Device Characterization
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Photonic Device Testing
ficonTEC’s series of photonic device testing machines is focused on automated electrical, optical or mixed-signal electro-optical characterization (test-&-qualify) of chips and dies, opto-electronic assembles and integrated devices. Capability includes PIC design validation and device verification.
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Resistance Measuring Device According to DIN EN 61557-4 (VDE 0413-4)
PeakTech Prüf- und Messtechnik GmbH
An extremely robust milliohm measuring device in a splash-proof hard case for professional field service use, e.g. for resistance measurement on motor coils, generators and transformers or for continuity testing on ring bus systems in industrial plants.
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Samples Moving Device
Wewon Environmental Chambers Co, Ltd.
Wewon Environmental Chambers Co., Ltd. helped aircraft glass manufacturing company design a kind of glass samples moving device. The aircraft glass sampels are stored on the movable device, and the aircraft glass is smoothly sent into the test room through the movement of the roller. This type glass samples moving device designed by Wewon Tech has a total height of 2100mm. After measurement, We have found that the shell width of the samples moving device is 1300mm and the depth is 1550mm.https://www.wewontech.com/samples-moving-device/
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PCIe-6320, PCI Express, 16 AI (16-Bit, 250 kS/s), 24 DIO Multifunction I/O Device
781043-01
PCI Express, 16 AI (16-Bit, 250 kS/s), 24 DIO Multifunction I/O Device - The PCIe‑6320 offers analog input, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6320 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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USB-6341, 16 AI (16-Bit, 500 kS/s), 2 AO (900 kS/s), 24 DIO USB Multifunction I/O Device
781438-01
16 AI (16-Bit, 500 kS/s), 2 AO (900 kS/s), 24 DIO USB Multifunction I/O Device - The USB‑6341 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB‑6341 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Electrical Circuits Control Device
ZET 452
ZET 452 is an automated module for electrical circuits parameters control that is used for electrical circuits impedance and insulation resistance monitoring in automated mode. The monitoring is performed in accordance with the set participation and without participation of an operator. ZET 452 allows to reduce the time necessary for verification procedure more than in 20 times if compared with the standard measurement instruments normally used for these purposes.
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Contactless Lifetime Measurement and Inhomogenities Device
MWR-2S-3I
Lifetime determination is based on measuring photoconductivity decay after pulse light photo-exciting with usage of reflected microwave as probe.Simultaneous IR light transmission gives possibility to detect any inhomogenity insidesilicon brick and made 3D image of defects.
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PCIe-7841, Virtex-5 LX30 FPGA, 200 kS/s Multifunction Reconfigurable I/O Device
781100-01
Virtex-5 LX30 FPGA, 200 kS/s Multifunction Reconfigurable I/O Device - The PCIe‑7841 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe‑7841 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.
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Materials Characterization
The techniques within Material Characterization have some sample challenges. Our highly talented staff of Engineers have overcome these with unique solutions. From moving highly viscous samples to mixing and sampling in a small well plate.
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CAN Interface Device
CAN Interface Devices communicate using onboard transceivers for High-Speed/Flexible Data-Rate, Low-Speed/Fault-Tolerant, and/or Single-Wire CAN as well as any external transceiver. Using the NI-XNET driver, you can create applications that require real-time, high-speed manipulation of hundreds of CAN frames and signals. You can also import, edit, and use signals from Fieldbus Exchange Format (FIBEX) and Database Container (DBC) files in integrated CAN databases. The NI-XNET device-driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts, minimizing message latency and freeing host processor time.
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PCI-6255, 80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO PCI Multifunction I/O Device
779546-01
80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO PCI Multifunction I/O Device - The PCI‑6255 offers analog I/O, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Multifunction I/O Device
The Multifunction I/O Device features I/O with varying channels, sample rates, output rates, and other features to meet many common measurement requirements. You can use the device for industry applications such as laboratory automation, research, and design verification. The included DAQExpress companion software provides basic measurement and analysis, while the included NI-DAQmx driver provides the ability to create customized automated measurement and control applications. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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Powered Device Analyzer for 802.3at
PDA-602B
Emulate all Type-1 and Type-2 PSE’s, powering 2-pairs up to 41W at all PD input voltages. Optionally supports 802.3at PD Conformance Test Suite and LLDP emulations.
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USB-6351, 16 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device
781440-01
16 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB‑6351 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB‑6351 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Power Transformer Automatic Test Device
XD71
Hangzhou Xihu Electronic Institute
The device is used for power transformer power outage routine test items to do automated testing.Which is characterized by dielectric loss, insulation resistance, DC resistance, tap-changer switching characteristics, short circuit impedance and variable ratio of six test items are concentrated in an instrument,so that the instrument function, test power and test lead height fusion.Field test, just start wiring once, at the end of unplugging wiring once,the middle process by the test personnel in the computer terminal to send command control,the test system automatically completes all or part of the above test items.
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PCIe-6536B, 32-Channel, 25 MHz, 100 MB/s Digital I/O Device
782630-01
The PCIe-6536 can continuously stream data over the PCI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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PCI-7811, 1M Gate Virtex-II FPGA, Digital Reconfigurable I/O Device
779363-01
The PCI‑7811 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. The PCI‑7811 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, custom communications protocols, bit error rate test, and other applications that require precise timing and control.
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PCI-5122, 100 MHz Bandwidth, 100 MS/s, 14-Bit PCI Oscilloscope Device
778758-03
100 MHz Bandwidth, 100 MS/s, 14-Bit PCI Oscilloscope Device—The PCI‑5122 high-resolution oscilloscope device has two channels with greater than 75 dBc spurious‑free dynamic range (SFDR) and flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution, low-noise measurements with up to 100 MS/s and 100 MHz of analog bandwidth.
