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Product
Balanced Measurements
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The unbalanced interface of a VNA is not very well suited for measuring balanced circuits like antennas, transmission lines or chip impedances. In fact it is nearly impossible to get a decent calibration on a balanced 2-port measurement using coax cables.
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Product
Dual-ridge Horn Antenna 1 to 18 GHz
EH118
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EH118, a dual-ridge horn antenna that will operate from 1 to 18 GHz. This antenna has a balanced, smooth antenna factor curve that extends all the way to 18 GHz, a reduction of higher order modes on the aperture, and low return loss (SVSWR). The EH118 is applicable for commercial, military and automotive test standards and will include applicable calibrations. The EMC dual-ridge horn antenna offers these key features: single linear polarization, smooth/balanced gain with frequency, low return loss /VSWR, and ultrawide bandwidth (18:1).
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Product
Time Measurement Unit
TMU
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TMU is a dual-channel input and ARM input PCI-based time interval counter (Time Interval Counter) . The internal 40 - bit counter provides a series of precise measurements, including frequency, period, time interval, pulse width, and more. TMU uses a reciprocal counting technique , which enables low-frequency signal measurement, taking into account both measurement accuracy and measurement time. The generator creates and generates many versatile waveforms. The following are the outstanding features of the CT-50 .
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Force Measurement Systems
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Micro Edge Electronics Private Limited
As a reputed organization, we are engaged in manufacturing, importing as well as supplying a quality range of Force Measurement System. All these products are manufactured using high quality ingredients sourced from reliable vendor of the industry. These products are extremely rigid in state and ensure longer operational life. A team of skilled engineers and efficient technicians manufacture these products.
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Product
Portable Measuring Complexes
K-5101
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K-5101 is a family of multichannel, computerized measuring complexes created using the technology of virtual instruments and based on the computing capabilities of modern computers and measuring technologies of the National Instruments company. Since all the main measurement functions are implemented by software - the basic parameters of virtual devices that make up the complex are chosen taking into account the specific wishes of the customer.
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Product
Dust Measuring Devices
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commonly known as particulate matter (PM) or aerosol monitors, quantify airborne dust, smoke, and mist to safeguard health and industrial safety. These instruments operate through distinct technologies tailored to residential, field, or regulatory needs.
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Product
Measurement Tool
LogicDAQ
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LogicDAQ is affording to sample the digital data on 32 channels. Maximum frequency of sampling while using all channels is 100MHz. Higher sampling frequencies are available after reducing the number of used channels, 200MHz for 16 channels The instrument is offering many trigger options - the triger can occur on the slope or specific combination of levels of digital signals.
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Self-Discharge Measurement Solutions
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Directly measure self-discharge current in 1-2 hours instead of monitoring cell open circuit voltage over weeks or months. Quickly measure & analyze self-discharge current during cell design and evaluation. Reduce design cycle time and get to market faster. Rapidly discern good vs. bad cell self-discharge performance in manufacturing. Dramatically decrease work-in-process inventory.
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Dual Polarized Broadband Horn Antennas
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Linear polarized dual double ridged broadband antenna for receive and transmit applications made of aluminium.
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Product
Partial Discharge Measurements
MPD 500
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The MPD 500 simplifies routine factory partial discharge measurements for electrical insulation systems. Engineered with OMICRON's long time experience, the MPD 500 is optimized for routine tests in high throughput environments.
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Product
On-Wafer Measurements
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Accurate DC/CV (and RF) statistical modeling of semiconductor devices requires collecting a significant amount of measured data from different wafers across several temperatures. Keysight Technologies recommends IC-CAP WaferPro as a turn-key DC/CV and RF automated characterization solution to help modeling and device engineers achieve more efficient on-wafer measurements across temperature. This new breakthrough solution is based on IC-CAP modeling software and efficiently controls DC/CV analyzers, network analyzers, probers, switching matrixes, and temperature chucks, as well as the powerful 407x and 408x Series of Keysight parametric testers.
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Vibration Measuring System
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Short Delivery Time・Low CostMeasurement Functions : Displacement / Velocity / Acceleration , Measurement (Amplitude) Range can be changeover.Basic Functions●Measurement Range: 2 Ranges●Alarm Setting (Alarm / Trip)●DC 4 ～20mA Level Output●AC 3Vp-p, DC 2V Monitor Output
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Product
Rack based antenna test system
R&S®ATS800R CATR
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
*Electrical Test And Measurement
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GTC designs and manufactures a variety of electrical test and measurement tools.
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Product
Sinuous Antennas
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Sinuous Antennas provide RF performance similar to comparably-sized planar spiral antennas, while also supporting reception of multiple signal polarizations. CAES offers a variety of sinuous antennas to meet your design needs.
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Product
NanoModeScan M² Measuring System
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This scanning slit M² measurement system accurately analyzes lasers with wavelengths from UV to Far Infrared with its silicon, germanium, or pyroelectric head. It features a compact portable design, immediate results, ISO compliant measurements, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of lasers of most wavelengths.
