Fault
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Accessories: Intermittent Fault Emulator
The Intermittent Fault Emulator (IFE) is the solution. The IFE enables manufacturers, suppliers and operators of any Intermittent Fault Detection (IFD) tester to demonstrate and verify its capabilities to detect and isolate intermittent faults.
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Fault Locator
TRANSFLEKT
TRANSFLEKT simplifies the location of transient faults on the low voltage distribution network.
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PXI-8511, 1‑ or 2-Port, Low-Speed/Fault Tolerant PXI CAN Interface Module
780686-01
1‑ or 2-Port, Low-Speed/Fault Tolerant PXI CAN Interface Module—The PXI‑8511 is a fault-tolerant Controller Area Network (CAN) interface for developing applications with the NI‑XNET driver. The PXI‑8511 excels in applications requiring real-time, high-speed manipulation of hundreds of CAN frames and signals, such as hardware‑in‑the‑loop simulation, rapid control prototyping, bus monitoring, automation control, and more. The NI‑XNET device-driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts, minimize message latency and freeing host processor time for processing complex models and applications.
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Board Fault Locator
SYSTEM 8 (BFL)
The SYSTEM 8 Board Fault Locator provides the user with the ability to functionally test all common digital ICs in and out-of-circuit. A combination of industry recognised test techniques provides a high level of fault coverage. Additional tools are provided by the SYSTEM 8 Premier software to further enhance the unit\'s wide range of applications.
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PXI-2510, 68-Channel, 2 A PXI Signal Insertion Switch Module
778572-10
68-Channel, 2 A PXI Signal Insertion Switch Module—The PXI‑2510 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXI‑2510 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls
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PXI Fault Insertion / Signal Insertion Switch Modules
Pickering's PXI Fault Insertion / Signal Insertion Switch Modules feature a breakout arrangement that allows faults to be attached to the sensor lines, this includes the breaking of a connection or the adding of defect all of which can simulate connectivity problems in the system. Two switching topologies are available: *Single signal paths with series switches and switches to connect to one or more fault buses*Pairs of signals with series switches, shorting switches between the signal pairs and switches to connect either signal to an external fault input.
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Cable Fault Locator
TX2002
Lowest Cost Full Specification Professional Graphical TDR Rugged Palm Top Design 350g (12oz) 5 Measurement Ranges up to 3500m (11,500ft) 50, 75 & 100 ohm Selectable Cable Impedance Built in Tone Generator for Pair Tracing & Identification Suitable for testing all Communications Cables Water & Dust Proof to IP54 Complete with tool-belt holster & test leads
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PXI Single Bus 74-Ch 2A Fault Insertion Switch, N/O Through Relays
40-190B-301
The Single Bus, 74 Channel PXI Fault Insertion switch is part of our family of 2 Amp fault insertion solutions, The range includes modules with 74, 64 or 32 channels and single or dual fault buses. This version has normally open through relays, so in the default state, there are no paths between inputs and outputs for any signal channel. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers.
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PXI Fault Insertion Switch, 7-Channel, Two Fault Buses, 20 A
40-194A-002
The 40-194A-002 is a 7-Channel Fault Insertion switch with two fault buses, designed for the simulation of fault conditions in automotive systems. As well as high current handling of 20A, very low currents can also be switched.
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PXI Fault Insertion Switch, 6-channel, Two Fault Buses, 10 A
40-192A-012
The 40-192A-012 is a PXI fault insertion switch using solid state switching elements and is capable of switching current up to 10A. It is designed to be able to insert three different fault conditions between the test fixture and the equipment under test
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PXI/PXIe 1000Base-T1 Fault Insertion Switch, 6-Channel
42-203-002
The 40-203-002 (PXI) and 42-203-002 (PXIe) are designed to simulate common faults on high-speed two wire communication interfaces such as 1000Base-T1. They support 6 channels of two wire serial interfaces. Each channel pair can simulate an open fault in either or both wires, and using the fault bus switches can simulate short between both wires or a short to one of two externally applied fault connections – such as battery supply or ground - via two fault buses.
