Test Pattern Generators
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Product
PCIe 2.0 Test Platform
PXP-100B
Test Platform
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
200 MS/s Waveform Generator & Dual 50 MHz Pulse/ Timing Generator
3172
Pulse Generator
The Racal Instruments™ 3172, a 200 MS/s Waveform Generator and Dual 50 MHz Pulse and Timing Generator, combines multi-instrument density and highfrequency performance in a single-slot, C-sized VXIbus format.Waveform output in the range of 100 μHz to 30 MHz with 16-bit vertical resolution (12-bit vertical for 3171 emulation) and pulse output to 50 MHz make the 3172 a powerful solution to a variety of test stimulus requirements.
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Product
Alternate 1.30 (37.00) - 4.50 (128.00) General Purpose Probe
HPA-1B-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Product
VXG Vector Signal Generator
M9484C
Vector Signal Generator
The M9484C VXG is the industry’s first vector signal generator capable of generating signals up to 54 GHz with 2.5 GHz of modulation bandwidth per channel. The VXG vector signal generator helps you deliver the next frontier of wireless technology such as 5G and satellite communications with a fully integrated, calibrated, and synchronized solution.
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Product
Alternate 2.54 (72.00) - 6.20 (176.00) General Purpose Probe
HPA-52T-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 250,000Overall Length (mil): 629Overall Length (mm): 15.98
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Product
LitePoint RF Test System
J750
Test System
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
Ultra High 4.18 (119.00) 11.70 (332.00) General Purpose Probe
EPA-3J-2
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
RSE Wireless EMC Spurious Emission
TS8996
Test System
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
PXI-5406, 14/16-Bit, 20/40 MHz Arbitrary Function Generator
779657-01
Waveform Generator
40 MHz Bandwidth, 16-Bit PXI Waveform Generator—The PXI‑5406 is a 40 MHz function generator capable of generating standard functions including sine, square, triangle, and ramp as well as other signals like psuedorandom noise and DC signals. This function generator can generate signals from -5 V to +5 V and uses direct digital synthesis (DDS) to precisely generate waveforms.
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Product
PXIe-5451, 145 MHz, 16-Bit, 2 GB PXI Waveform Generator
781204-03
Waveform Generator
PXIe, 145 MHz, 16-Bit, 2 GB PXI Waveform Generator—The PXIe‑5451 is a 145 MHz, dual‐channel arbitrary waveform generator capable of generating user-definied waveforms, standard functions, and I/Q communications signals. It is an ideal instrument for including in systems for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator as wells as time-domain signals like envelope tracking. The PXIe‑5451 also features onboard signal processing (OSP) functions that include pulse shaping and interpolation filters, gain and offset control, and a numerically controlled oscillator (NCO) for frequency shifting. The PXIe‑5451 also features advanced synchronization and data streaming capabilities.
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2B30-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
PXIe Vector Signal Analyzer: 6 GHz
M9391A
Vector Signal Generator
RF requirements keep growing while timelines keep shrinking. To help ease the technical and business pressures, the right test solution provides continuity in measurements and longevity in capability. In the evolution of modular RF test solutions, the Keysight PXI VSA is the next logical step in signal analysis. With raw hardware speed and X-Series measurement applications, it delivers proven results faster. From fully modular hardware to software leverage to worldwide support, the PXI VSA is the low-risk way to manage change and be ready for tomorrow today
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Product
Replaceable General Purpose Probe
MEP-30
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 30Test Center (mm): 0.76Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 690Overall Length (mm): 17.53
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Product
22 Bit / 2 MS/s Arbitrary Waveform Generator
AWG22
Waveform Generator
A 22 bit Arbitrary Waveform Generator for medium-speed / high resolution waveform generation.The AWG22 is upwards compatible with the AWG20 and also features differential outputs with a programmable common-mode voltage.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3G
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
PXIe Multi-Channel Function Generator Module, 32-Channel
43-625-001
Function Generator
The 41-625-001 (PXI) and 43-625-001 (PXIe) are function generator modules that provide 32 channels in a single PXI/PXIe slot. They can generate sine waves to 300 kHz with 5.76 mHz frequency resolution referenced to the 10 MHz PXI clock. The output voltage range is up to +/-25 V in a 16-bit resolution. It also support PXI trigger functions allowing events from other instruments to initiate waveform generation or sweeps.
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Product
PXIe Vector Modulator
M9316A
Waveform Generator
The M9316A PXIe Vector Modulator is a 3-slot module with integrated wideband IQ modulator and arbitrary waveform generator (AWG) designed to work with the M9383A PXIe Microwave Signal Generator. When ordered with M9383A, it can support 1MHz to 20 GHz frequency coverage, up to 160 MHz RF bandwidth, and up to 1 Giga-sample of AWG playback memory. (See M9383A PXIe Microwave Signal Generator options.
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Product
Standard 1.10 (31.00) - 3.85 (109.00)General Purpose Probe
SPA-64-4
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3: 0,365″; Tip 8: 0,385″; Tip ,9,10: 0,363″
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Product
Active Probe, 2 GHz
N2796A
General Purpose Probe
The N2796A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±12 V), the probe can be used in a wide variety of applications.
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Product
Functional Test for Engineering Lab
Spectrum BT
Functional Test
Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
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Product
Standard 1.00 (28.00) - 3.20 (91.00) General Purpose Probe
P2550-0
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
Test System
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Alternate 2.50 (71.00) - 5.80 (164.00) General Purpose Probe
P2665G-1C2S
General Purpose Probe
Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
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Product
In-Circuit Test (ICT) Fixtures
Test Fixture
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
Rack based antenna test system
R&S®ATS800R CATR
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
Liquid Test Fixture
16452A
Test Fixture
The 16452A provides accurate dielectric constant and impedance measurements of liquid materials. The 16452A employs the parallel plate method, which sandwiches the liquid material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixure.
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Product
PXI-5422, 80 MHz Bandwidth, 16-Bit PXI Waveform Generator
779087-04
Waveform Generator
80 MHz Bandwidth, 16-Bit PXI Waveform Generator - The PXI‑5422 is a 80 MHz arbitrary waveform generator capable of generating user-defined, arbitrary waveforms and standard functions including sine, square, triangle, and ramp. This arbitrary waveform generator can generate signals from -6 V to +6 V and uses direct digital synthesis (DDS) to precisely generate waveforms. The PXI‑5422 also features advanced synchronization and data streaming capabilities.
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2H-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Cup, Straight Shaft Concave, Standard 0.61 (17.00) - 2.80 (79.00) General Purpose Probe
HPA-0G21
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
