Highly Accelerated Stress Test
High reliability testing using a destructive high temperature, humidity and pressure enviroment.
See Also: HAST
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Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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In-Circuit Testing and Test Engineering
Teradyne Z1890
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2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
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Optical Receiver Stress Testers
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Developing next-generation optical receiver technology requires world-class stress testing. Use Keysight's automated calibration solution and get optical stressed eye results in one-tenth the time compared to a manual setup.
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HAST Accelerated Aging Test Chamber
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Sanwood Environmental Chambers Co ., Ltd.
Sanwood is glad to be the ODM/OEM manufacturer of HAST chamber,HAST aging test chamber,HAST test chamber, HAST aging test chamber Accelerated Stress Test Chamber,High-pressure accelerated aging test sales enterprises all over the world!
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Acceleration Simulation Mode Roller Set for Vehicles with a Single Driven Axle
ASM-BF/1 | VP 230043
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Maschinenbau Haldenwang GmbH & Co. KG.
The ASM-BF/1 roller set is used in test centres and is suitable for vehicles with a single driven axle. It was designed for the exact measurement of the exhaust gas behaviour of vehicles during their transient emission test and permits a driving resistance simulation for the exhaust gas tests ASM-5015 and ASM-2525 (Acceleration Simulation Mode) in accordance with the specifications BAR '97.
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Optical Receiver Stress Test Solution
N4917B
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The N4917B software provides an automated standard compliant stressed receiver sensitivity test according to 100GBASE-LR4, ER4 and SR4 test specification. In order to do this kind of test, several test instruments such as a bit error ratio tester, digital sampling oscilloscope, optical reference transmitter and tunable laser source are required to operate together to achieve a compliant, repeatable optical stressed eye. This stressed eye is then fed to the receiver under test, where bit error ratio is measured under the stress conditions as defined in the standard.
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Standard Test Systems
WaveCore™ Products
Test System
Textron Systems’ WaveCore family offers a variety of standard test systems with a primary application of satellite payload lab testing. Our systems can be deployed affordably for both production and engineering applications, providing industry-leading levels of data correlation with high system mean time between failures and low mean time to repair.
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Acceleration Recorders
SnapShock Plus Series
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Instrumented Sensor Technology, Inc.
The SnapShock Plus (SSP) series data recorders are compact, battery powered acceleration event recorders. The new generation devices offer several improved capabilities over the standard Snap Shock model
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Testing
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Apogee Labs offers a wide variety of modular chassis types used for test applications with various Data Link Test Modules.
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Break The Rules Of Power, Size And Cost In Your Connectivity And Acceleration Applications
ECP5 / ECP5-5G
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*Up to 3.2 Gbps SERDES rate with ECP5, and up to 5 Gbps with ECP5-5G*Up to 4 channels per device in dual channel blocks for higher granularity*Enhanced DSP blocks provide 2x resource improvement for symmetrical filters*Single event upset (SEU) mitigation support*Programmable IO support for LVCMOS 33/25/18/15/12, XGMII, LVTTL, LVDS, Bus-LVDS, 7:1 LVDS, LVPECL and MIPI D-PHY input/output interfaces
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Integration Test
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We test the interfaces between the functions and modules and the time dependence between the different functions to ensure that they meet the specification determines by the Classification Tree Method (CTM)
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Test Universe
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Test Universe is OMICRON's comprehensive and easy-to-use testing software for the CMC device family. It allows you to combine a wealth of application-optimized test modules for creating flexible and fully automated test plans that provide you with an enormous range of functions.
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Microwave Testing
40A
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The GGB Industries, Inc., MODEL 40A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 40A achieves an insertion loss of less than 0.8 db and a return loss of greater than 18 db through 40 GHz.
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Test System
ITC57300
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The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Assembly & Testing
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All components and subassemblies receive the highest attention to detail and workmanship, ensuring your satisfaction. From the initial design phase through to the final assembly, we are committed to producing the best possible products for our customers. Our team of skilled builders and assemblers take pride in their work and are committed to producing the best possible products.We thoroughly test and inspect all of our products before they leave our facility, and we stand behind their quality and workmanship. We are confident that you will be satisfied with your purchase, and we ensure that every product meets our high standards of quality control before it is shipped.If you have any concerns about the quality of your product, please don't hesitate to let us know. We are always happy to address any issues and ensure your complete satisfaction with our products.
