Lifetime
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Product
Linear Detector Arrays (LDAs)
X-Scan H
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This digital end-to-end solution is built on a proven concept enabling easy integration, and accelerated development time of X-ray systems. X-Scan H series has high radiation hardness extending lifetime of detectors significantly, and reducing total costs. The series is available in several standard lengths easily scalable to various configurations.
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Product
USB Data Communications Multiplexers
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These USB multiplexers are ideal for the testing of multiple devices that use USB interfaces, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance and uses long lifetime electro-mechanical relays characterized for use in data communications systems.
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Product
300W to 1800W - Single Output
HWS Series
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*Limited Lifetime Warranty*UL 508 approved*SEMI F47 Compliant (high line AC)*Universal Input (85 - 265VAC)*High Efficiency*Class 1 Div 2 option (/RY suffix)
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Product
Inline Wafer Testing
IL-800
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Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps.
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Product
PXI RF Relay Module
Relay
PXI RF Relay Modules offer single-pole double-throw (SPDT) and terminated switches. SPDT models include excellent insertion loss, voltage standing-wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay-count-tracking feature on these models to predict relay lifetime and reduce unexpected system downtime. SPDT models are also well-suited for passing high-order harmonics from PXI RF Signal Upconverter Modules or routing multiple sources to PXI RF Signal Downconverter Modules. Terminated switch models feature front-mounted SMA connectors and high-performance solid-state relays for fast switching time and unlimited mechanical lifetime. These models also include termination on every COM line and channel, which helps minimize reflections of the RF signal and protect your instruments.
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Product
Isolated Gate Drivers
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Analog Devices’ isolated gate driver portfolio offers designers performance and reliability advantages over designs utilizing optocouplers or pulse transformers. Utilizing ADI’s proven iCoupler® technology, the isolated gate driver family offers the advantage of a maximum propagation delay of 50 ns, less than 5 ns channel-to-channel matching, a 50-year lifetime for 400 V rms working voltage and galvanic isolation in a single package.
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Product
Measurement System
BLS-I/BCT-400
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The BLS-I/BCT-400 measurement systems perform lifetime measurement on monocrystalline or multicrystalline silicon (ingots or bricks) without requiring surface passivation.
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Product
PXI-2548, 2.7 GHz, 50 Ω, Quad SPDT PXI RF Relay Module
778572-48
Relay
2.7 GHz, 50 Ω, Quad SPDT PXI RF Relay Module - The PXI‑2548 is a general-purpose single‑pole double‑throw (SPDT) switch module. You can use it to add flexibility to your switch network or to maintain uniform signal paths across multiple channels when building high-channel-count multiplexers. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use its onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Product
Laser Scanning FLIM Microscopes
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DCS-120 laser scanner: Compact - Flexible - Precise. As technology leader in equipment and techniques for single photon counting, Becker & Hickl offers the DCS-120 systems that are complete laser scanning microscopes for fluorescence lifetime imaging (FLIM) since 2007. The systems use bh’s multi-dimensional TCSPC FLIM technology in combination with fast laser scanning and confocal detection or multi-photon excitation.
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Product
Reliability Testing
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ELES Semiconductor Equipment SpA
ELES designs and manufacturers reliability test solutions to verify the performance of integrated circuits from concept validation to high volume production during all the test phases. No other company can provide universal equipment for all the reliability tests, or can guarantee a seamless data flow between phases or can apply on chip embedded reliability engineering for data tracking and failure investigation. Clients use our functional test data to proactively analyse variations between lots, between temperature extremes and during lifetime (often these defects escape ATE). The improvements to products and processes needed to arrive at zero defects cannot be driven by the quantity of Big Data alone, the quality of reliability data is a strategic advantage that only ELES can provide.
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Product
PXI-2545, 2.7 GHz, 50 Ω, Terminated 4x1 PXI RF Multiplexer Switch Module
778572-45
Multiplexer Module
2.7 GHz, 50 Ω, Terminated 4x1 PXI RF Multiplexer Switch Module—The PXI‑2545 is an RF signal multiplexer switch module. The internal termination of the PXI‑2545, which helps prevent high-power reflections that arise from open channels on the module, makes it ideal for use in RF applications where such reflections can damage the source. The module also provides excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Product
Super Fast Gang ISP Programmer
448Pro2
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The Dataman 448Pro2 is a super fast PC based gang programmer with four independent 48-pin ZIF sockets, ISP capabilities and USB 2.0 connectivity • Up to 75% faster programming of high-capacity memory devices • Over 105,000 devices supported with new devices added monthly • Independent modules supporting concurrent programming • Intelligent pin drivers operate down to 1.8V so you'll be ready to program the full range of advanced low-voltage devices • Full ISP capabilities including JTAG compatibility • Hi-speed USB 2.0 connectivity • Easy to use software compatible with the latest operating systems including Windows 10 • Comprehensive 3 years parts and labor warranty • Free life-time software updates
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Product
LT-300A Aging-Life Test System For LED Luminaires
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Hangzhou Everfine Photo-E-Info Co., LTD
LT-300A system is widely used for normal /accelerated aging, lumen maintenance measuring, chromaticity shift measuring, lifetime evaluation and temperature characteristic testing for LED luminaires, arrays, and modules. The extrapolation of lifetime by programmable models is also available to estimate the lifetime of LED luminaires.
