MIxed Signal Test Systems
See Also: Mixed Signal, Mixed Signal ATE, Mixed Signal Oscilloscopes, Mixed-Signal Test, Mixed Signal Testers
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Product
Mixed Signal Oscilloscope 350 MHz, 2 Analog Plus 16 Digital Channels
MSOX3032G
Oscilloscope
The MSOX3032G 350 MHz oscilloscope provides 2 analog plus 16 digital channels, 4 Mpts memory, 1,000,000 waveforms/sec update rate, zone touch trigger with an 8.5-in capacitive touch screen, and standard embedded software with waveform and measurement histograms.
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Product
Battery Test System
WBCS3000Le32
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Low current model32 channel battery cycler (expandable up to 128 channels)No. of minimum channel : 16 channelsmax. voltage range : -1V to 5Vmax. current range : ±1A
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Product
40GHz Dual Channel MW Benchtop Signal Generator
LSX4092B
Signal Generator
The LSX4092B is a 40GHz Dual Channel Microwave Signal Generator, offers industry leading performance, in an easy to use benchtop box. It features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The design offers excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Product
Mixed Signal Oscilloscope - 100 MHz, 2 Analog Plus 16 Digital Channels
MSOX3012T
Oscilloscope
100 MHz2 analog plus 16 digital channels Easily view and analyze your signals with on the large 8.5-inch capacitive touch screen Isolate signals in seconds with exclusive Zone touch triggering See more signal detail with the 1,000,000 wfms/s update rate Capture more data with up to 4 Mpts memory Expand your measurement capabilities with full upgradability: Add bandwidth, 20 MHz arbitrary waveform generator, 3-digit voltmeter, serial trigger and analysis & mask testing at any time
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Hi-Speed Discrete Test System
QT-6000
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QT-6000 Test System, with built-in capacitance test (DC+CAP) and Scanbox etc, is applicable to devices like medium & small power transistors, MOS-FET, diodes and Wafer.
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E-mobility Test Systems
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Correct contactingcharging cable detectionsecurity questionExtensive range of accessories for on-site measurements in a separate caseCharging cable with additional measuring lines (Sense)Convenient control through guided test procedure via WinSAM and tabletElectromechanical locking
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Environmental Test Systems
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Manufactured products can be exposed to both thermal and mechanical stresses.These should not be considered separately, as the effects may be linked.IMV can supply vibration-test systems combined with climatic chambers to provide complete vibration, temperature and humidity environmental testing.These systems can be custom-designed to meet your application.
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Brake Test Systems
GIANT Evo
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The GIANT Evo is an extension of the well-proven GIANT product portfolio and has been developed to suit the growing demands and needs of the current and future brake markets. Covering the market segments from mini and compact cars to medium sized SUVs as well as large vehicles, this brake testing machine forms the base of HORIBA’s inertia brake dynamometers portfolio. All components are specifically tailored to the needs of the passenger car market segment.
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Modular Battery Test System
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This modular battery test system provides for manufacturers versatile testing possibilities. Due to modularity it allows easy configuration of battery testers for a wide range of different power levels.
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Product
PXIe-5745, 12-Bit, 6.4 GS/s, 2-Channel PXI FlexRIO Signal Generator
785596-01
FlexRIO Signal Generator
The PXIe-5745 enables direct RF generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s for generation up to 1.5 GHz or in a single-channel wideband upconversion mode at 6.4 GS/s. The PXIe-5745 is ideal for applications that require high channel density IF signal generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for generating predefined waveforms, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA for dynamically creating waveforms, signal modulation/demodulation, and other custom real-time signal processing.
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Product
UXG X-Series Agile Signal Generator, 10 MHz to 40 GHz
N5193A
Signal Generator
Get closer to reality: simulate increasingly complex signal environments for radar, EW & antenna-test Test sooner & increase confidence in EW systems by generating signal simulations when you need them: the UXG is a scalable threat simulator Use pulse descriptor words (PDWs) to generate long pulse trains & individually control pulse characteristics Accurately simulate multi-threat environments: 180-ns PDW update rate, chirps 10 to 25% of carrier frequency, pulses as narrow as 10 ns
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Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
Optics Test Systems
Mobile Wedge Angle Sensor With Positioning System
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Optik Elektronik Gerätetechnik GmbH
Mobile wedge angle sensor for determining the wedge angle and the radius of curvature of glass panes, eg windshields of automobiles, helicopters, airplanes or rail vehicles.
