Measuring Microscopes
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Product
Measurement
DC Voltmeter
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DC Voltmeter is used for measuring DC voltage coming to the input channels of ADC modules and FFT spectrum analyzers. The indicator displays the DC voltage mean value and root-mean-square deviation (RMSD) from the mean value of the selected channel signal. It is possible to change the averaging of the displayed value (0.1; 1, or 10 s) and to select a necessary channel of the ADC module and FFT spectrum analyzer or a virtual channel.
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Product
PXI Source And Measurement Unit Family
PXS840x
Source Measure Unit
The PXS(e)840x is a high precision, high speed source and measurement unit, which is designed for automated high throughput testing.
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Product
Occupational Noise Measurements
doseBadge
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The doseBadge is the original wireless personal noise dosimeter. It is the ideal tool to carry out occupational and industrial hygiene noise measurements and provides a unique solution for these applications.
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Product
Pressure Measurement Accessories
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Pressure subbers, connector bushings, grommets, pipe and tube fittings, tube by length, pressure cooling element, pressure and force cables and connectors, air line lubricators, and air filters.
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Product
Divergent Light Measurement
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The IS1.5-VIS-FPD-800 & IS1.5-IRG-FPD-800 contain 2 photodiodes: a calibrated photodiode for precise power measurement using Ophir meters and a fast photodiode with integral reverse bias circuit for temporal characterization using third-party instrumentation such as oscilloscopes and spectrum analyzers. Their small, 1.5" internal diameter preserves the temporal shape of pulses down to 3.5 nsec for VIS and 6 nsec for IRG. An SMA fiber optic connector is provided for connection to a spectrometer. The large, 20 mm input aperture allows for wide acceptance angles and long working distances, making these spheres well suited for testing VCSELs and other types of laser.
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Product
Impedance Measurement
CITS880s
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Finer geometries and thinner copper can present a challenge for fabricators measuring impedance on leading edge PCBs. The CITS880s answers that challenge with the introduction of Launch Point Extrapolation (LPE). LPE extrapolates the TDR response back to a point close to the start of the transmission line effectively allowing to users more accurately to measure the instantaneous or incident impedance of the line.
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Product
Gain-Compression Measurements
S96086B
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The S96086B, gain compression measurements provides fast and accurate characterization of input power, output power, gain, and phase at the compression point of an amplifier, over a specified frequency and power range, with a simple setup
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Product
Scanning Electron Microscopes
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Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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Product
Temperature & Velocity Measurement
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Advanced Thermal Solutions, Inc.
Highly Accurate Instruments for Measuring Temperature & Air Velocity of Electronic Devices.
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Product
Balanced Measurements
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The unbalanced interface of a VNA is not very well suited for measuring balanced circuits like antennas, transmission lines or chip impedances. In fact it is nearly impossible to get a decent calibration on a balanced 2-port measurement using coax cables.
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Product
Microscopes
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Probing Solutions offers Microscopes made by Azoom, Excelitas, Meiji, Leica, Mitutoyo, and Motic. To order Microscopes, please call PSI at (775) 246-0999, or email sales@probingsolutions.com for a quote.
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Product
Time Measurement Unit
TMU
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TMU is a dual-channel input and ARM input PCI-based time interval counter (Time Interval Counter) . The internal 40 - bit counter provides a series of precise measurements, including frequency, period, time interval, pulse width, and more. TMU uses a reciprocal counting technique , which enables low-frequency signal measurement, taking into account both measurement accuracy and measurement time. The generator creates and generates many versatile waveforms. The following are the outstanding features of the CT-50 .
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Product
Force Measurement Systems
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Micro Edge Electronics Private Limited
As a reputed organization, we are engaged in manufacturing, importing as well as supplying a quality range of Force Measurement System. All these products are manufactured using high quality ingredients sourced from reliable vendor of the industry. These products are extremely rigid in state and ensure longer operational life. A team of skilled engineers and efficient technicians manufacture these products.
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Product
Portable Measuring Complexes
K-5101
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K-5101 is a family of multichannel, computerized measuring complexes created using the technology of virtual instruments and based on the computing capabilities of modern computers and measuring technologies of the National Instruments company. Since all the main measurement functions are implemented by software - the basic parameters of virtual devices that make up the complex are chosen taking into account the specific wishes of the customer.