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PXIe 10GBase-T1 Ethernet MEMS Fault Insertion Switch, 8 Channel
42-205-008
42-205-008 (PXIe) is a 8-channel fault insertion switches designed to simulate common faults on high speed two wire communication interfaces such as xBaseT1 Ethernet. They available with 4 or 8 channels of two wire serial connections and can be used for simulating faults on 10BaseT1, 100BaseT1, 1000BaseT1 and 10GBaseT1 Ethernet interfaces. Any wire can be set as open circuit and shorts can be applied across wire pairs. Fault connections can be made to one of four external signals via two fault buses, typically simulating connections to supply voltage or ground.
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Fault Simulation
Concurrent Fault Simulator
TurboFault combines high performance, versatility and accuracy. It is highly competitive with hardware accelerators for classical test fault grading. It supports synchronous and asynchronous designs at the gate level, including tri-state gates, latches, flip-flops, single and multi-port RAMs, complex bus resolution functions, and User Defined Primitives (UDPs).
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Ethernet/AFDX/BroadR-Reach PCI Fault Insertion Switch - 8 Channel
50-201-008
This high bandwidth differential PCI fault insertion card is designed to simulate common faults on high speed two wire communication interfaces such as Ethernet. This card supports 4 or 8-channels of two wire serial connections and can be used for simulating faults on Ethernet, AFDX, BroadR-Reach, 100BaseT and 1000BaseT interfaces. Any wire can be set to an open circuit, shorts can be applied across the wire pair, or to the adjacent pair. Fault connections can be made to one of four external signals via two fault buses, typically simulating connections to a supply voltage or ground.
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Mobil Cable Test and Fault Location System
SWG-12 (SWG-32)
• testing cable insulation with DC (rectified) voltage up to 32 kV;• conditioning faults by burning faulty cable insulation with current up to 100 mA;• pre-locating cable faults with the reflectometer RIF-9 based on the pulse reflection method (TDR), voltage wave oscillation method (DECAY), impulse current envelope (ICE) method and arc reflection method (ARC / ARC multi-shot);• pinpointing cable faults with the acoustic method with up to 2000 J surge wave generator and a suitable signal receiver.
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PXI 1A Fault Insertion Switch 11-Channel
40-195-101
The 40-195 is a 22 Channel Fault Insertion Switch, primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert different fault conditions on pairs of signals between the test fixture and the equipment under test: Open-Circuit, Short-Circuit between signal pairs, Short-Circuit between signal pairs and user applied fault conditions e.g. Power or GND. Relays in-line with the signal paths allow open circuit conditions to be simulated on either side or both sides of a signal pair. Relays between each channel pair enable adjacent signals to be shorted, and relays between signal paths and the "Fault" connection allow the application of external user applied fault conditions.
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AOI Handlings System
The AOI handling system is a compact facility with various test units. Via an ionization cleaning station the ceramics are transferred to the contacting station. There, the resistance values of the substrates are tested with a rigid needle adapter. Afterward, the ceramics are further conveyed to the three (optionally four) AOI test stations (for automatic optical inspection) and are tested for cracks, unevenness, faulty imprints, contamination, etc. The poorly evaluated ceramics arrive at a review station where the operator can assess and evaluate the errors on the monitor. If the operator is uncertain about a fault, the ceramic in question can be positioned under the microscope position and inspected by eye. Poorly defined ceramics are marked accordingly with an ink pen.
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PCI-6512, 64-Channel, ±30 VDC, Source Outputs, Bank-Isolated Digital I/O Device
778968-01
The PCI-6512 is an industrial digital output interface, with eight banks of isolated channels. With programmable power-up states, you can configure the initial output states in software, to ensure safe operation when connected to industrial actuators. If a computer or application fault occurs, the PCI-6512 can use digital I/O watchdogs to switch to a configurable safe output state to ensure detection and safe recovery from fault conditions. Programmable input filters eliminate glitches/spikes and provide debouncing for digital switches/relays through a software-selectable digital filter.
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Automated Testing & Interoperability
SmartTest
SmartTest offers hundreds of test blocks – collections of actions that can be combined in multiple ways to create thousands of sequences to test:• Connection and disconnection• Bluetooth pairing and unpairing• Phone calls• Phonebook• Audio and moreYour test results are logged in our cloud based, secure database, where you access all test results, a library of essential reports, and supporting data in the form of protocol trace files, log files, and video captures. Added to this, our subject matter experts will provide a detailed explanation as to the causes of any faults or issues.
