Impact Test
forceful strike to UUT determining strength and durability or detection of loose particles.
See Also: Drop Testers, Pendulum Impact, Impact Hammers, Crush, Hardness Testers, Rupture
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Product
SMT Surface Mount MEMS High-G Shock Accelerometers
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Piezoresistive MEMS high-amplitude shock accelerometers represent state-of-the-art industry technology for miniature, high amplitude, DC response acceleration sensors. This series is capable of measuring long duration transient motion as well as responding to and surviving extremely fast rise times, typical of a high-g shock event as found in explosive, gun and impact testing. Both packaged and OEM configurations are offered, to fulfill a variety of installation requirements.
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Product
Impact Testing
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When you need to evaluate how your product & materials react to shock loading, Trialon is here to help. By utilizing our laser-aiming test stand to create consistent positioning and ball impact, you can trust that Trialon has the equipment and personnel to conduct your test accurately and timely.
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Product
NI-9236, 10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module
785996-01
Strain/Bridge Input Module
10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module - The NI‑9236 measures dynamic strain on all channels simultaneously, allowing for synchronized, high-speed measurements. This capability is important for applications, such as impact tests, that require comparison across many channels at a particular instant in time. The NI‑9236 includes built-in voltage excitation for quarter-bridge sensors. It also has 60 VDC isolation and 1,000 V rms transient isolation, providing high‑common‑mode noise rejection and increased safety.
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Product
Impact Testing
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The Impact Testing software of the m+p Analyzer real time analyzer includes useful tools like the selection of a roving hammer or transducer, selection of data points/nodes, double impact detection and rejection, definition of force and exponential window and a user-definable display configuration as a visual measurement feedback.
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Product
Instrumented Pendulum Impact Testing System
JB(INSTRUMENTED)
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Jinan Testing Equipment IE Corporation
JB-450I/750I Instrumented Pendulum Impact Testing Machine is equipped with high precision instrumented strain-gauged striking edge & high-speed data acquisition system. This instrumented test system can measure the force of a test specimen during an impact event. Then, the instrumented test data can be used to calculate the energy absorbed by the test specimen. In addition, the crack initiation and arrest loads can be used in fracture mechanical models.
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Product
Loading Adjustable Drop Tester Machine
CX-DL15A
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Shenzhen Chuangxin Instruments Co., Ltd.
Package Impact Drop Testing Machine is used to measure the dropping impact incidence when the package in using, transportation and decorating. Labtone "1G+" project strictly ensure the accuracy. Besides precision plane drop testing, it also can undertake edge and angle test to ensure the complete performance evaluation for the package. During the products handling or transport process, there may be drop/ fall, which results in damage within the products. And this Drop Tester simulates the drop/ fall of a finished product to evaluate the damage. All the rhombohedrons, angles and faces of the products can be tested.
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Product
PTL Impact Hammer
F22.50
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Shenzhen Chuangxin Instruments Co., Ltd.
The Universal Impact Hammer is designed to perform impact tests for product durability. The F22.50 meets the testing needs of industry standards such as IEC 60068-2-75 and required by IEC 60065, 60335, 60598, 60601, 61010 and others. The hammer simulates mechanical impact to electronic products and electrical appliances.
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Product
Impact Testing
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Educated Design & Development, Inc.
1250 g body includes release mechanism and striking element guide.250 g striking element comes with cocking knob and hammer head, polyamide face, is hemispherical with a radius of 10 mm, has a hardness of HR85-100.60 g release cone with a 10N release force.Single Impact Force models range from a 0.2 J Hammer to a 2.0 J Hammer.Custom padded carrying case included.
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Product
Impact Testing Machine (Izod & Charpy)
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Suitable for Charpy & Izod Impact tests on different materials. It is based on Pendulum principle.Rigid designs of instrument frame & other parts assure minimum energy absorption during fracture which results in improved test accuracies.The highly strained & wearing parts like support blocks & strikers are of special alloy steels duly heat treated.Direct indication of Impact energy absorbed by sample on large dial -Safety guard for the user is provided.Initial potential energy for Charpy is 300 Joules & for Izod is 170 Joules with a Least Count of 2 Joules (for Analogue models) & resolution of 0.5 Joules (for Digital Model).Drop Angle of Pendulum for Charpy is 140° & for Izod is 90°.ASTM Impact Testing machine is also provided, which conforms to E-23 ASTM standard.Gauges, Tongs, Sub-zero bath, Templates, U & V Notch milling cutters are available with it (Optional).
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Product
Common Metallic Pendulum Impact Testing Machine
JB-(C/D)
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Jinan Testing Equipment IE Corporation
KB- (C/D) common type metallic pendulum impact testing system is the basic model for impact tester. The metallic pendulum impact tester is used to determine the impact resistance of metal materials under dynamic load and capable of doing a large number of impact tests continuously. The display method for the models is different, respectively there are analog dial display, touch screen digital display and computer display. For the later two models, it can display the impact power, impact toughness, and pendulum rotation angle. All the testing reports can be printed out. The metallic pendulum impact testing system is the essential quality control equipment for metal material manufacturers and QC departments, as well as the necessary instrument of research institutes for new material research.
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
Test Workflow Pro
test
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
In-Circuit Test (ICT) Fixtures
Test Fixture
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
In-Circuit Test System Calibrations
Test System
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
High-Performance Integrated Functional Test Platform
Spectrum-9100™
Test Platform
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Product
ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
Mixed Signal Battery Test System
Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Military Communications Test
Test Platform
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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Product
Gear Teeth Hardness Tester
PHT-1740
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This dedicated unit is designed to test gear teeth and other difficult to access applications. The 1740 is an economically priced hardness tester that is loaded with the same features found on the base 1700 version. The 1740 hardness tester is capable of measuring the surface hardness of a broad variety of metals on flat and round surfaces. This instrument comes complete with a dedicated DL impact device, calibrated test block and rugged carry case.
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Product
Communications Test System for Frontline Diagnostics
ATS3000P
Test System
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Product
Test System Replication/Build-to-Print
Test System
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
