Time Domain
See Also: Time, Timers, Time Interval, GPS Time, Time Reference, Time Code, Time Standards, Timing, Time Domain Reflectometers, Time & Frequency
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Product
PXIe-5764, 16-Bit, 1 GS/s, 4-Channel PXI FlexRIO Digitizer
785169-01
FlexRio Digitizer
The PXIe-5764 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PXIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Product
Peak Power Analyzer
4500C
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The Boonton Model 4500C is the instrument of choice for capturing, displaying, analyzing and characterizing microwave and RF power in both the time and statistical domains. It is ideal for design, verification, and troubleshooting of pulsed and noise-like signals used in commercial and military radar, electronic warfare (EW), wireless communications (e.g., LTE, LTE-A, and 5G), and consumer electronics (WLAN), as well as education and research applications.
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Product
Time History Recording to Throughput Disc
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For the most critical tests time history data can be recorded in parallel with vibration control with no reduction in control performance. The real-time throughput data capture function of the m+p VibControl system allows you to record all selected channels continuously in the time domain on the embedded data server (“throughput to disc”) irrespective of the channel count and the frequency range utilized. This means that you can always access all the original data for analysis purposes.
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Product
High Speed PXIe Digital IO Card - 32 Channels, Extendable up to 256 Channels in One Chassis
Model 33010
Digital I/O
Chroma 33010 is a high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO Card consists of a Sequencer Pattern Generator (SQPG) and 32 Channels of fill ATE-like features. The 33010 IO card is expandable up to 356 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Full Wave Recorder
I-FullWaver
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The I-FullWaver systems were specifically developed for precise full waveform time domain induced polarisation, Resistivity and self-potential measurements. Each system is fully independent; incorporating its own power source, GPS module and digital memory for up to 3 months continuous recording.
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Product
PathWave RFIC Design (GoldenGate)
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Early in the RFIC design phase, monitoring system IC specifications such as EVM via RF simulation is a must. Simulations include effects of layout parasitics, complex modulated signals, and digital control circuitry. With PathWave RFIC Design, you can simulate in both the frequency and time domain and bring your designs to and from Cadence Virtuoso and Synopsys Custom Compiler.
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Product
Multi Channel Optical Fibre Verification
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The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.
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Product
1.6 GSPS, 14-bit Time-domain Digitizer
ADQ1600TD
Digitizer
The ADQ1600TD is a world-leading 14 bit digitizer optimized for time-domain pulse capture. With its unique 1600 MSPS capture rate, enabled by SP Devices’ ADC interleaving technology ADX, the ADQ1600TD opens for demanding measurements such as time-domain pulse capture and high-speed data recording.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Saluki S2106 Series OTDR (up to 45dB)
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Saluki S2106 Series Optical Time Domain Reflectometer is a high performance multi-function test instrument designed for the FTTx network. The product has a range resolution of up to 0.05m and a ultra-short event blind zone of 0.8m. This product integrates OTDR, LS, OPM, VFL, Event Map (iONM), OLT and OFD function all in one. It adopts touch and button dual operation mode. The product has rich external interface, which can realize remote control through Ethernet interface or two different USB interface for external USB flash drive, printer and data communication with PC.
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Product
Time Domain Reflectometer
ETDR 10A-C
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Compact dual channel precision full function portable easy to useTDR for fault location on balanced loaded and unloaded cables.
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Product
PCIe-5764, 16-Bit, 1 GS/s, 4-Channel PCI FlexRIO Digitizer Device
785957-01
FlexRio Digitizer
The PCIe-5764 is a PCI FlexRIO Digitizer Device that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PCIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PCIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Product
Cable & Satellite
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Vector network analyzers are a valuable tool for broadcast engineers. VNAs enable users to perform an array of measurements including cable loss, return loss, VSWR, distance to fault, and time domain. CMT’s USB VNAs help broadcasters extend their reach and easily perform maintenance in the field or in the shop.
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Product
PXIe-5764, 16-Bit, 1 GS/s, 4-Channel PXI FlexRIO Digitizer
785170-01
FlexRio Digitizer
The PXIe-5764 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PXIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Product
Signal Analyzer
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Choose from an extensive selection of signal analyzer products from DC to 44.5 GHz and extendable to 325 GHz.With excellent total level accuracy, dynamic range and performance, Anritsu spectrum/signal analyzers not only can capture wideband signals but FFT technology supports multifunction signal analyses in both the time and frequency domains. Moreover, the built-in signal generators on some models outputs both continuous wave (CW) and modulated signals for use as a reference signal source.
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Product
Vector Network Analyzers
ZND
Vector Network Analyzer
The R&S®ZND network analyzer performs unidirectional measurements up to 4.5 GHz in the base model. It can be expanded to perform bidirectional measurements and the frequency range can be extended to 8.5 GHz. The large R&S®ZND touchscreen is easy to operate making it ideal for S-parameter measurements, even when many diagrams are needed. Time domain measurements can also be added for even more functions.
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Product
Helicopter Reducer Vibration Monitor
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The complex is built on the basis of the measuring platform NI PXI and provides measurement and calculation of vibration parameters. The software of the complex is two-level: the lower hardware level and the upper level of the user interface. The hardware level software provides the following functions:interrogation of measuring modules;signal processing in the time domain;calculation of measuring parameters;spectral analysis;recording the signal to the hard disk.
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Product
Smart Optical Time Domain Reflectometer OTDR
BD900 Series
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Shanghai Baudcom Communication Device Co.,Ltd.
