System Integration
incorporates all functioning sub-elements into one orchestrated service.
See Also: System Integrators, Test Systems, Location Based Services
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Non-booting System Diagnostics
BootPath Diagnostics
BootPath Diagnostics allow end users to troubleshoot systems that fail to boot into any operating system. BootPath Diagnostics are often integrated into the system ROM as a BIOS extension, making them available even when all storage devices are unavailable, and may also be used from a CD, USB drive, network location, or disk partition. This enables end users to better diagnose non-booting systems and provides savings in associated support and warranty costs.
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Fully-automated Test Systems
Special mechanical systems/solutions
Foerster Instruments, Incorporated
Alongside individual test instruments, we collaborate closely with our customers to develop and produce customized test systems for their application. Following a consultation with our product and sales specialists, we develop a concept to suit you. For the production process that follows, we enter into product-specific collaborations with professional mechanical system manufacturers to achieve the best possible solution. We are also happy to work with mechanical system suppliers proposed by our customers. These suppliers are often familiar with the peculiarities of the component and know how to handle them. Even after the production stage, we assist you with commissioning the test system and are are on hand to answer any questions afterwards.
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Basic Digital Systems
The Medical Imaging System can be configured simply by installing the FCR Reader, the CR Console, and the Imager to your existing X-ray equipment. The Imager uses the dry film for output and therefore does not require a dark room as in conventional systems thus saving space. Also, the scanned image can be digitally saved to media and not on films, thus not much storage space is required.
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Magnetic Measurement System
Model 110
The Model 110 Magnetic Measurement System is a very high field version of our industry-standard MESA, designed specifically to measure high-coercivity samples. It uses powerful amplifiers and specially designed water-cooled solenoid assemblies to achieve the magnetic fields required by state-of-the-art material.
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Battery Monitoring System
iPQMS-C128
The iPQMS is the premier battery monitoring system in Eagle Eye's IBwatch-Series. It ensures backup power systems are optimally maintained in large-scale environments. The iPQMS is the main processing unit that measures up to 448 jars (or 448 cells) utilizing up to seven Relaying Units (RU). Each RU connects up to 64 jars (or 64 cells) and captures data from these batteries and sends it to the MPU in real-time. The iPQMS can be used over a private network via TCP/IP, or locally with RS-232. Networked systems can utilize SMS/Email alerts during an alarm outbreak. If you do not wish to use our Battery Management Software, Modbus protocol is available for third-party integration. Flexible expanding solutions allow multiple iPQMS units to monitor all your systems in real-time.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Integrating Sphere Light Sources
Integrating sphere light sources with LED based or continuous broadband emission spectrum for use as luminance standards for camera calibration, for the determination of veiling glare, for the adjustment of night vision devices and much more. Diameters in the range from 50 mm to 500 mm with options like monitor detector, signal output control by manual and remote apertures and much more.
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Optical VisionInspection System
NIDEC-READ's inspection systems serve to locate open/leak circuits on printed substrates forming different conductor patterns within inner/outer layers. These vision inspection systems are also used to measure the shape of via holes and solder bumps and to find scratches and stains on them.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Cable Identification System & Cable Phasing System
Impulse Phaser
With the introduction of direct buried, solid dielectric primary voltage cables, the IMPULSE PHASER has come into greater prominence for safely and accurately identifying buried primary cables, including jacketed neutral designs. The IMPULSE PHASER has been accurately used on paper insulated, lead covered feeders in excess of 20 miles and even on submarine cable 300 feet underwater.
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PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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GC System
Gas Chromatography System
Shanghai Selon Scientific Instrument Co. Ltd.
An analytical tool used to separate, identify, and quantify individual compounds in a complex mixture.
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Lightwave Test Systems
Keysight offers a wide range of innovative test-and-measurement solutions to accelerate the progress of next-generation high-bandwidth optical networks. Keysight's mission in the optical market is to shorten time to market and reduce cost of test for customers in R&D and manufacturing. In addition, Keysight enables new technologies that include 40 Gb/s optical components, network elements and systems, and all-optical fiber networks.
