Mapping
See Also: Wafer Mapping, Survey
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Product
Pressure Mapping
NIP PRESSURE MEASUREMENT SYSTEM
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A completely wireless system for measuring nip pressure between rollers in real-time
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Product
Wafer Mapping Sensor
M-DW1
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Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Product
Pressure Mapping Sensors
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The pressure sensors listed below are available in a wide range of shapes, sizes, pressure ranges, and resolutions. Over 200 different pressure sensors are available. High Temperature pressure mapping sensors are also available in certain sensor models. Custom tactile pressure sensors and pressure ranges can also be created to meet your specific application requirements. Please note, the sensors listed in this catalog are matrix sensors designed to be used with one of Tekscan's pressure mapping systems. If you need single-point force sensors for testing, or custom force sensors for embedded/OEM applications, please refer to our FlexiForce™ products. For more application and industry details, see some of our key sensor application and industry solutions.
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Product
Film Thickness Mapping Systems
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Angstrom Sun Technologies, Inc.
Spectroscopic reflectometer mapping (SRM) tools are for industry or lab routine thin film uniformity measurement. This is relatively low cost and easy to use setup. Mapping size can be configured from 2" to 18" if needed. Dependent on film thickness range, a broad wavelength range can be configured within DUV, Vis and/or NIR range. A user-friendly software interface allows you to define various mapping patterns to map. A CCD array based detecting and data acquisition mechanism offers fast measurements. 2D/3D data presentation gives user option to quickly generate reports.
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Product
Half-Cell Corrosion Mapping
XCell
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Giatec XCell™ is a smart tablet-based NDT probe for fast, accurate and efficient detection and on-site analysis of corrosion in reinforced concrete structures. Giatec XCell™ meets all the requirements of the ASTM C876 standard specification.
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Product
Pressure Mapping
TIRESCAN
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Complete pressure imaging system for conducting tire tread analysis.
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Product
Temperature Mapping
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Measure temperature between two surfaces, utilizing a thin and flexible sensor. The resulting data and our analysis tools offer insights to enhance product design, manufacturing, quality, and research.
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Product
Retail Foot Mapping
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Tekscan works with you to develop customized solutions that maximize customer engagements, advance consumer satisfaction, and increase sales.
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Product
Photoluminescence Mapping System
VS6845A
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Industrial Vision Technology Pte Ltd.
With its unique optical design technology, the System detects and classifies defects that affect yield and uses advanced photoluminescence (PL) technology to enable real-time monitoring of MOCVD production processes.
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Product
C++ Code Mapping
CODEFIX
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CodeFix is a powerful tool for C/C++ Source Program Modification.
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Product
Pin-Mapping for Custom Connectors, Test Fixtures, UUTs | Cable & Harness Testers
PinMap™
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Check out this fast and super-easy pin-mapping process enabled by our optional CableEye® PinMap™ software. Map as fast as you can move the probe from one pin to the next. Use on your custom connectors, test fixtures, specially-built connector panels, or pigtail adapters to your CableEye tester.
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Product
Magnetic Field Camera: mapping for MRI applications
MFC2046
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MRI and NMR spectroscopy applications require a highly uniform magnetic field, within at most a few ppm. NMR is the only magnetic measurement technique capable of providing a field map with that degree of precision. Introduced 25 years ago, Metrolab’s NMR Magnetic Field Cameras have revolutionized field mapping for MRI magnets. They reduced acquisition times from hours to minutes, positioning errors to fractions of a millimeter, and they rendered human and drift errors negligible. Now, meet the latest generation NMR Magnetic Field Camera, the MFC2046! Map any magnet with the New generation of MFC probe arrays. Magnetometer Teslameter Gaussmeter
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Product
VME64x IP Carrier Module
DP-VME-5121
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Data Patterns DP-VME-5121 VME IP carrier board is a 6U VME bus card that provides an electrical and mechanical interface for four industry standard IP modules. The board provides full data access to the IP modules I/O, ID and memory spaces. The programmable registers are used for configuring and controlling the operation of IP modules.Each IP module supports two interrupt requests. The VME bus interrupt level is software programmable. The software configured interrupt modes are:a.Single level interrupt mode: All IP module interrupts can be mapped to a single VME bus interrupt level.
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Product
Automotive Test Lead Kit
143
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Test Lead Kit includes our basic set of interchangeable specialty test probes designed for automotive use. The flexible back probing pins are great for sliding into automotive connectors like those on fuel injectors and MAP sensors. The large Crocodile Clips are good for clipping to grounds and battery terminals. Roll up storage pouch keeps your leads organized.
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Product
Non-Contact Mapping Life Time System
MWR-2S-3
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The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Product
Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
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EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Product
Error Distribution Analysis Package For M8000 Series BER Test Solutions
M8070EDAB
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The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070EDAB Error Distribution Analysis package offers features like burst mechanism detection and analysis, frame loss ratio estimation and error mapping.For instance, you can easily estimate your FEC decoder margin or find the root cause of systematic errors by exploring the error map. The plugin also supports the use of real-time scopes as error detector.