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Smart Network Emulation for All Mobile Device Tests
CMWcards
Use R&S®CMWcards to prepare the tests you always wanted, but never found the time to set up. Create wireless signaling and application tests on the R&S®CMW500 wideband radio communication tester just by setting up a hand of cards – no programming required. Revolutionary card wizards and unique game rules guide you through setting up test sequences that fully comply with test specifications. Thanks to the R&S®CMW500 tester’s unrivaled multi-technology capability, R&S®CMWcards can be used to rapidly reproduce signaling scenarios for various wireless communications standards.
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50 MHz to 2.2 GHz, GPS-Disciplined OCXO, Reconfigurable USRP Software Defined Radio Device
783926-01
50 MHz to 2.2 GHz, GPS-Disciplined OCXO, Reconfigurable USRP Software Defined Radio Device - The USRP-2950 provides an integrated hardware and software solution for rapidly prototyping high-performance wireless communication systems. With the flexible hardware architecture and the LabVIEW unified design flow, researchers can prototype faster and significantly shorten time to results. You can prototype a wide range of advanced research applications that include multiple input, multiple output (MIMO); synchronization of heterogeneous networks; LTE relaying; RF compressive sampling; spectrum sensing; cognitive radio; beamforming; and direction finding. The USRP-2950 is equipped with a GPS-disciplined 10 MHz oven-controlled crystal oscillator (OCXO) reference clock. GPS disciplining delivers improved frequency accuracy and synchronization capabilities.
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PCI-4461, 204.8 kS/s, 118 dB, 3.4 Hz AC/DC Coupled, 2-Input/2-Output Sound and Vibration Device
779307-01
The PCI‑4461 is a high-accuracy data acquisition module specifically designed for sound and vibration applications. It provides simultaneous two-channel dynamic signal generation and simultaneous two-channel dynamic signal acquisition with six gain settings to configure the input range. The PCI‑4461 also includes software-configurable AC/DC coupling and integrated electronic piezoelectric (IEPE) conditioning to ensure precision measurements with microphones, accelerometers, and other transducers that have very large dynamic ranges. Common applications include audio test; automotive test; noise, vibration, and harshness (NVH) analysis; and machine condition monitoring.
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Highest Throughput For Fragile Devices
Ismeca NY20
20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.
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RF Shielded Test Enclosure, Ideal for tall RF devices
JRE 3036
For testing tall devices, the JRE 3036 is ideal! Large enough to fit entire computer systems inside, as well as their associated components, everything will be securely isolated from the outside world. Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness.
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Data Logging Device
E84 DLD
Finally the solution every field technician and equipment owner needs to quickly locate and resolve signal anomalies, dropouts and glitches that cause E84 handoffs to fail. This next generation recording device is a small self-contained unit that inserts between the passive equipment and PI/O transceiver to capture and write E84 handshakes to its non-volatile memory.
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Sensors & Optical Devices
Panasonic Automotive & Industrial Systems Europe GmbH
Panasonic manufactures a complete lineup of sensors for full-body tracking and gesture recognition, occupancy detection, light intensity, acceleration, object detection, and pressure measurement.
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Low-Temperature Impact Device
DWC-1
This low-temperature impact device is compliance with standard requirement of IEC60245, IEC60227, IEC60540, GB5013-2008, GB5023-2008 and GBT2951-2008. It’s used to test all kinds of PVC sheathed cable, wire, soft wire and no sheath of parallel soft PVC insulated impact resistance at low temperature. Specification: • Working temperature: -15℃±1℃ • Impact height: 10~200mm adjustable • Length of specimen: 5D~150D • Material: 304 stainless steel • Completion time once: 3~5s • Completion number of units for once: ≥2pcs • Weight: 100/200/300/400/500/600/750/1000/1250/1500g • Low temperature box to match additionally
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USB-8451, 250 kHz I2C, 12 MHz SPI I2C/SPI Interface Device
779553-01
The NI USB‑8451 is a master interface for connecting to and communicating with inter-integrated circuit (I2C), System Management Bus (SMBus), and serial peripheral interface (SPI) devices. With plug‑and‑play USB connectivity, the USB‑8451 is a portable solution to communicate with consumer electronics and integrated circuits. It also includes eight general-purpose digital I/O lines for a variety of applications, such as configuring the address of I2C devices or toggling LEDs. The USB‑8451 can be physically located more closely to I2C/SPI devices than PCI interfaces, reducing I2C bus length and minimizing noise problems. Additionally, the interface provides +5 V and GND to power circuits with no external power supply.
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USB-6356, 8 AI (16-Bit, 1.25 MS/s), 2 AO (3.33 MS/s), 24 DIO USB Multifunction I/O Device
781444-02
8 AI (16-Bit, 1.25 MS/s), 2 AO (3.33 MS/s), 24 DIO USB Multifunction I/O Device - The USB-6356 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB-6356 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Protection Device Testing
The Motwane Manufacturing Company
Power system protection is a branch of electrical power engineering that focuses on protecting electrical power systems to detect and isolate faulty parts. The objective is to keep the power system stable by separating only the defective components while keeping the rest of the network in operation. The device protects the transmission lines, generator transformer, and other electrical apparatus from multiple faults.
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PCIe-5774, 12-Bit, 6.4 GS/s, DC-Coupled, 2-Channel PCI FlexRIO Digitizer Device
785650-02
The PCIe-5774 is a PCI FlexRIO Digitizer Device that provides up to 3.2 GHz of DC-coupled analog bandwidth and 12 bits of resolution. You can operate the PCIe-5774 in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The voltage ranges are software-selectable and include 200 mV peak-to-peak and 1 V peak-to-peak, with a selectable DC offset.
