Gate
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Product
Brushless DC Drivers (BLDC)
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Covering a wide range of power systems, our integrated MOSFET and gate driver ICs thrive in automotive, industrial, and consumer applications, ranging from 3.5 to 100 V operating voltage.
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Product
Universal Test Fixture
CAM/GATE
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The Low Cost Solution for Accurate and Dependable Universal Functional TestThe CAM/GATE ® Universal Test Fixture System is your afforable, efficient solution for functional test. No need to have multiple fixtures in your test area...
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Product
Duty Cycle Meter
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Displays ON or OFF period as a percentage of total period over a programmed gate time from 10 ms to 199.99 s. A resolution of 1%, 0.1% or 0.01% is user-selectable. Applications include monitoring modulated proportional control systems and pulse-modulated systems, such as radar, lasers or packet radio.
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Product
Laureate Time Interval Meter
Model FRI
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Configured to time periodic events which produce start and stop pulses from 1 s to 199.99 s over a programmed gate time up to 199.99 s. Timing resolution to 0.2 s. Optional data I/O and relays for alarm or control. Six 0.56" (14.2 mm) high digits, 1/8 DIN case.
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Product
Test Solutions For OEMs
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A partnership with Testek Solutions fits into your business because we do business like youdo business. Our partnerships are built on open communication, process transparency, and trust – trust that is built on our proven engineering design process. We assign a dedicated team consisting of a program manager who will be your single-point-of-contact, an experienced project engineer to design and oversee all engineering on the project, and any supporting engineers and manufacturing team members necessary for every project. Each test stand goes through a series of stage gates including an initial review of requirements, preliminary design review, critical design review, final design and manufacturing review, and a quality review regardless of whether you request these reviews.
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Product
High-Speed System Sync and Distribution Amplifier - SOSA Aligned 3U VPX
Model 5503
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- Supports Xilinx® Zynq® UltraScale+™ RFSoC FPGAs- Synchronizes up to 32 channels across four Quartz boards- Synchronizes sampling and data acquisition for multichannel systems- Provides single sample accurate synchronization between multiple channels and multiple boards- Synchronizes gating and triggering functions- Optional VITA 67.3D optical interface for backplane gigabit serial communication
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Product
Flaw Detector & Thickness Gauge
DFX-8
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Measurement Gates: Two independent gates (Flaw), and three gates (thickness). Start & width adjustable over full range. Amplitude 5-95%, 1% steps. Positive or negative triggering for each gate with audible and visual alarms
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Product
VXI Register Interface Board
VXI-5524A
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*VXI Register Interface mates with user's PCB to form a B or C-size module.* 48 Digital IO Lines - Three 16-bit registers set as latched outputs or gated inputs.* 16 line bi-directional expansion bus for driving external logic.* Digital IO and VXIbus lines are 3.3V logic levels and are 5 V tolerant for compatibility with 3.3V logic and 5V VXIbus signals.* User selectable 3.3 and 5 Vdc puliup voltage on the digital IO lines for sensing switches etc.* The VXI-5524A board is a complete VXI-1 Rev 1.4 and VXI-2 compliant register-based interface.* User configurable model number, manufacturer ID, version and serial numbers.* Two companion component boards available for prototyping IC or RF assemblies.* Companion hardware kits available for building 1, 2 or 3-slot wide modules.
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Product
Software
Gate Oxide Integrity Option
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Materials Development Corporation
Oxide integrity of MOS devices can be evaluated by various techniques such as Time Dependent DielectricBreakdown, Charge to Breakdown, or ramped voltage. When used with a prober, map distribution of breakdown fields. Output the data using histograms, cumulativefailure, or Weibull plots.
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Product
Test System
ITC57300
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The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Product
PCIe End Point IP Core
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The Arasan PCI Express End Point is a high-speed, high-performance, and low-power IP core that is fully compliant to the PCI Express Specification 1.1 and 2.0. The IP core is designed for applications in computing, networking, storage, servers, wireless, and consumer electronics. The feature-rich IP core is highly configurable that allows a target design to be implemented with the least number of gates and highest performance.
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Product
High-density Power Drivers
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Gate drivers, FETs and protection circuitry integrated into a single package to drive loads in industrial and home-appliance applications, with increased power density per cm². ST’s high-density power drivers are System in Package (SiP) solutions integrating in compact QFN packages the STDRIVE gate drivers and MOSFET-based power stages, responding to the industrial market trend towards higher levels of integration and lower development costs.
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Product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2 Medium (Hold Down Gate) / 230156
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2 Large (Hold-Down Gate) / 230158
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
C Series Serial Interface Module
Interface Module
The C Series Serial Interface Module adds RS232 or RS485/RS422 serial ports to CompactRIO systems. The serial ports are accessed directly from the field-programmable gate array (FPGA) to offer you flexibility in communicating with serial devices. The module has individual buffers on every port that save FPGA space and simplify programming. The C Series Serial Interface Module supports standard start bit, stop bit, and handshaking settings. It uses an external power to provide maximum compatibility and reliability under all serial port conditions. You can choose from both enclosed and non-enclosed modules.
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Product
Netlist Analyzer
GateVision
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GateVision PRO is the third generation of graphical netlist analyzers from Concept Engineering. Completely rewritten to run on modern 32/64bit platforms, GateVision PRO provides the designer of even the largest chips with intuitive design navigation, schematic viewing, logic cone extraction and interactive logic cone viewing for debug support and design documentation.
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Product
Gates
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Designed to ensure effective transitions and provide different voltage thresholds, these robust devices are compatible with 3.3V, 5V and 20V automotive applications. ST's automotive-grade Gate ICs are qualified according to AEC-Q100 and available in TSSOP or SO packages.
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Product
Time Interval Counter PXI Card
GTX2200
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The GTX22x0 family of PXI universal time interval counters offer many of the measurement and timing functions of high-end stand-alone frequency counters, including accumulate, auto ratio, frequency, fast frequency (GTX2220 and GTX2230 only), period, ratio, single period, test clock, time interval, time interval delay, totalize, totalize gated, totalize gated once, & pulse width.