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Vector Network Analyzer
ZNLE
The renowned high-quality design, innovative user interface and compact size of the R&S®ZNLE make it ideal for basic VNA applications. The time domain analysis option (R&S®ZNL-K2) and distance-to-fault measurements option (R&S®ZNL-K3) enhance the R&S®ZNLE with essential features for general purpose testing.
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NI-9852, 2-Port, Low-Speed/Fault Tolerant C Series CAN Interface Module
779707-01
2-Port, Low-Speed/Fault Tolerant C Series CAN Interface Module—The NI-9852 is a fault‑tolerant Controller Area Network (CAN) interface for developing FPGA-based applications with the NI‑RIO driver on CompactRIO. The NI‑9852 is ideal for low-level FPGA‑based control and triggering applications that are programmed using the LabVIEW FPGA Module. The NI‑9852 is ideal for byte-level manipulation of CAN frames using the LabVIEW FPGA Module. The NI‑9852 is only compatible with CompactRIO systems.
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Ground Earth Resistance Tester
2678X
Shenzhen Chuangxin Instruments Co., Ltd.
Ground Earth Resistance Tester verifies the integrity (continuity) of the protective bonding of the equipment (Class I equipment) designed to secure safety through the basic insulation and protective earthing. It is also called earth (ground) bonding test. If the continuity of the protective bonding is confirmed, we can conclude that the equipment has the requirements for preventing electric shock even if the insulation between the primary circuit and the accessible conductive section fails and a fault current flows through the distribution system.
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Toxic Gas Sensor
Model 100
Teledyne Gas & Flame Detection
Model DM-100 Series sensors feature intelligent electronics, non-intrusive operator interface and comprehensive fault diagnostics. The sensor is packaged in an electro-polished 316 stainless steel housing fitted with a ¾ inch NPT thread. The plug-in, field replaceable sensor cell features large surface area gold-plated pins that reduce the effects of corrosion in harsh industrial environments. Signal conditioning electronics are completely encapsulated in the sensor housing adding a high level of durability to the design. The packaging is XP-intrinsically safe. This innovative design marks a return to a simple, more affordable, and durable gas detection sensor without compromising quality.Model DM-100 sensors provide a 2-wire loop powered 4-20 mA current signal equivalent to the sensor range of detection. Upper enclosure options are aluminum and stainless steel. Additional accessories include wireless communications, a loop powered digital display. Each sensor is shipped with a splash guard with integral calibration port. Detcon’s toxic gas sensors have a long shelf life and are supported by an industry-leading warranty.
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Neutral Grounding Resistors
NGR
Neutral Grounding Resistors (NGRs) are used to limit the fault current for safety of equipment and personnel in industrial systems.
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Cable Tester & Cable Tracer & Multi-Functions Lan Tester
M-CT-430A
Fuzhou Metricu Technology Co Ltd
The multifunction LAN tester M-CT-430A is designed for maintenance and installation of cable, cable tracer, and HD Coaxial video level meter test in one equipment. The unit supports detect the near-end, mid-end and far-end fault point of RJ45 cable connector, and also supports Port Flash, PING test, IP address Scan, Link Monitor. Installers take the all in one cable tester, making working conditions safer and increasing productivity.
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Advanced Circuit Card Automated Test
ACCAT
The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.
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Acoustic Imaging
Acoustic imaging offers cutting-edge solutions for precise leak detection, partial discharge identification, and mechanical fault diagnosis. With high-performance microphone arrays and advanced algorithms, our products ensure exceptional industrial safety and perfomance.
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Handheld OTDR
SAT-18C
Shaanxi Aitelong Technology Co., Ltd
SAT-18C handheld OTDR is the newest instrument designed for testing FTTx network. It is mainly used to measure the physical characteristics of optical fiber, such as the length, the transmission loss and the splice loss etc. It can also locate the faults or breaks of optical fiber. It is widely applied in the manufacture, construction and maintenance in optical fiber communication system.
