PCI Test
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Product
ZIF PCI Test Connector
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Meritec's ZIF PCI Test Connector offers the user an accurate and reliable way in which to test their PCI cards. With over 20,000 reliable cycles, it eliminates the need to constantly replace your PCI Connectors. Meritec's Test Connector assembly plugs directly into the PCI Connector in the test bed and is actuated by a lever for easy loading and unloading of cards. Meritec's solution eliminates the uncertainty associated with intermitancy between the PC Board and Test Connector during the test cycle.
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
PCI Express PLL Test Application
N1081PLCA
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Keysight N1081PLCA PCI Express PLL Test Application designed to measure transmitter PLL bandwidth and peaking based on the PCI Express 5.0 TX PLL Specifications. Use N1081PLCA PCIe PLL test software to test, debug and characterize your PCIe designs.
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Product
PCIe Compliance Testing
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Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 4.0 and PCIe 5.0 specification. This solution combines a Summit Z58 or Summit Z516 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 4.0 and PCI Express 5.0 Link and Transaction Layer Compliance Testing.
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Product
PCI Express® Electrical Performance Validation and Compliance Software
D9040PCIC
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D9040PCIC PCI Express Transmitter Test Compliance Software for PCI Express 4.0 (PCIe 3.x, 2.x and 1.x also supported).
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Product
PCI bus Test Adapter
pcibus1b
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All important PCI bus signals routed to pin headers for easy connection of logic analyzer. Filter assistance for logic analyzer: D-FF to delay FRAME# by one cycle. To see actual PCI data transfers, filter for FRAME2# high + FRAME# low (address phase), or IRDY# low and TRDY# low (data phase). Business card size. Notched for 5V PCI bus (can be used on 3.3V bus with mechanical modification).
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Product
Socket Saver
4690
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The Technobox PMC Socket-Saver permits cost effective volume testing of PMC modules when used with Technobox P/N 3390 ?PMC to PCI adapter for Test.? It may also be used to reduce wear and tear on Technobox P/N 1518/1523 (?Extender/Preprocessor?).
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Product
32-bit PCI Test Backplane
SKU-014-01
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The 32-bit PCI Test Backplane was designed to support production testing/debugging of PCI-based peripheral boards. The backplane expands the x1 PCI Express interface of the host computer into four 32-bit PCI slots via 7 ft CAT6 cable. The PCI backplane is a versatile platform that allows you to test up to 4 PCI boards at the same time, facilitates easy access to logic signals, provides hot-swap compatibility, and per-slot overcurrent protection.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
PCI Express Gen 1 Test Backplane
SKU-015-01
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The PCI Express Test Backplane was designed to support production testing/debugging of PCIe-based peripheral boards. The backplane expands the x1 PCI Express interface of the host computer into one x4 and three x1 PCI Express slots via 7 ft CAT6 cable.
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Product
PCI Express, PCI, Multi-Interface Test Backplanes
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Amfeltec PCI Express, PCI, Multi-Interface Test Backplanes
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Product
PCIe 3.0 and 4.0 Compliance Testing
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Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 3.0 and PCIe 4.0 specification. This solution combines a Summit Z416 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 3.0 and PCI Express 4.0 Link and Transaction Layer Compliance Testing.
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Product
100 KS/s, 12-Bit, 16-Ch Universal Multifunction PCI Card
PCI-1710
PCI Card
16-ch single-ended or 8-ch differential or a combination of analog input12-bit A/D converter, with up to 100 kHz sampling rateOnboard programmable counterTwo 12-bit analog output channels16-ch digital input and 16-ch digital outputAutomatic channel/gain scanningOnboard FIFO memory (4,096 samples)Programmable gainBoardID™ switch
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Product
TestStand
test
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Product
Prototyping & Test Consulting Services Solutions
test
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Imperial Test Executive
ITE
test
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
2-Axis Stepping And Servo Motor Control Universal PCI Card
PCI-1220U
PCI Card
Independent 2-axis motion controlHand wheel and jog function2-axis linear interpolation function2-axis circular interpolation functionContinuous interpolation functionProgrammable T/S-curve acceleration/deceleration rateUp to 4 Mpps output for each axisTwo pulse output types: CW/CCW or pulse/directionUp to 1 MHz encoder input for each axisTwo encoder pulse input types: A/B phase or up/downConstant speed controlPosition management and software limit switch functionBoardID™ switch
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Product
ARINC429 PCI Express Mini Card
AMEE429-x
PCI Express Mini Card
The AMEE429-x is AIM’s new PCI Express Mini Card module targeted for embedded ARINC429 applications in an ultra-compact form factor.
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Product
NI Automated Test Software Suite
test
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
Value DSP-Based 4-Axis Motion Control Universal PCI Card
PCI-1245V
PCI Card
Encoder input is 10 MHz for 4xAB mode, 2.5 MHz for CW/CCW modePulse output up to 5 MppsSupports linear and circular interpolationHardware emergency inputSupports E-GearSupports programmable acceleration/deceleration rateMemory buffer (10K points) for trajectory planning which is designed in DSP(Auto-blending is not supported)Position compares triggering up to 100 KHz, and memory buffer is up to 100 K points in DSPPosition latchProgrammable interrupt and watchdog timerRDY/LTC-dedicated input channels & SVON/CMP/CAM-DO/ERC-dedicatedoutput channels are switchable for general input and output purposes
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Product
Full DSP-Based 4-Axis Motion Control Universal PCI Card
PCI-1245
PCI Card
Encoder input is 10 MHz for 4xAB mode, 2.5 MHz for CW/CCW modePulse output up to 5 MppsMemory buffer (10K points) for trajectory planning which is designed in DSPSupports E-Gear, and helical interpolationSupports E-CAM providing 256 points to describe the CAM profiles which buffers located in DSPHardware emergency inputWatchdog timerPosition latch via ORG & index signalPosition compare triggering up to 100 KHz, and memory buffer is up to 100K points in DSPProgrammable interruptSupports gantry mode by semi-closed loop pulse train controlRDY/LTC-dedicated input channels & SVON/CMP/CAM-DO/ERC-dedicated output channels are switchable for general input and output purposes
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Product
Test Workflow Pro
test
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Full DSP-Based 6-Axis Motion Control Universal PCI Card
PCI-1265
PCI Card
Encoder input is 10 MHz for 4xAB mode, 2.5 MHz for CW/CCW modePulse output up to 5 MppsMemory buffer (10K points) for trajectory planning which is designed in DSPSupports E-Gear, and helical interpolationSupports E-CAM providing 256 points to describe the CAM profiles which buffers located in DSPHardware emergency inputWatchdog timerPosition latch via ORG & index signalPosition compare triggering up to 100 KHz, and memory buffer is up to 100 K points in DSPProgrammable interruptSupports gantry mode by semi-closed loop pulse train controlRDY/LTC-dedicated input channels & SVON/CMP/CAM-DO/ERC-dedicated output channels are switchable for general input and output purposes
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Universal Test System
LEON System
Test System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Product
Image Sensor Testing
IP750Ex-HD Family
Test System
The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
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Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