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Product
Film Thickness Measurement
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Film thickness measurement can be measured using a number of different techniques depending on the thickness and number of layers. In its simplest form a simple measurement can be made of a single layer with a reflective lower surface using interference fringes. For more complex materials with multiple layers interference measurement is still made, but the mathematical deconvolution becomes increasingly important as does the refractive index of each layer.
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Product
Antenna, Biconica-log
EM-6917C-1 | 26 MHz – 1 GHz
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The EM-6917C-1, a hybrid combination of the industry standard biconical and log periodic antennas, delivers an unmatched combination of frequency coverage and high power handling capability. Featuring exceptionally broad frequency coverage of 26 MHz to 1 GHz, the EM-6917C-1 eliminates the need for adjustments or switching antennas in most test applications up to 1 GHz, and it does so without compromising power handling capability for transmit applications.
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Product
Partial Discharge Measurement System
DAC-6021
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DAC-6021 is a measurement system for testing Partial Discharge of high frequency equipment, power devices, stator coils, etc.Since the system combines Partial Discharge Measuring Instrument (DAC-PD-3) with Testing Corona-free Variable Frequency Voltage Source (DAC-WT-50) and Testing Shielded Chamber, most external noises are removed, and the measurement is safe.
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Product
Automatic Antenna Tuner
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Automatic Antenna Tuner has not been released for full Beta testing and production yet as we are solving some firmware issues. We cannot give you a date nor estimate at this time when full production will commence.
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Product
Wafer Edge Profile Measurement
WATOM
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WATOM can carry out fully automatic, non-contact measurements of the edge profiles and diameter in accordance with SEMICON standards. A special feature is the system's ability to make measurements of the mark cut into the edge of the wafer to indicate the crystal orientation. Because of its high measurement accuracy of less than 1.5 µm, leading wafer manufacturers across the world use WATOM for shop-floor geometrical quality control.
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Code Complexity Measurement Tool
CMT Java
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The Code complexity measurement tool Testwell CMT++ (for C, C++ and C#) and Testwell CMTJava (for Java) saves costs and avoids software erosion. For this reasons several standards (like ISO 26262) require the enforcement of low code complexity.
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On-board Emissions Measurement System
OBS-ONE PM unit
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OBS-ONE PM unit is the industry-leading on-board Particulate Matter (PM) measurement system. It collects PM on a filter paper, using a partial flow gravimetric sampling method, while simultaneously measuring real-time PM. A key feature of this design is the use of a venturi flow meter which enables reliable proportional sampling and accurate exhaust gas flow measurement under transient flow conditions. Combine the GAS unit and PM unit to perform certification tests on heavy duty and non-road vehicles.
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Stability Measurement
PVC Thermomat
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The PVC Thermomat determines the thermostability of polyvinyl chloride (PVC) and other chlorine-containing polymers by means of the dehydrochlorination test (DHC).
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Torque Measuring and Monitoring System
WISER 4000
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TECAT Performance Systems, LLC
The WISER 4000 system is the latest release of TECAT’s low-cost, ultra-low power and extremely accurate torque sensor. The wireless system has the optional ability to measure 3-axis acceleration, barometric pressure and ambient temperature, all within the same incredibly small footprint. The 4000 includes on-board data logging without PC or DAQ connectivity, and remote flash capability, which enables firmware upgrades without removing the system from the unit under test. Featuring shunt calibration, TECAT’s latest WISER system is designed to simplify instrumentation verification for users, while allowing them to check calibration of the system in the field. In addition, the WISER 4000 has been enhanced with two additional outputs, a higher-speed recording, and is available with custom-built remote enclosures to protect the system’s remote unit and battery from damage due to debris.
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Antennas
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Com-Power EMI / EMC broadband and tuned antennas cover the frequency range of 9 kHz - 40 GHz. Most electronic products are required meet the various international EMC regulatory standards before they are introduced to the market. Com-Power provides a wide range of EMI antennas and accessories. We also have the capabilities to assist you with custom EMC antennas for special applications to meet your exact needs.Contact us today to learn more about our EMC broadband test antennas.
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Physical Property Measurement System
PPMS
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The Quantum Design PPMS represents a unique concept in laboratory equipment: an open architecture, variable temperature-field system, designed to perform a variety of automated measurements. Available measurement options include all required hardware and electronics to immediately begin collecting publication-quality data, while the system is also easily adapted to custom user experiments. Sample environment controls include fields up to ±16 T and a temperature range of 1.9 - 400 K. The expandable design enables combining many features in one instrument to make the PPMS the most versatile system of its kind.
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Product
Power Measurements Conditioner
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The Power Measurements Conditioner provides voltage and current signal conditioning for a supported data acquisition module or device to make up to four simultaneous power measurements per conditioner. It also includes attenuation for voltage channels up to 2,000 V and has power, communication, and signal lines for current measurements from current transducers.