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Equipment Failure Diagnosis System and Safety Management System
A system for diagnosing failures of rotating machinery such as turbines, motors, pumps, fans, and compressors, which are major facilities in nuclear power, hydropower, thermal power plants, petrochemical plants, shipbuilding, and aviation, through displacement sensors.
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Affordable, Ultralight, Easily Integrated Cameras
ARIA Series
ARIA represents Alkeria’s answer to the increasing demand of affordable, ultracompact, ultralight and easy to integrate cameras. Choose between the most common and requested sensors, get all the benefits of USB3 interface and Alkeria’s smart I/O. Top quality delivered in the size of a coin, the weight of a feather and at convenient price. A camera born for embedded vision, inspection and OEM design.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Augmented Reality Systems
ARTIST replaces current limited, live-fire or laser-based training, while enhancing both training effectiveness and efficiency. Our system saves ammunition costs and cuts logistics, giving personnel quality training time.
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Flexible Switching System
S6400D
Universal Switching Corporation
High performance and expandable, the third generation S6400D offers coaxial switching configurations as small as 8x8 and can be expanded to a full 64x64. Simply install more modules in the field. Configurable for Video, RF, IF, Data and many other types of signals.
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Version Control System
Helix Core
Perforce Helix Core is the leading version control system for teams who need to accelerate innovation at scale. Store and track changes to all your digital assets, from source code to binary to IPs. Connect your teams and empower them to move faster and build better.
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SM, MM, Quad, PON Integrated OTDR
TR900 Series
Shenzhen Sharingtek Communication Co., LTD
TR900 series optical time domain reflectometer is a new generation of portable and intelligent measuring instrument designed by AVES Communication Technology for testing optical fiber communication system. Adopt 5.8 inch color touch screen, button/ touch dual operation; Internal integration of eight major functional modules, multi-functional integration to help customers effectively solve the field test and maintenance; The highest 45dB dynamic range, can penetrate optical splitter, effective PON network testing; Intelligent power-saving management, 20 hours long standby, efficient protection of test dimension.
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Integrated
Columbia Research Laboratories
Columbia's Integrated Accelerometers are completely self-contained vibration measuring systems having a built-in amplifier within the housing. Low output impedance allows operation directly into standard readout equipment without auxiliary signal conditioning. This type of accelerometer must be powered by a constant current power supply like Columbia's model 5421.
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Dimensional Metrology System
PINNACLE PLUS
Pinnacle+ Plus elevates Pinnacle performance to the next level. Pinnacle+ Plus features a rigid granite optical support structure and a high performance Z-axis motion assembly to produce the lowest possible uncertainty on micro-electronic parts and assemblies/
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Probe System for Life
PS4L
The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.
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Code Integrity
JScrambler
If you develop a security sensitive Web Application we believe that you don''t want to give any bonuses to possible attackers. JScrambler enables you to conceal as much as possible, the logic of your application, such as what information is gathered from the user, how it is processed on the client-side, how it is sent to the servers-side. Since our obfuscation introduces a certain level of randomness, it allows you to explore code morphing techniques, which can be vital in precluding attack automation.
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Condition Monitoring System
Cut costs and boost productivity with a condition-monitoring tool designed for ease of use and scalability. The Dynapar OnSite™ system is a powerful predictive maintenance system targeted at preventing failures before they occur. It can slash unscheduled downtime, improve efficiency of route-based vibration analysis, and provide real-time analytics and trending to warn of possible machine failures.
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Power System Operations
Schweitzer Engineering Laboratories, Inc.
Automate data collection, concentrate phasor data, and analyze data with real-time analytics.
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Sonar systems
For surface ship applications Ultra has developed a comprehensive, fully-integrated sonar system, comprising both on-board sonars such as hull-mounted and towed arrays. This modular system fuses data from own-ship and off-board sensors to build a complete underwater tactical picture delivering a bi-static sonar capability.
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Intelligent Systems
Technologically advanced machines that perceive and respond to the world around them.
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SSD Test Systems
MPT3000ES / MPT3000ES2
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