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Product
Monitoring & Control Systems
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PBE's Vantage software is designed to allow users to monitor real time data from a site remotely and accurately. Vantage allows for tracking, telemetry monitoring, alerting, and reporting of data to users. It can be configured to accept telemetry from almost any device via custom developed drivers. Capable of importing CAD maps and image files the mapping software offers a 2D GUI with icons. Vantage also offers historical playback of the data reported to replay a set timeframe. Reports are customizable and exportable to multiple common formats.The user configuration manager allows for user defined roles to grant or restrict access to and from all modules and features of those modules. The Electronic Tag Board module offers a tagging system designed to track assets that are checked in or out, while the Asset Summary module provides a list of assets with user selected telemetry streams and configurable alerts. Vantage provides location tracking and tagging, telemetry monitoring, ventilation control and reporting off data to users.
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Product
Epi Thickness & Composition System
Element
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The Element system is the tool of record for wafer suppliers for high speed impurity mapping and epi thickness measurement. It is the only tool on the market with the unique combination of transmission and reflection based technology. This system is the industry standard for dielectric monitoring.
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Product
Semiconductor Technology, Micro Scriber + Meters For Contact Angle And Surface Tension
SURFTENS WH 300
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Optik Elektronik Gerätetechnik GmbH
The leading equipment for professional use in 200 and 300 mm wafer processing in semiconductor technology. SURFTENS WH 300 is equipped with a 3 axis wafer robot, wafer scanner, loadport for 200 and/or 300 mm wafers, fan filter unit, notching system. Suitable for any cleanroom class it features the automatic mapping of contact angles on wafers for up to 25 wafers.New: with SECS/GEM Interface!
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Product
Pressure Mapping
BPMS
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Measure pressure distribution between the human body and support surfaces such as seats, mattresses
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Product
Inertia lnavigation for Civil Engineering
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Exail's Attitude and Heading Reference Systems (AHRS) and Inertial Navigation Systems (INS), incorporate Fiber-Optic Gyroscopes for reliable performance in civil engineering. Suited for tunneling, mining, construction, railway, and mobile mapping, these systems excel in challenging environments like GNSS-denied areas, ensuring undisturbed navigation, accurate georeferencing, and precise pointing amid obstacles such as buildings, trees, tunnels, and mines.
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Product
Stylus Profilometry
Dektak®
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Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Product
Micro-XRF spectrometer
Atlas™
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The Atlas™ Micro-XRF spectrometer (µXRF) from IXRF Systems introduces a new world of x-ray mapping and automation. The Atlas™ boasts the largest chamber volume and SDD detection area (150mm2) well as the smallest spot size (10µ) available on the market. Additionally, the Atlas™ is complimented by the most comprehensive software suite including multi-point analysis, unattended automation, in-depth feature/image analysis, unprecedented mapping and reporting features, and much more.
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Product
X-ray Fluorescence, XRF Analysis Services
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Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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Product
Package Leak Detectors
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Package leak detectors ensure that seal integrity problems are identified. This is a vital part of Modified Atmosphere Packaging (MAP) quality control, since compromising the protective atmosphere will cause a reduction in the shelf-life of MAP products.
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Product
High-Performance Surface Plasmon Resonance System
SPR-32
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Features like ‘Frame Inject’ allows for turn-key sample processing protocols and customized workflows created together with pharmaceutical customers. The faster data analysis and highly intuitive user interface combine to deliver an industry-leading SPR throughput of 10,000 control-substracted binding measurements. Combining flexible 8-needle sample delivery with a 32-sensor detection array laid out in 8 detection flow cells, enables 4 sensors per flow cell, an important advantage for controlled, high-throughput SPR methods. The patented Hydrodynamic Isolation™ technology enables ‘Any Sample, Any Sensor, Any Time’, making it the preferred platform for screening, kinetics, thermodynamics and epitope mapping for pharmaceutical applications.
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Product
DUV-NIR Spectroscopic Reflectometry
FilmTek 2000
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Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
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Product
receivers & Modulators
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Blonder Tongue Laboratories, Inc.
Enabling remote monitoring, signal testing, and virtual mapping that reduce truck rolls, the Aircaster Series of Transmodulators is ideal for incorporating off-air content without paying additional fees for local cable and satellite services
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Product
MMSI Module
M4KMMSI
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The M4KMMSI is an intelligent, Mini Munitions Store Interface [MMSI] module for the multimode, multiprotocol, Excalibur 4000 family of carrier boards. Each module of the M4KMMSI contains 64K bytes of dual-port RAM for Data blocks, Control registers, and Look-up Tables. All Data blocks and Control registers are memory mapped and may be accessed in real time. Each M4KMMSI module may be programmed to operate in one of three modes of operation: Remote Terminal, Bus Controller/Concurrent-RT/Concurrent Monitor and Bus Monitor.
