processing Eye Detector guarantees valid data acquisition Extensive Triggering and Storage Qualification allows precise insight Protocol Violation Detector provides hundreds of simultaneous, real time tests to JEDEC specifications Row Hammer Analysis for potential data corruption Interactions among up to 8 ranks, over two slots are analyzed.
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Product
Recording System
Surveyor DFR DDR
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The Surveyor Recording System is a DFR/DDR with local Input Modules connected to a Controller. The Input Modules are connected to the Controller by multiconductor cables. The Controller contains a single board computer running 64-bit Microsoft Windows 10® and the E-MAX Director program, for recording, storing and transferring data.