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Product
Photoluminescence Spectrometer
FLS1000
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The FLS1000 sets the standard in both steady state and time-resolved photoluminescence spectroscopy for both fundamental research and routine laboratory applications. The system is a modular fluorescence and phosphorescence spectrometer for measuring spectra from the ultraviolet to the mid-infrared spectral range (up to 5,500 nm), and lifetimes spanning from picoseconds to seconds. All of this can be achieved through various upgrade routes, either at the time of order or in the future. Whether you are studying photophysics, photochemistry, biophysics, biochemistry, material or life sciences, the FLS1000 will enable you to reliably and accurately measure luminescence spectra and kinetics using state-of-the-art sources, detectors, acquisition techniques, quality optics and precision mechanics. The large sample chamber will house practically any type of sample accessory.
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Product
FLIM Camera Systems
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The Excelitas pco.flim camera system consists of the pco.flim camera and pco.flim laser, with a complete frequency synthesizer, which is required for the generation of the modulation signals in the frequency domain. The pco.flim series features a high frequency modulated CMOS image sensor that enables pixel-wise measurements of sample luminescence lifetime distributions in frequency domain suitable for fluorescence lifetime imaging. At a maximum speed of 10 Hz, full luminescence lifetime distributions can be measured at 1 Mpixel resolution. With flexible coupling and easy setup, the pco.flim is an ideal choice for wide-field FD-FLIM instruments and suitable for a variety of biomedical applications requiring a large frame and high-speed acquisition.
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Product
PXI-2799, 40 GHz, 50 Ω, Dual SPDT PXI RF Relay Module
782359-01
Relay
40 GHz, 50 Ω, Dual SPDT PXI RF Relay Module - The PXI‑2799 is a general-purpose single‑pole double‑throw (SPDT) switch module for routing RF or microwave signals in automated test applications. You can use this module for basic signal routing or inserting and removing components in a signal path. The PXI‑2799 is also well-suited for passing high-order harmonics from PXI RF Signal Upconverter modules or routing multiple sources to PXI RF Signal Downconverter modules. You can use its onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Product
Life-time Measurement System For Silicon Bulks / Ingots With Non-contact
HF-90R
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*Silicon bulk, Prismatic shape (JIS code), Ingot condition*Non-contact photoconduction vibration decay method*Data processing by digital oscilloscope and PC with software
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Product
PIN Photodiode
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PIN photodiode is a kind of photo detector, it can convert optical signals into electrical signals.This technology was invented in the latest of 1950's. There are three regions in this type of diode. There is a p-region an intrinsic region and an n-region. The p-region and n-region are comparatively heavily doped than the p-region and n-region of usual p-n diodes. The width of the intrinsic region should be larger than the space charge width of a normal p-n junction. The PIN photo diode operates with an applied reverse bias voltage and when the reverse bias is applied, the space charge region must cover the intrinsic region completely. Electron hole pairs are generated in the space charge region by photon absorption. The switching speed of frequency response of photo diode is inversely proportional to the life time. The switching speed can be enhanced by a small minority carrier lifetime. For the photo detector applications where the speed of response is important, the depletion region width should be made as large as possible for small minority carrier lifetime as a result the switch speed also increases.
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Product
PXI-2547, 2.7 GHz, 50 Ω, 8x1 PXI RF Multiplexer Switch Module
778572-47
Multiplexer Module
2.7 GHz, 50 Ω, 8x1 PXI RF Multiplexer Switch Module—The PXI‑2547 is an RF signal multiplexer switch module. The higher channel count of the PXI‑2547 makes it ideal for test systems that require the switching of a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Product
LT-200A Aging-Life Test System For LEDs
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Hangzhou Everfine Photo-E-Info Co., LTD
LT-200A is mainly used for normal aging, accelerated aging test, lumen maintenance characteristic test, life test and temperature characteristic test of single LED and LED module.The system can monitor the photoelectric parameters and base temperature of the LED sample in real time, process the data, draw the aging curve, and calculate the lifetime exploration of the LED sample.
