Test Pattern Generators
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Product
HPA-64 General Purpose Probes
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Product
Pulse Function Arbitrary Noise Generator
81150A
Arbitrary Waveform Generator
1 - 120 MHz pulse generation with variable rise/fall time1 - 240 MHz sine waveform output14-bit, 2 GSa/s arbitrary waveforms512k samples deep arbitrary waveform memory per channel Noise with a selectable crest factor and signal repetition time of 26 days FM, AM, PW, PWM, FSK modulation capabilities up to 10 MHz1 or 2 channel, coupled and uncoupled Differential outputs
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Product
Automotive Ethernet Test Fixture
AE6941A
Test Fixture
The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
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Product
Cup Reduced Concave, Alternate 0.78 (22.00) - 3.70 (105.00) General Purpose Probe
HPA-0G12-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
Regenerative Battery Pack Test System
17040
Test System
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Product
Pyramid, 3-Sided Chisel 30°, Alternate 0.78 (22.00) - 3.70 (105.00) General Purpose Probe
HPA-0T-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
PXIe 16 Bit Arbitrary Waveform Generator - up to 1.25 GS/s on 2 Channels
M4X.6631-X4
Arbitrary Waveform Generator
The M4x.66xx-x4 series arbitrary waveform generators (AWG) deliver the highest performance in both speed and resolution. The series includes PXI Express (PXIe) cards with either one, two or four synchronous channels. The large onboard memory can be segmented to replay different waveform sequences. The AWG features a PCI Express x4 Gen 2 interface that offers outstanding data streaming performance. The interface and Spectrum’s optimized drivers enable data transfer rates in excess of 2.8 GB/s so that signals can continuously replayed at a high output rate. While the cards have been designed using the latest technology they are still software compatible with the drivers from earlier Spectrum waveform generators. So, existing customers can use the same software they developed for a 10 year old 20 MS/s AWG card and for an M4x series 625 MS/s AWG.
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Product
Alternate 2.54 (72.00) - 6.20 (176.00) General Purpose Probe
HPA-52D-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 250,000Overall Length (mil): 629Overall Length (mm): 15.98
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2G40-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
Test Port Cable
The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
LXI High Voltage Switching - 20xSPST Plugin Module
65-233-703-HI
General Purpose Relay Module
The 65-233-703-HI plug-in module is part of a scalable high voltage switch platform that provides a high voltage switching solution with capability up to 7 kV. Switch arrays are created by populating the 65-200-002 scalable chassis with plug-in modules that provide access to the switches on 51-pin front panel connectors. Users can specify as many or as few plug-in modules as they require and can field upgrade the chassis to extend the number of switches.
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Product
92 GSa/s Arbitrary Waveform Generator
M8196A
Arbitrary Waveform Generator
New Arbitrary Waveform Generator with the highest combination of speed, bandwidth and channel density.92 GSa/s sample rate supporting signals up to 64 GBaud on 4 channels in a 1-slot AXIe module - simultaneously.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Bottom Electrode SMD Test Fixture
16198A
Test Fixture
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Product
256 GSa/s Arbitrary Waveform Generator
M8199B
Arbitrary Waveform Generator
The M8199B arbitrary waveform generator (AWG) provides R&D engineers with a high-performance arbitrary signal source, enabling design development at 160 GBaud and above. The M8199B AWG enables up to 8 synchronized channels at 256 GSa/s with nominal analog bandwidth exceeding 80 GHz. With integrated frequency and phase response calibration for clean output signals, the M8199B simplifies your test setup.
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Product
Standard 0.39 (11.00) - 1.39 (39.00) Replaceable General Purpose Probe
MEP-30B
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 30Test Center (mm): 0.76Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 690Overall Length (mm): 17.53
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Product
9GS/s 16Bit 8GS Mem 12CH 8 Markers RF AWG Desktop
P94812D
Waveform Generator
The desktop version of the Proteus arbitrary waveform generator series offers up to 12 channels in a 4U, half 19” dedicated chassis. The compact form size and small footprint save valuable bench space. So for synchronized, phase coherent, multi-channel applications such as quantum physics and radar applications the Proteus arbitrary waveform transceiver is an ideal, space efficient, and cost effective solution.
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
Pulse Generator
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
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Product
VXG Microwave Signal Generator
M9384B
Microwave Signal Generator
The M9384B VXG is the industry's first dual-channel microwave signal generators capable of up to 44 GHz signals.
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Product
Ethernet/LXI generatorNETBOX 16 Bit Arbitrary Waveform Generator - up to 40 MS/s on 8 Channels
DN2.654-08
Arbitrary Waveform Generator
The generatorNETBOX DN2.65x arbitrary waveform generators (AWG) is a general purpose multi-channel AWG with outstanding dynamic performance. The series includes LXI units with either four, eight or 16 synchronous channels. The large onboard memory can be segmented to replay different waveform sequences.
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Product
Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74T80
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
General Purpose Switches
General Purpose Switch
Marvin Test Solutions’ switch card portfolio includes matrix, multiplexer, and RF multiplexer configurations. 3U and 6U PXI switch cards feature easy to use, reliable, and integration-friendly D-sub style interface connectors – a feature unique to Marvin Test Solutions PXI switch cards. GENASYS switch cards are compatible with MTS’s family of GENASYS Switching and Switching/Digital Subsystems, featuring integrated MAC Panel SCOUT receivers.
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Product
MXG X-Series Microwave Analog Signal Generator, 9 kHz to 40 GHz
N5183B
Signal Generator
Get a fast, compact (2U) alternative to the PSG in the lab, depot or fieldAddress demanding tests of radar modules & systems with near-PSG levels of spectral purityCompensate for system loss & drive high-power amplifiers: +19 dBm output power, -55 dBc harmonics & -68 dBc spurious @ 20 GHzReduce calibration time with switching speed 600 sSimulate narrowband chirps & radar antenna scans with up to five internal function generators that can be used with AM, FM, OM pulse modulation
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Product
Cup, Concave 90/120 degree, Alternate 0.78 (22.00) - 3.70 (105.00) General Purpose Probe
HPA-0A-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
PCIe 16 Bit Arbitrary Waveform Generator - up to 125 MS/s on 2 Channels, High Voltage Outputs
M2P.6571-X4
Arbitrary Waveform Generator
The M2p.65xx series offers different versions of arbitrary waveform generators for PCI Express with a maximum output rate of 125 MS/s. These boards allow to generate freely definable waveforms on several channels synchronously. With one of the synchronization options the setup of synchronous multi channel systems is possible as well as the combination of arbitrary waveform generator with digitizers of the M2p product family. The 512 MSample on-board memory can be used as arbitrary waveform storage or as a FIFO buffer continuously stream data via the PCIe interface. Importantly, the high-resolution 16-bit DACs deliver four times the resolution than AWGs using older 14-bit technology.
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Product
Standard 1.50 (42.00) - 3.30 (94.00) General Purpose Probe
P2663G-1C1S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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Product
Lens Module Test Platform
Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
Test Instrument
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
