In-circuit Emulators
test to validate circuit.
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Probes, In-Circuit Test, In-circuit Testers, In-circuit Test Systems, ICE
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Product
Microprocessor Development System
DS-85
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* Real-Time and Transparent In-Circuit Emulator * Windows Debugger - Update 2009 * Symbolic Debugger compatible with Intel Object Files * 64K Hardware Breakpoints * 64K of Internal Memory * 32K x 32 Bit Trace Memory and Logic Analyzer with External Probes * Serially linked to IBM PC or Compatible Hosts * On-line Assembler and Disassembler * Source and Listing Windows
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Product
In-Circuit Emulator
DS-51
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* Real-Time and Transparent In-Circuit Emulator * Supports Most of the 8051 Derivatives * Emulates 1.5V to 6V Microcontrollers * Maximum Frequency of 42MHz * 64K/512K of Internal Memory with Banking Support * 32K Trace Memory "on the Fly" * 64K Hardware and Conditional Breakpoints * MS-Windows and Keil ?Vision Debuggers * Source-Level Debugger for Assembler, PLM and C * On-Line Assembler and Disassembler * Performance Analyzer * Serially linked to IBM PC at 115 Kbaud
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Product
In-Circuit Emulator - 80C186/80C188 Family
DS-186
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* Support for 80C186/8/XL/EA/EB/EC, 8086/8, V20/25/30/40/50 and other Microprocessors * Full-speed Emulation up to 25MHz * 1MB of Zero-Wait-State Mapped Memory * 8K x 32-bit Frames Dynamic Trace Buffer * 1MB Hardware Breakpoints * 115 KBaud RS-232 Communication Link * Numeric Coprocessor Support * OMF Converter * Support for Borland, Microsoft and Intel Compilers * Full Support for C, C++, Pascal and Assembler
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Product
In-Circuit Emulator
DS-251
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# Real-Time and Transparent In-Circuit Emulator for 251s# Uses Intel and Atmel Licensed Bondout Technology# Standard 256K Emulation Memory# Real-Time Trace up to 128K Frames Deep, 128 Bits Wide# Complex Hardware Breakpoints# Supports Both Binary Mode and Source Mode# MS-Windows Debugger# High-Level Support for Popular C-Compilers# Full Support of Local and Global Variables# On-Line Assembler and Disassembler# Performance Analyzer
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Product
Microprocessor Development System
DS-48
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# Real-Time and Transparent In-Circuit Emulator# Supports Philips Telecom Derivatives# Adaptable to 8051 Derivatives# Emulates 1.5V to 6V Microcontrollers# Maximum Frequency of 40MHz# 8K of Internal Memory# DOS and MS-Windows Debuggers# 32K Trace Memory and Logic Analyzer "on the Fly"# 8K Hardware and Conditional Breakpoints
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Product
In-Circuit Emulator
DS-XA
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* Emulates XA Derivatives * 2MByte Code and Data Memory * Memory With Mapping Capabilities * Real-Time Trace * Frequency Range up to 30MHz @ 5V * Source-Level Debugger For C And Assembler * MS-Windows Debugger Software for Windows NT and 95 or Later * 3.3V And 5V Emulation Support * Support for ROMless and ROM Microcontrollers * PLCC Emulation headers
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Product
Regenerative AC Emulator, 600 VAC, 63 A, 45 KVA, 3‑Phase
SL1202A
AC Emulator
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988EL
In-Circuit Test System
The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in our stalwart Keysight 3070 and i3070 systems.
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Product
Regenerative AC Emulator, 600 VAC, 125 A, 90 KVA, 3‑Phase
SL1203A
AC Emulator
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
In-Circuit Test System
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
Medalist i1000D
U9401B
In-Circuit Test System
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
2-Module ICT System, I317x Series 6
E9902G
In-Circuit Test System
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Scienlab Dual-Range Regenerative AC / Grid Emulator, 600 / 1200 VAC, 63 / 32.5 A, 90 KW / 135 KVA
SL1215A
AC Emulator
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
Regenerative AC Emulator, 1200 VAC, 65 A, 90 KVA, 3‑Phase
SL1213A
AC Emulator
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Product
Regenerative AC Emulator, 600 VAC, 63 A, 30 KVA, 3‑Phase
SL1201A
AC Emulator
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
Regenerative AC Emulator, 1200 VAC, 32 A, 45 KVA, 3‑Phase
SL1212A
AC Emulator
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
In-Circuit Test
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Test Coach has been delivering the highest quality in-circuit test programs since 1998. Our engineers have the education, experience and expertise needed to solve your most challenging test requirements. We partner with our customers to provide comprehensive test solutions, including consulting on: design for test, recommendations on the best hardware and software options to implement, test strategy, and long term planning for multi board projects. Our expertise allows us to really understand customer requirements, so that quotes are accurate and timely. However, we also understand that sometimes projects can change scope. At Test Coach, we have the flexibility to adapt to changes with as little impact to delivery as possible.
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Product
In-Circuit Tester
Omega MTS888
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With the continuous and fast pace of development in the electronic manufacturing the time from design to production is a critical factor for success or failure of a product. The time from design to test is a major part of this process. The high performance tester from Digitaltest, the MTS888 Omega, has been designed to speed up this process.
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Product
In-Circuit Tester
IP-5000, IP-5300
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The IP-5000 series is a space-saving high-speed board inspection device with a compact design.
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Product
4-Module ICT System, I307x Series 6
E9903G
In-Circuit Test System
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
In-Circuit Tester
Sparrow MTS 30
In-Circuit Test System
The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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Product
In-Circuit Test Fixtures
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Every type of in-circuit test fixtures (wired, wireless, pneumatic, vacuum) for all major tester brands.
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Product
In-Circuit Test Systems
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Keysight offers leading board test solutions for electronics manufacturers to tackle a wide range of PCBA test access and coverage issues for today's complex printed circuit assemblies.
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Product
Emulation Adapters
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With some of the more advanced 32-bit microcontrollers and SoCs, the full program and data trace capabilities of the device are not made available on production silicon. Instead, semiconductor vendors provide special 'emulation devices'. These typically feature more pins than the production device, thereby providing the interface to the trace interface.
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Product
Expanding In-Circuit Capabilities
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Circuit Check supports reading linear bar codes and 2D symbols within each of its fixture product lines.When spring-loaded probes are not practical or access is limited, Circuit Check can help you with thru-connector tests to contact connectors on any surface or edge of a circuit board. These tests can be implemented spring probes, mating connectors, sacrificial SMT connectors, and stabber cards.