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Product
Analysis Software for FCS and cross-FCS
Burst-Analyzer
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*FCS Fit with User-Defined Model Functions*Identification of Single-Molecule Photon Bursts in Parameter-Tag Data*Analysis of Fluorescence Intensity and Lifetime within Photon Bursts*One- and Two-Dimensional Histograms of Burst Parameters*Filtered Histograms of Burst Parameters*Discrimination of Different Fluorescent Species or FRET States*Determination of FRET Efficiencies*Exclusion of Artifacts in Intensity Traces
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Product
PXI-2554, 2.5 GHz, 75 Ω, 4x1 PXI RF Multiplexer Switch Module
778572-54
Multiplexer Module
2.5 GHz, 75 Ω, 4x1 PXI RF Multiplexer Switch Module—The PXI‑2554 is ideal for use in video RF applications where high-frequency video signal reflections can damage the source. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Product
Lifetime Heavy Duty Circuit Tester
27000
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Checks 6 and 12 volt systems. Heavy duty battery clip. 5' of tough, flexible, heavily insulated rubber wire. Designed to withstand the most rugged use.
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Product
Super Fast Industrial Gang Programmer
448Pro2AP
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The Dataman 448Pro2AP is a super fast industrial gang programmer with four independent modules, ISP capabilities and USB 2.0 connectivity• Optimised for use in automated handlers and ATE machines • Over 71,000 devices supported with new devices added monthly • Mechanically stable case design with multiple fixing points • Independent modules supporting concurrent programming • ISP capable using the JTAG interface • Easy to use software compatible with the latest operating systems including Windows 10 • Comprehensive 3 years parts and labor warranty • Free life-time software updates
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Product
PXI-2599, 26.5 GHz, 50 Ω, Dual SPDT PXI RF Relay Module
778572-99
Relay
26.5 GHz, 50 Ω, Dual SPDT PXI RF Relay Module - The PXI‑2599 is a general-purpose single‑pole double‑throw (SPDT) switch module for routing RF or microwave signals in automated test applications. You can use this module for basic signal routing or inserting and removing components in a signal path. The PXI‑2599 is also well-suited for passing high-order harmonics from PXI RF Signal Upconverter modules or routing multiple sources to PXI RF Signal Downconverter modules. You can use its onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Product
Lighting Reliability
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LED/OLED package lifetime is highly dependent on thermal management, and LED lamp performance can be dependent on the luminaire in which it is installed. Lighting reliability test system for LED/OLED Products are widely used for normal /accelerated aging, lumen maintenance measuring, lifetime evaluation and temperature characteristic testing for LED/OLED products including LED package, array, module, OLED module and luminaires.
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Product
8-Channel A/D & D/A Zynq UltraScale+ RFSoC Gen 3 Processor - PCIe
Model 7053
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- Supports Xilinx® Zynq® UltraScale+" RFSoC FPGA- 16 GB of DDR4 SDRAM- On-board GPS receiver- PCI Express (Gen. 1, 2, and 3) interface up to x8- LVDS connections to the Zynq UltraScale+ FPGA for custom I/O- Optional front panel dual optical MPO interface for gigabit serial communication- Unique QuartzXM eXpress Module enables migration to other form factors- Navigator BSP® for software development- Navigator FDK® for custom IP development- Free lifetime applications support- Pentek's Quartz Family of Xilinx Zynq UltraScale+ RFSoC FPGA Products Video- Live Signal Acquisition Video: Quartz Model 5950 and Model 6001 RFSoC boards- Pipeline Newsletter: Strategies for Deploying Xilinx's Zync UltraScale+ RFSoC- Synchronize up to eight modules with Model 5903 High-Speed System Synchronization and Distribution Amplifier - 3U VPX- Please refer to the product datasheet for Installed FPGA IP Module details
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Product
Environmental Chambers
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Sanwood Environmental Chambers Co ., Ltd.
Sanwood climatic chambers for battery can be tested under controlled temperature and humidity conditions, similar to the conditions under which batteries operate during their lifetime.
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Product
Digital Microscopes
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Great for capturing and sharing digital information with anyone, anywhere, digital microscopes by Vision Engineering are built with quality to last a lifetime. Powerful and easy to use, their versatile, operator-friendly design means they can be repurposed as your needs change, protecting your return on investment.
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Product
Wafer Sorter and Inspection
SolarWIS Platform
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Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