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Product
Dust Measuring Devices
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commonly known as particulate matter (PM) or aerosol monitors, quantify airborne dust, smoke, and mist to safeguard health and industrial safety. These instruments operate through distinct technologies tailored to residential, field, or regulatory needs.
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Product
Measurement Tool
LogicDAQ
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LogicDAQ is affording to sample the digital data on 32 channels. Maximum frequency of sampling while using all channels is 100MHz. Higher sampling frequencies are available after reducing the number of used channels, 200MHz for 16 channels The instrument is offering many trigger options - the triger can occur on the slope or specific combination of levels of digital signals.
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Product
Self-Discharge Measurement Solutions
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Directly measure self-discharge current in 1-2 hours instead of monitoring cell open circuit voltage over weeks or months. Quickly measure & analyze self-discharge current during cell design and evaluation. Reduce design cycle time and get to market faster. Rapidly discern good vs. bad cell self-discharge performance in manufacturing. Dramatically decrease work-in-process inventory.
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Product
Partial Discharge Measurements
MPD 500
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The MPD 500 simplifies routine factory partial discharge measurements for electrical insulation systems. Engineered with OMICRON's long time experience, the MPD 500 is optimized for routine tests in high throughput environments.
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Product
On-Wafer Measurements
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Accurate DC/CV (and RF) statistical modeling of semiconductor devices requires collecting a significant amount of measured data from different wafers across several temperatures. Keysight Technologies recommends IC-CAP WaferPro as a turn-key DC/CV and RF automated characterization solution to help modeling and device engineers achieve more efficient on-wafer measurements across temperature. This new breakthrough solution is based on IC-CAP modeling software and efficiently controls DC/CV analyzers, network analyzers, probers, switching matrixes, and temperature chucks, as well as the powerful 407x and 408x Series of Keysight parametric testers.
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Product
Vibration Measuring System
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Short Delivery Time・Low CostMeasurement Functions : Displacement / Velocity / Acceleration , Measurement (Amplitude) Range can be changeover.Basic Functions●Measurement Range: 2 Ranges●Alarm Setting (Alarm / Trip)●DC 4 ～20mA Level Output●AC 3Vp-p, DC 2V Monitor Output
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Product
*Electrical Test And Measurement
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GTC designs and manufactures a variety of electrical test and measurement tools.
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Product
Microscope Photomultiplier Photometers
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HORIBA's microscope photometers are ideal for any lab wishing to quantitate light intensity from a sample on a microscope stage. Initially designed for the most demanding low light level fluorescence kinetics of labeled mammalian cells, these photometers are also just as well suited for mineral analysis or transmission studies.
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Product
NanoModeScan M² Measuring System
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This scanning slit M² measurement system accurately analyzes lasers with wavelengths from UV to Far Infrared with its silicon, germanium, or pyroelectric head. It features a compact portable design, immediate results, ISO compliant measurements, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of lasers of most wavelengths.
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Laser Scanning Microscopes
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The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Product
Film Thickness Measurement
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Film thickness measurement can be measured using a number of different techniques depending on the thickness and number of layers. In its simplest form a simple measurement can be made of a single layer with a reflective lower surface using interference fringes. For more complex materials with multiple layers interference measurement is still made, but the mathematical deconvolution becomes increasingly important as does the refractive index of each layer.
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Product
Partial Discharge Measurement System
DAC-6021
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DAC-6021 is a measurement system for testing Partial Discharge of high frequency equipment, power devices, stator coils, etc.Since the system combines Partial Discharge Measuring Instrument (DAC-PD-3) with Testing Corona-free Variable Frequency Voltage Source (DAC-WT-50) and Testing Shielded Chamber, most external noises are removed, and the measurement is safe.
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Wafer Edge Profile Measurement
WATOM
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WATOM can carry out fully automatic, non-contact measurements of the edge profiles and diameter in accordance with SEMICON standards. A special feature is the system's ability to make measurements of the mark cut into the edge of the wafer to indicate the crystal orientation. Because of its high measurement accuracy of less than 1.5 µm, leading wafer manufacturers across the world use WATOM for shop-floor geometrical quality control.
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Code Complexity Measurement Tool
CMT Java
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The Code complexity measurement tool Testwell CMT++ (for C, C++ and C#) and Testwell CMTJava (for Java) saves costs and avoids software erosion. For this reasons several standards (like ISO 26262) require the enforcement of low code complexity.