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Highly Collimated Solar Simulators
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This solar simulator is based on a Fresnel lens to collimate the light beam from the arc lamp source to infinity, which results in highly collimated illumination of the target spot. A 2.5kW xenon ozone free lamp is used as the light source. The spectral distribution of the xenon light source, along with the use of specially calibrated AirMass filters, closely simulates the sun’s true spectral distribution in various conditions on Earth.
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PRODUCTION TESTING
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The Production Test Department is a component of the Engineering Department where production test technicians perform routine factory testing in accordance with approved test procedures. Most of the electronic testing is automated, whether ambient acceptance testing or environmental ESS testing.
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Lightning Test
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Lightning testing is used to determine the ability of externally mounted electrical and electronic equipment to withstand the direct effects of a lightning strike.
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Cable Free ATE
CABLEFREEATE
test
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Test Services
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A2LA-accredited measurement facilities, combined with our expert staff of engineers, can tackle any unique test and calibration requirements with precision and accuracy. Our equipment is calibrated with NIST traceability providing you with the assurance that we can accurately and consistently characterize your antennas, radomes and other devices.
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Test Adapter
cPCI/VME/VME64x
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The test adapter is used for measurement and testing of test specimen boards, which gives optimal access of signals, address lines as well as power from backplane assembly. Usually the test adapter includes fields for voltage and amp, current measurements and in some cases also some pins for wire wrap to conduct custom connections.
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Microwave Testing
75
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The MODEL 75 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 75 Picoprobe, with or without the bias T option, achieves an insertion loss of less than 1.0 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
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Test Equipment
ST6300
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Shenzhen Star Instrument Co., Ltd.
The ST6300 portable three-phase meter test equipment is suitable to conduct commissioning and testing for energy meter manufacturers and meter test departments. It adopts modular design and incorporates DSP and PWM switching amplifier technologies. Users are able to control the equipment via keypad or PC-based software. It simultaneously measures the errors of three energy meters. It connects to a meter rack via its COM port.
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Product
Hailo-8™ MXM AI Acceleration Module
EAI-2300
Acceleration Module
52 TOPS powered by dual Hailo-8 NPU. Slim type MXM 3.1 Type A. -40~70°C operating temp. with optional fansink. Max. 20W power consumption. Rich AI Development Toolkits for Runtime SDK integration, Model build, Model Convert, and Pre-trained AI application.
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Product
LTE RRM Test System
T4010S
Test System
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Field Testing
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Electronic force measuring device with digital display in MN / m², switchable for load plate.
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Test Handler
JOT M5
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Simple, cost-effective way to automate PCB and pallet based testingSafe, reliable product handlingQuick-adjust ease: no product-specific partsFaster handling of smart productsIndustry 4.0 autonomous interconnectivityTruly scalable for growing test needsReusable, application-specific test boxesM-TestBoxes compatible with M1 handlerBoxes are fully independent, just pull out from M5 rack and use in off-line testingFail product separation to integrated magazineSpacious service-friendly constructionErgonomic workspaceTouchscreen UI with base statistics and service capabilityEasy start-stop operabilityAutomated width adjustment
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Microwave Testing
500B
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The Model 500B Picoprobe sets new® standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 500B Picoprobe achieves an insertion loss of less than 4.0 db and a return loss of greater than 15 db over its frequency range (see accompanying data).
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In-Circuit Test
TR5001
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Optimized for inline integration, this SMEMA-compatible ICT is designed as an expandable platform for testing PCBA's. The TR5001 IN LINE provides an economical, customizable solution that can fully meet testing requirements of most customers.
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Stress Hysteresis in vacuum or gas up to 900C
900 Series
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Stress Hysteresis in vacuum or gas up to 900C for the study of annealing cycles.Thermal Desorption, Film Shrinkage, Reflectivity, and Resistivity options provide additional insight to causes of material changes with temperature.
