In-circuit
See Also: Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers, In-circuit Test Systems
-
product
In-Line Full Automatic Testing System
ALMAX
Automated press unit with board loading belt.ALMAX can become automated in-line type in-circuit tester in case our ICT is integrated. And it also can become automated in-line function tester as well.PLC is not used in order to reduce cost as a PC control mechanical part.Press unit is 4 shaft structures which reduce unbalanced load and contact fail of probe pins.
-
product
ICT/FCT Probes
During in-circuit testing (ICT), each component of an electronic assembly is checked for faults. Short circuits, interruptions, soldering or component faults are detected and assemblies are rejected according to a go/no-go test.During functional testing (FCT), the assemblies are tested completely or in partial areas for the intended operation. The function test of the modules is carried out in the end application or in an environment that simulates the end application.
-
product
In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
-
product
In-Circuit Test Fixtures
Every type of in-circuit test fixtures (wired, wireless, pneumatic, vacuum) for all major tester brands.
-
product
Smart Factory Solutions
Smart4Metrics Factory 4.0
Teradyne’s Smart4Metrics Factory4.0 solution closely integrates the TestStation in-circuit tester operating conditions, status and health data with existing data collection systems in the factory. By providing a single interface to convey both production data and production tester data, correlation of production results with other equipment or environmental conditions is easily integrated.
-
product
Modular In-Circuit & Functional Test System
Our testing systems are based on established industry standards and can be individually configured to meet your requirements. In addition, our systems can be easily and efficiently adapted to changing and new challenges.
-
product
Wireless Test Fixtures
At Forwessun, we have vast experience in designing and delivering wireless in-circuit test (ICT) fixtures. We have experience in providing fixtures tailored to the unique needs of various different industries. While our primary customer focus has been on full and half-bank fixtures for the HP3070 system, we offer bespoke solutions for other platforms as well including GenRad, Teradyne, and SPEA systems.
-
product
Combination Tester
Focus-4000
Programmable power supply（User can select big volume or high accuracy model）Fixed power supply (5V/12V/24V acceptable)High accuracy current measurement(MAX 2A) - FX710Voltage measurement MAX 16points(within +/-60V) - FX710Short relays 16pcs (MAX current 1A) - FX62024CH digital input output pins(8pcs per unit, IN/OUT setting) - FX700/FX71016 open corrector output for controlling external relays16 port (simultaneously 2 ports ) Oscilloscope channel for observing wave formCommunication function RS232C/GPIB（Standard）、CAN/LIN communication, Programmer(Options)Focus-2000Plus unique in-circuit Test（ICT）function
-
product
In-Circuit Testing and Test Engineering
Teradyne Z1820
2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
-
product
Testability analysis
Using TestWay, ASTER provides advanced Testability report, Rules checking for In-Circuit Test, Functional Test and Boundary-Scan test. Test point optimization – Up to 70% of test points saved, automated backannotation to CAD system and CAD/CAM/CAT tools.
-
product
In-Circuit Debugger for Power Architecture 55xx/56xx (Nexus)
ICDPPCNEXUS
P&E's ICDPPCNEXUS for Windows is a powerful tool for debugging code on a Freescale MPC55xx/56xx processor. The debugger comes with P&E's PROGPPCNEXUS flash programmer.
-
product
In-Circuit Test Fixtures
In-circuit testing provides electronic manufacturers a reliable, high fault coverage verification method for the assembly process. Circuit Check ICT fixtures are robust, reliable and designed for easy customization to cover a large range of PCB sizes without impacting turnaround time. We stock a large variety of fixture sizes and actuation methods to meet your test demands. If a stocked sized ICT fixture is not adequate our engineering staff will design a custom solution.
-
product
PCB Test System
Circuit Wizard - CW409
Qmax Test Technologies Pvt. Ltd.
CW 409 –Circuit Wizard PCB Test System has all the features of QT9627 such as Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test.Maximum Digital Test Speed 10MHz in the QT9627 .It can be connected to any PC/AT or Laptop with Windows 10 operating system through USB Plug and play interface. It operates on user friendly Qmax Test Director software platform with different modes like Test Station for operator level use Test Sequencer mode for Programmer level use and Interactive Workstation mode for quick working.
-
product
Light Probes (LED-Test)
As the original inventors of light probes for in-circuit color and intensity test of LEDs, our business partner Optomistic Products has been a leader in LED test for over 20 years, providing LED solutions to customers worldwide. Our unique patented LED test solution offers unparalleled reliability and is widely accepted by the LED test industry.
-
product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
-
product
Active Differential Probe, 100 kHz to 12 GHz
U1818B
The Keysight U1818B 100 kHz to 12 GHz active differential probe makes it easy to perform high frequency in-circuit measurements using network, spectrum and signal source analyzers. With flat frequency response, low noise floor, and direct power from instrument connection, the U1818B allows measurements to be made while taking full advantage of Keysight's RF analyzers dynamic range.
-
product
In-Circuit Test Systems For Sale
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
-
product
CPU3xx Incircuit Debugger
ICD32Z
P&E's ICD32 for Windows is a powerful tool for debugging code. It uses the processor's background debug mode (BDM), via the ICD cable, to give the user access to all on-chip resources.
-
product
Aeroflex AIDE
This programming environment for analog and digital in-circuit test and function test allows a high depth in the realization of inspection tasks. We have many years of extensive experience in dealing with AIDE.
-
product
ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2 Medium (Hold Down Gate) / 230156
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
product
4-Port In-System Programmer For Zilog
MPQ-Z8
Supports Zilog Z8 Encore, Encore XP, Zneo and Crimzon device families Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
-
product
True Concurrent Test
TestStation Duo
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
-
product
In-System Programmer for ARM
MPQ-ARM
Supports Nuvoton M05x and NUC1xx device families Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
-
product
Manufacturing Defects Analyzer
eloZ1-1600
The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the very latest generation, reliably detecting connection and assembly faults on printed circuit board assemblies. The eloZ1 can be integrated into table systems as well as into inline-systems.
-
product
In-Circuit ESR & DCR capacitor Tester
236
This In-circuit ESR & DCR capacitor tester is designed to measure ESR (equivalent Series Resistance) on capacitors range from 0.47uF to 2200uF, in or out of circuit. The ability to trouble shoot in-circuit saves time and makes the 236 a must for anyone that tests or trouble shoots PCB (printed circuit boards).
-
product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
product
ICT: In-Circuit Testing
XILS In-Line Handling Solutions
Designed to cover a large number of test points, with long panels for future expansion, the XILS series of Handlers, PCB test systems in the line of EIIT - Innovative Engineering Solutions, is ready for the most demanding applications.
-
product
ATE Integration
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
-
product
4-Port In-System Programmer For Silicon Labs
MPQ-C2
Supports Silcon Labs C8051F series devices with C2 Programming Interface Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
-
product
In-Circuit Testers
SPEA’s Bed of Nails Board Testers are scalable In-Circuit Test platforms that deliver the shortest test time, superior diagnostic accuracy, and extended test coverage for the most comprehensive range of electronic products.SPEA’s In-Circuit Board Testers are designed to increase yield, shorten the testing time, and cut the cost-of-test. Thanks to their unique Multi-Tester and Multi-Core Architecture, the SPEA’s Board Testers provide up to ten times greater throughput than conventional ICT test systems.
