Impact Test
forceful strike to UUT determining strength and durability or detection of loose particles.
See Also: Drop Testers, Pendulum Impact, Impact Hammers, Crush, Hardness Testers, Rupture
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Product
Electric Servo Motor Type Horizontal Impact Tester
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This is a horizontal impact tester using an electric servo motor type actuator system.
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Product
Low-Temperature Impact Device
DWC-1
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This low-temperature impact device is compliance with standard requirement of IEC60245, IEC60227, IEC60540, GB5013-2008, GB5023-2008 and GBT2951-2008. It’s used to test all kinds of PVC sheathed cable, wire, soft wire and no sheath of parallel soft PVC insulated impact resistance at low temperature. Specification: • Working temperature: -15℃±1℃ • Impact height: 10~200mm adjustable • Length of specimen: 5D~150D • Material: 304 stainless steel • Completion time once: 3~5s • Completion number of units for once: ≥2pcs • Weight: 100/200/300/400/500/600/750/1000/1250/1500g • Low temperature box to match additionally
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Product
Film Impact Tester
QT-FIT-3J
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The impact resistance of films is obtained by measuring the energy consumed by hemispheric impact head to make films rupture under controlled impact conditions to evaluate the impact resistance of material and its effects.
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Product
Test Lead, BNC Connector To BNC Connector Board
16048A
Test Port Cable
Extend the measurement port with a four-terminal-pair configuration that enables the attachment of user-fabricated test fixtures.
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Product
IEC60068-2-75 Spring Impact Hammer
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Shenzhen Chuangxin Instruments Co., Ltd.
Adjust the impact severity by rotating the knurled cap until the desired energy- value is displayed. Pull the knob slowly out of the device until it locks in place. If moved too fast, the clamp may skip its arrester and will lock at its way back when the pulling-force declines. Hold the device horizontally at it’s housing tube and press the (black) release cone to the specimens plane of impact. The strike is automatically released when the release force threshold is reached.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
Seismic Impact Control System
ZET 048
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Seismic impact control system is used to control ground surface shifts caused by earthquakes, explosions and other natural or technology-related factors. Seismic control system is used to obtain actual information of the seismic environment as well as for process facilities state monitoring (in particular, for petroleum industry pipelines systems control).
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Product
Digital Test Instruments
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988EL
In-Circuit Test System
The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in our stalwart Keysight 3070 and i3070 systems.
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Product
Particle Impact Noise Detector
BW-LPD-D4000
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FREQUENCY: SINE WAVE 27Hz TO 265HzACCELERATION: 0 TO 20G PEAKSHAKER: 100 FORCE LBS 3/4" IN STROKE 75 IN PER/SEC VELOCITYAMPLIFIER: 250 WATTS MINIMUMD.U.T. WEIGHT: 300 GRAMS PRACTICAL LIMIT @ 20G
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Product
IK01-IK06 Universal Spring Impact Hammer
CX-T06
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Shenzhen Chuangxin Instruments Co., Ltd.
The IK01-IK06 Universal Spring Impact Hammer is designed according to IEC60068-2-75 and IEC62262 standard. The IK01-IK06 Universal Spring Impact Hammer is mainly used to test household and similar electrical appliances shell, level, handle, knobs etc shell.
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
Battery Test Platform
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Product
Impact Series Power Discrete Semiconductor Tester
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The Impact Series Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.
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Product
LitePoint RF Test System
J750
Test System
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
Impact Hammer
WaveHitMAX
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The invention of the first smart impact hammer provides new ways of mechanical excitation for structural dynamic applications. Smart means that the device processes its signals internally. The modal hammer WaveHitMAX guarantees fully automatic, reproducible and high-precision excitation of the test object without double hits. The user can set the number of hits, impact force and the delay between hits accounting for different degrees of damping / delay times. All presettings like zero point or impact force search are made automatically by the hammer. Manual adjustment by the user is no longer necessary.
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Product
Falling Dart Impact Tester
DRK135A
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Shandong Drick Instruments Co., Ltd.
DRK135A Falling Dart Impact Tester is applicable in the impact result and energy measurement of the falling dart from a certain height against plastic films and sheets with thickness less than 1mm, which would result in 50% tested specimen failure.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
Safety Shoe Impact Tester
UI-FT02
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Safety Shoe Impact Tester is to test safety shoe toe cap impact resistance ability. .
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Product
Functional Testing and Test Engineering
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Customer-supplied or developed in-house• Ruggedization of existing (lab-built) fixtures• Co-develop hardware/software• Deployment, implementation, and training• Engineering evaluation tools• Design verification• Medical device evaluation• Manufacturing test systems• Verification test systems• Go/No-go tests• Serialization, recordkeeping, and datalogging• Troubleshooting failed units with other test platforms
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Product
Elasticity, Bend & Impact Testers
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The performance of coatings when influenced by external stresses caused by stretching, bending or impact, determines their suitability for their designed application. A coating designed for use in the coil coating industry, for example, should have the ability to stretch as the substrate is formed into its desired shape without damage.
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Product
Function Test and In-Circuit Test
CT350
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ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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Product
Test Automation System for Brake Testing
STARS Brake
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STARS Brake is an integrated automation, data acquisition and control system platform that provides a comprehensive application functionality in a single, powerful environment. STARS Brake is designed to address the needs of a wide range of brake testing applications from component development to final component and system validation. It offers users a level of flexibility and openness that enables thorough investigations of brake systems.
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Product
Haptic testing
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Haptic tests are becoming ever more important owing to the increasing and sector-independent popularity of switches and buttons in diverse products. More and more customers, especially in the automobile sector, attach great value to good haptic performance by their control elements. A precise switching feeling, low friction of the moving elements, backlash-free execution both in the rest position and during operation are only some of the criteria for good haptic switching characteristics.
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Product
Pendulum Impact Testers
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Tinius Olsen manufactures several high capacity pendulum impact testers, most of which can be easily changed from a Charpy to an Izod configuration or even to a tensile impact configuration. These testers come in several capacities and are designed primarily for determining the impact resistance of metals. They are designed to fully comply with the specifications outlined in ASTM E23, BS EN ISO 148-3, BS EN ISO 148-2 and ISO 442.
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Product
Test Hardware
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Development of additional hardware components in-houseCreation of the layout of the developed circuit boards and subsequent production outside the companyAssembly of the printed circuit boardsCreation of additional circuits for test adapters
