Highly Accelerated Stress Test
High reliability testing using a destructive high temperature, humidity and pressure enviroment.
See Also: HAST
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Linear Accelerators
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The latest interlaced dual-energy technology offers improved material discrimination, with an option to alternate X-ray energies on a pulse-to-pulse basis.
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Functional Test Fixtures
Test Fixture
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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PCIe Based FPGA Processing / Acceleration Card
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iWave’s PCIe based FPGA Processing / Acceleration Card is a half-length PCIe x4 card featuring a high-performance user-configurable Xilinx® Kintex®-7 FPGA enhanced with high-speed memory and a high-throughput serial interface. Front I/O adds dual SFP ports, 1x HDMI1.4a IN, 1x HDMI1.4a OUT. All of these features combine to make the card ideal for a wide range of applications such as Edge Computing, ARINC818 Avionics Video Bus, Acceleration.
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Instrument for linear accelerators and TomoTherapy® systems
QA BeamChecker™ Plus
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The NEW QA BeamChecker Plus is a reliable and uncomplicated daily QA instrument for linear accelerators and TomoTherapy® systems.
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Graphics Cards And Edge AI Acceleration Modules
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Advantech offers the first industrial-grade PCIe GPU cards powered by Intel® Arc™ GPUs, as well as Nvidia Quadro and AMD Radeon.
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Test Systems
Test System
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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Positioning Test System
TS-LBS
Test System
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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GS1 Acceleration Sensor
AGS11151
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Panasonic Industrial Devices Sales Company of America
GS1 Acceleration Sensor
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Hailo-8™ MXM AI Acceleration Module
EAI-2300
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52 TOPS powered by dual Hailo-8 NPU. Slim type MXM 3.1 Type A. -40~70°C operating temp. with optional fansink. Max. 20W power consumption. Rich AI Development Toolkits for Runtime SDK integration, Model build, Model Convert, and Pre-trained AI application.
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Constant Acceleration Tester-Box Type
KRD30 series
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KRD30 series constant acceleration test machine is used to evaluate when components, equipment and other electrical and electronic products are subjected to constant acceleration environment (except gravity), whether the structure adaptability and performance are good, and obtain the units’ electrical parameters.
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Product
EBIRST 200-pin LFH To 160-pin DIN Adapter
93-002-410
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Accelerators
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Our GPGPU embedded processing accelerators are powered by NVIDIA or AMD devices that are picked for their long service life support and suitability for embedded processing applications. Each GPU processor is mounted on a rugged mezzanine for upgradability.
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In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Built-To-Print Cable Assemblies For Highly Technical Specifications
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Our engineering and production teams fully recognize the need to stay on the forefront of the latest in technology and materials. Our commitment to product advancement gives our customers a distinct advantage in solving challenges to their applications. Teledyne Storm Microwave focuses on all phases of design, testing and manufacturing to achieve the finest tailored products to meet our customers' needs.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Acceleration Sensor
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Vernier Software & Technology, LLC
This 3-axis acceleration sensor has two acceleration ranges plus an altimeter and a 3-axis gyroscope. An additional channel measures the angle of the sensor’s long axis. Go Direct Acceleration Sensor connects wirelessly via Bluetooth® or wired via USB to your device.
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Antenna Test System
ATS1000
Test System
Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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Highly Accelerated Life (HALT) Test
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HALT consists of high and low temperature and 3 axis vibration testing performed either individually or in combination.Highly accelerated life testing is performed to identify design weaknesses and problems prior to production. HALT subjects equipment to overstress conditions at a level which does affect life, but offers an advantage by reducing the design and development phases of a program.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131G
Test Port Cable
The Keysight 85131G is a 53 cm (21 in) long1 semi-rigid cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 4 inch radius. Stability1 of the Keysight 85131G is 0.06 dB and phase is 0.16o * f + 0.5o (where f is frequency in GHz).
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Product
Test Port Adapter Set, 3.5 Mm (Test Port) To Type-N
85130C
Test Port Adapter
The Keysight 85130C test port adapter is designed to protect the test set port when it would be directly connected to the device under test. These adapters have a special rugged female connector designed for connecting to the network analyzer test port. This special connector will not mate with a standard male connector, but converts the rugged test set port to a connection that can be mated with the device under test. The set contains a 3.5 mm to type-N male adapter and a 3.5 mm to type-N female adapter. The frequency range for these adapters is dc to 18 GHz with a return loss of 28 dB or better.
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Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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Creep and Stress Rupture Tester
QualiCreep Series
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Qualitest Creep and Stress Rupture Tester - QualiCreep Series is mainly designed to perform Creep and Stress Rupture testing of a wide variety of materials to both standard and customized specifications such as ASTM E139, ISO 204, ISO/R 206 and similar international standards. These machines are capable of covering the determination of the amount of deformation as a function of time (creep test) and the measurement of the time for fracture to occur when sufficient force is present (rupture test) for materials when under constant tensile forces at constant temperature. Qualitest offers three models electronic high temperature creep-testing machine with full closed-loop servo-control in capacities from 10kN to 500kN.
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Test Fixture
16047E
Test Fixture
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Shear Stress Sensors
DirectShear™
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Micromachined floating element shear stress sensor that enables time-resolved, one-dimensional, direct shear stress measurements. Direct measurement of shear stress — no heat transfer calibration. Non-intrusive — minimal flow disturbance. Simultaneous mean and fluctuating shear stress measurements. High resolution, dynamic range and bandwidth. Highly accurate, quantitative measurements.
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Product
ARINC-429 Module
M4K429RTx
Test Module
The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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AI System Accelerated By NVIDIA Jetson Thor Module
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Delivering next-generation edge AI performance for robotics, industrial automation, and autonomous systems.
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Optical Receiver Stress Test
N4917BACA
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A complete, automated, and repeatable solution for optical receiver stress test.
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Stress Analysis Strain Gages
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Bondable foil strain gages (strain gauges) available in thousands of possible pattern designs and combinations of grid alloys, backing materials, resistances, and options.
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Environmental Stress Screening
E.S.S
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King Design Industrial Co., Ltd.
E.S.S system could find most potential and hiding defects earlier by checking the physical property of allmaterials and components, and make use of their nature response under Environmental Stress. Through our screening will to pick out all potential and hiding defects in advance and improving the product's reliability inling. It benefits the manufacturer and customer mutually.
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Acceleration Pickup Calibrator
VX-1100A
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VX-1100 is for a piezoelectric type accelerometer which is widely used for measuring vibration. This compact calibrator is effective for checking operation(sensitivity) sensors before measurement to acquire accurate data.Built-in sensor amplifier and display in one unit allows direct reading of the sensitivity. This calibrator excites the sensor at a frequency of 159 Hz and acceleration of 10 m/s2 rms, and the sensor outputs can be used as calibration signals for a vibration measuring system.