BD900 series of Optical Time Domain Reflectometer has excellent dead zone performance and wide dynamic range. There are four models to choose from and that can betterly meet the customer’s specific measurement requirements. Combined with the visual fault locator, it can easily find the breaks, bends, splices, faulty connectors, and other causes of signal loss.
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Product
Wideband Pulse Profiling Sensors
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LadyBug wideband Power Sensors feed power waveform samples into high speed A/D converters. The measured power is processed and then delivered as required by the user. These sensors are capable of delivering everything from basic power, to time domain scope-like profiles of the modulated waveform, such as the pulse shown at right. Multiple time gated measurements, crest factor, pulse power, and statistical measurements are all possible with these sensors.
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Product
Shock Control
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Shock testing simulates an extreme event that a unit under test is exposed to during handling, shipment, explosive event and/or daily use (e.g. dropping an object). The profile for this type of testing is defined by the shape of the time domain waveform together with its amplitude and duration. The m+p VibControl vibration control system offers full functionality for classical shock and shock response spectrum testing as well as for tests using external pulses or the capture of transient signals.
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Product
PXIe-4481, 24-Bit, 6-Channel, 1.25 MS/s/ch PXI Analog Input Module
784278-01
Analog Input Module
24-Bit, 6-Channel, 1.25 MS/s/ch PXI Analog Input Module—The PXIe‑4481 is an analog input module for higher bandwidth voltage measurements. The module offers analog and digital filtering for accurate frequency domain measurements. You also can select from four gain settings to configure your input range. For measuring sudden changes, such as high speed blast and pressure events, the PXIe-4481 can sample up to 20 MS/s per channel in time domain mode. The included NI-DAQmx driver simplifies hardware configuration and measurement.
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Product
Saluki S2110P Series PON OTDR (up to 45dB)
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S2110P series optical time domain reflectometer can be used to test single-mode wavelengths of 1310nm, 1550nm, 1625nm and 1650nm as well as customized special wavelengths. It provides multiple optional modules, such as single wavelength, multi-wavelength and online test. S2110P series can test PON networks through even 1:128 high-port-count splitters.
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Product
Phase Noise Measurement Application
N9068A
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One-button measurements for analyzing phase noise in frequency domain (log plot) and time domain (spot frequency)Compatible with phase noise measurement personality in Keysight PSA and ESA spectrum analyzers Runs inside the PXA, MXA, EXA signal analyzers and MXE EMI receiver
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Product
4D Imaging Radar Chipset Solution
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Through enhanced FMCW technology, Arbe’s chipset technology transmits and receives signals from multiple antennas. By converting information from time to frequency domains (FFT), Arbe provides a 4D image with unparalleled element density in high azimuth and elevation resolution while simultaneously sensing the environment in long range with a wide field of view in real time. Additionally, Arbe technology reduces sidelobe occurrence levels close to zero, resolving range-doppler ambiguities and avoiding interference from other radars.
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Product
EMI Test Receiver
ESRP
Receiver
The R&S®ESRP EMI test receiver has been designed for diagnostic measurements during development and for precompliance measurements to prepare products for final certification testing. It measures electromagnetic disturbances in the 10 Hz to 7 GHz frequency range, using either conventional stepped frequency scans or FFT based time domain scans to significantly speed up measurements.
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Product
PXIe-5763, 16-Bit, 500 MS/s, 4-Channel PXI FlexRIO Digitizer
785164-01
FlexRio Digitizer
The PXIe-5763 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PXIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Product
Time-domain Field-Device-Circuit coupled simulator
EM-SUPREME®
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Time-domain Field-Device-Circuit coupled simulator for modeling of passive structures, active components, and complete RF & millimeter-wave modules. EM-Supreme is used for EM modeling of power amplifiers, switches, filters, active antennas, and complete RF modules such as antenna-switch, switch-filter, switch-filter-amplifier, and front-end modules with no approximations.
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Product
Pre- Locator
CFL PL4
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CFL PL4 Power Cable Fault Locator is a portable, easy to use cable fault pre-location instrument. It uses the Time Domain Reflection (TDR), Secondary Impulse Method / Multiple Impulse method (MIM) and Impulse Current Method (ICM) on low, medium and high voltage cables. Its measuring ranges enable pre-location on cable lengths from 500 m to 64km.
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Product
Optical Time Domain Reflectometer
OTDR II
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The OTDR II (Optical Time Domain Reflectometer) excels in fault finding on fibre cabling with industry-leading specifications and performance levels on both single-mode and multimode fibre networks. Not only does OTDR II deliver accurate test data and pass/fail results, it also offers automated fault-finding capabilities that help to minimise network downtime.
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Product
OTDR Tester
M-OTDR-502
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Fuzhou Metricu Technology Co Ltd
Optical Time Domain Reflectometer Wavelength 1310 / 1550nm, max test range 150KM, Dynamic range 28 / 26dB, SOR standard data saving, create PDF/EXCEL format report, stable laser source, support CW/270/330/1000/2000Hz, Test fiber's length, loss, attenuation parameters and event map, locate connection point/fusion point, Automatic analysis of various linkers/fusion points, easy analyze of various events,Support saving curves number ≥30000pcs, loss test, detect the optical or optical components loss value, etc. Test IP camera, optical power meter, visual fault locator, RJ45 cable TDR test, cable tester, cable tracer, etc.
