Impact Test
forceful strike to UUT determining strength and durability or detection of loose particles.
See Also: Drop Testers, Pendulum Impact, Impact Hammers, Crush, Hardness Testers, Rupture
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IEC60068-2-75 Spring Operated Impact Hammer
CX-T04
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Shenzhen Chuangxin Instruments Co., Ltd.
This Spring Impact hammer is strictly designed according to IEC60068-2-75, IEC884 and UL1244 GB/T2423.55-2006, GB4706.1, GB8898 and GB7000 standards. It is used to test the mechanical integrity of product enclosures. After applying the impact with the hammer, the product is examined with accessibility probes to determine access to shock, energy, and injury hazards. Built in exact accordance to IEC\EN, \UL\CSA and other international Standards.
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Wireless Test Standards Software
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Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Incline Impact Tester
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Evaluates the ability of the packaging system to withstand sudden horizontal impacts or crushing forces.
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Test Systems
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Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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ESS Performance Test System
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The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.
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SoC Test Systems
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SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Physical Layer Test System
N19301B
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The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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Product
Impact Hammer
5111, 5112, 5113
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The Impact Hammer simulates mechanical impact to the surface of the enclosures of electrical appliances and components.
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Product
Variable Impact Tester
1615
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The Elcometer 1615 Variable Impact Tester is a simple to use gauge ideal for evaluating the resistance of a coating to impact (elongation, cracking or peeling).
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Impact Series Power Discrete Semiconductor Tester
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The Impact Series Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.
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Card Impact Tester
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Tests corner impact and card bending resistance, Designed to test for MasterCard CQM and ANSI N322 requirements, Easy to use, Repeatable results, Small footprint design for benchtop use, Adjustable jaws allow use with various card thicknesses, Super heavy duty custom CNC design
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Product
IEC60068-2-75 Ik08 Spring Impact Hammer
CX-IK08
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Shenzhen Chuangxin Instruments Co., Ltd.
The spring Hammer consists of three principal parts: the body, the striking element and the release system. It's used to test the mechanical integrity of product enclosures. After applying the impact with the hammer, the product is examined with accessibility probes to determine access to shock, energy, and injury hazards. Built in exact accordance with IEC/EN, UL/CSA and other international standards.
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Product
Calibration Devices For Spring Impact Hammer
CX-TF06A
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Shenzhen Chuangxin Instruments Co., Ltd.
Calibration Devices for Spring Impact Hammer
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Product
Impact Tester
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The impact tester is used for testing the impact resistance of materials, to determine their quality under dynamic load conditions.
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Laser Diode Burn-in Reliability Test System
58604
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The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Conformance Test System
TS-RRM
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The R&S®TS-RRM 5G and LTE test system is a test solution for running 5G NR and LTE inter-RAT RRM test cases for certification of wireless devices.It is a fully automated conformance test system for running validated RRM conformance test cases. In addition to the RRM test cases required by GCF/PTCRB, the R&S®TS-RRM also supports carrier acceptance specific RRM tests.
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Lens Module Test Platform
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The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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ESD Test System
58154 Series
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ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Scienlab Battery Test System — Cell Level
SL1002A
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Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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Impact Specimen Preparation Equipment
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Jinan Testing Equipment IE Corporation
DWCT Low Temperature Chamber for Impact Specimen in Drop Weight Testing is specially designed according to ASTM E 208& equivalent ISO Test Method for DWTT of Ferrite Steel Materials. The Low Temperature Chamber adopts multiple compressors, cooling technology and utilizes the heat balance principle and cycle stirring method to realize the constant cooling to impact specimen. With digital display and automatic control temperature, the Low Temperature Chamber is an ideal equipment for cooling and keeping constant temperature.
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EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Particle Impact Noise Detector
BW-LPD-D4000
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FREQUENCY: SINE WAVE 27Hz TO 265HzACCELERATION: 0 TO 20G PEAKSHAKER: 100 FORCE LBS 3/4" IN STROKE 75 IN PER/SEC VELOCITYAMPLIFIER: 250 WATTS MINIMUMD.U.T. WEIGHT: 300 GRAMS PRACTICAL LIMIT @ 20G
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Adjustable Energy Spring-Operated Impact Hammers
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Shenzhen Chuangxin Instruments Co., Ltd.
This Spring-operated Impact hammer is mainly used for testing household and similar electrical appliances shell, lever, handle, knobs, lights and other shell to withstand mechanical shocks. The impact tester made of stainless steel or alloy.
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Digital Test Instrumentation
EDigital-Series™
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Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Test Handler
M6242
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Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Safety Footwear Impact Tester
SG-P11A
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This machine, incorporating a steel striker adaptered to fall freely on vertical guides from a predetermined height to give the required impact energy to the toe of safety footwear for measuring the degree of the dent. In addition, the toecap should not develop any cracks on the test axis with go through the material.
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6TL08 Benchtop Test Platform
H710008
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The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Test System for High Volume Production Testing of Integrated Circuits
ETS-364
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The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Test Fixture and Test Programing
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Landrex Technologies Co., Ltd.
Test Fixture and Test Programing
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NFC Conformance Test System
T3111S
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The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
