Gate
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Product
Laureate Time Interval Meter
Model FRI
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Configured to time periodic events which produce start and stop pulses from 1 s to 199.99 s over a programmed gate time up to 199.99 s. Timing resolution to 0.2 s. Optional data I/O and relays for alarm or control. Six 0.56" (14.2 mm) high digits, 1/8 DIN case.
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Product
CompuScope GPU CUDA Processing
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Performing real-time digital signal processing (DSP) routines such as Fast Fourier Transform (FFT), Signal Averaging, Finite Impulse Response (FIR) Filtering, Digital Down Conversion (DDC) and more have traditionally required the use of dedicated DSP processors, Field Programmable Gate Arrays (FPGAs), or Application Specific Integrated Circuits (ASICs).
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Product
Universal Test Fixture
CAM/GATE
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The Low Cost Solution for Accurate and Dependable Universal Functional TestThe CAM/GATE ® Universal Test Fixture System is your afforable, efficient solution for functional test. No need to have multiple fixtures in your test area...
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Product
Load Cell Simulators / Testers
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A load cell simulator is a handy tool during initial setup, particularly of a batching by weight scale. It replaces the load cell(s) in the system allowing the scale technician to simulate various weights that will trigger the outputs setpoints for activating valves, gates, and mixers. These products are a must for anyone involved in scale installations and repairs.
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Product
Firmware for High-speed HDLC/SPI Communications (NEW Version)
OP-FW12G
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This expansion firmware increases the baud rates of bit synchronous communications (e.g., HDLC/SDLC/X.25, and CC-Link communications). The firmware processes main measurement items completely with a field programmable gate array (FPGA), thus precisely capturing communications data along with time stamps in 1-µs units.
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Product
Signal Generators
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NF‘s function generators have been used in many applications, since NF produced the first Japan-built function generator in 1959.A function generator is general-purpose test equipment used to generate various waveforms and to execute trigger, sweep and gate oscillation.
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Product
6U VPX FPGA Cards
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Curtiss-Wright Defense Solutions
FPGAs have revolutionized the way digital signal processing (DSP) subsystems are configured. With a large number of gates, hardware multipliers, and high-speed serial interfaces, FPGAs enable sophisticated applications, including radar, signal intelligence, and image processing, which rely on repetitive processing that can be expressed in highly parallel form. FPGAs perform exceptionally well in FFTs, pulse compression, filters, and digital up/down converters.
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Product
Software
Gate Oxide Integrity Option
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Materials Development Corporation
Oxide integrity of MOS devices can be evaluated by various techniques such as Time Dependent DielectricBreakdown, Charge to Breakdown, or ramped voltage. When used with a prober, map distribution of breakdown fields. Output the data using histograms, cumulativefailure, or Weibull plots.
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Product
ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2 Medium (Hold Down Gate) / 230156
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
AdvintRIO™ Reconfigurable I/O
PIRANHA
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The Piranha platform employs a NI single board RIO (sbRIO), NI C Series I/O modules, and custom circuitry. Piranha systems are not dependent on a separate host computer. They offer both Ethernet, and Wi-Fi connectivity to a powerful real-time controller and high performance field-programmable gate array (FPGA) and up to two (2) C Series I/O modules. It provides stand-alone embedded execution for deterministic LabVIEW Real-Time applications. These controllers are designed for ruggedness, reliability, and low power consumption. The heart of Piranha system is the reconfigurable I/O (RIO) FPGA core. The RIO core has an individual connection to each I/O module and is programmed using easy to use elemental I/O functions to read or write signal information from each module. Multiple units can also be daisy changed together for larger applications.
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Product
40-67 GHz Power Amplifier
1GG6-8070
Amplifier
The 1GG6-8070 is a high gain, medium power mmwave amplifier. It can be used as part of a banded solution to achieve respectable mmwave power. Input and output ports are matched to 50W. The amplifier is biased with a single positive drain supply (VDD) and a single negative gate supply (VG1).
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Product
ICT/FCT-Fixtures Max UUT370 × 300 mm (wxd)
CK-2 Large (Hold-Down Gate) / 230158
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
Netlist Analyzer
GateVision
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GateVision PRO is the third generation of graphical netlist analyzers from Concept Engineering. Completely rewritten to run on modern 32/64bit platforms, GateVision PRO provides the designer of even the largest chips with intuitive design navigation, schematic viewing, logic cone extraction and interactive logic cone viewing for debug support and design documentation.