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Automated Test System
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Automated Test System is a production-ready solution that combines test software and various hardware for validation test in both manufacturing and R&D. The solution provides a high performance and cost-effective system based on National Instruments technology.
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Product
Integrated I-V Test Systems
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The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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USB PD Test System
6050
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Single Output USB PD USB PD basic version：the single-group test systemarchitecture is as shown in the table, 5302A AC Source, 3302F + 3310F series and9922-R Quick Charge Controller.
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Product
PXIe-2514, 7-Channel, 40 A PXI Signal Insertion Switch Module
780587-14
Signal Module
PXIe, 7-Channel, 40 A PXI Signal Insertion Switch Module—The PXIe‑2514 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXIe‑2514 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls (FADECs).
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Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Magnetic-Field Test System
MTS-800
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The MTS-800 is a compact test system for broadband generation and measurement of magnetic fields. Its internal components allow automatic EMC tests according to automotivestandards where high field strength need to be generatedor measured.
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Product
Mixed Signal Oscilloscope - 6 GHz, 2 Analog and 16 Digital Channels
MSOX6002A
Oscilloscope
1 GHz - 6 GHz2 analog plus 16 digital channels Easily view and isolate signals on the 12.1-in capacitive multi-touch screen with Zone triggering and 450,000 wfms/s update rate Make more precise measurements with 115 Vrms noise floor at 1 mV/div (1 GHz)Get performance measurements anywhere with the portable 6-in deep size Quickly see analysis details with standard histogram and color grade View signal integrity with jitter and eye diagram analysis options
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Automated Thermostat Test System
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*Transport mechanism moves thermostats to various temperature controlled locations.*Continuously monitored process status*PC controlled transport and measurements*Operator is shielded from 200 - 210 degree F hot water insertion baths*LabVIEW® test/process language
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Non-contact Ultrasonic Testing System
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Yamaha Fine Technologies Co., Ltd.
Contact-free inspection through ultrasonic transmission detecting air bubbles, separation, and foreign materials inside workpieces. With a Yamaha ultrasonic amplifier installed, contact-less inspection in the air is realized. Without damaging or wetting the workpiece, it is possible to inspect the workpiece for packing defects, air bubbles, and even flaw depth.
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ESD & Latch-Up Test System
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Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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Defined CRPA Test System
BroadSim Wavefront Software
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Protecting your GNSS systems from jamming and spoofing is more critical now than ever before. BroadSim Wavefront was designed to enable easier and more affordable CRPA receiver testing, leveraging proven software-defined architecture.
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Spectrum and Signal Analyzer Frequency Extension Systems
SAE
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The SAE modules are designed to interface with your existing microwave signal or spectrum analyzer and extend its frequency coverage to 500 GHz.
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4 GHz, 20 GS/s, 4ch, 100 Mpts/Ch High Definition Mixed Signal Oscilloscope
WavePro 404HD-MS
Oscilloscope
HD4096 technology provides 12-bit resolution up to 8 GHz and 20 GS/s.Up to 5 Gpts of acquisition memory enables detailed viewing of long events.15.6" 1900 x 1080 Full HD capacitive touchscreen.New ProBus2 input supports up to 8 GHz bandwidth and direct compatibility with a wide variety of existing ProBus probes - 50Ω and 1MΩ coupling modes support all input types on a single connector.MAUI with OneTouch user interface for intuitive and efficient operation.Deep toolbox enables and simplifies complex analysis.Intuitive navigation to quickly find important features in long waveforms.Zone Trigger – Simple Triggering for Complex Signals.
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VLF test system
BAUR PHG 80 portable
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Portable, high performance test generator with VLF truesinus technology. The BAUR PHG 70/80 portable VLF test systems are used for cable and cable sheath testing of medium-voltage cables of up to 50 kV and electrical equipment.* 3 voltage shapes in one device: VLF truesinus, VLF square wave and DC voltage* For medium-voltage cables of up to 50 kV operating voltage* Cable testing, fault conditioning, cable sheath testing
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Eddy Current Test System
CIRCOGRAPH® Product Family
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Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
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Product
Antenna Test System
ATS1000
Test System
Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
