Optical Loss Test Set
measures the total amount of attenuation in a length of fiber.
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Phantom Load Test Set
Is a testing accessory, wisely designed for field testing service. This equipment helps in providing artificial load that is unaltered by the change in power supply.
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HV DC Test Set
RX30/4P
K&S Engineering and Scientific Ltd
The output is continuously variable from zero to 10 kV by means of the panel mounted regulator. An output trip is fitted which operates when the output exceeds 25 mA switches off the test set and operates a neon overload indicator. Primary protection is provided by two panel mounted fuses. The output is protected by the output trip and a magnetic/hydraulic circuit breaker.
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Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Walker Test Set
PGA-710B
A unique electrostatic data analysis device for use with Prostat’s PFK-100 Field meter/Charge Plate Monitor Set.• Records, plots, analyzes and automatically constructs reports of body voltage generation, electrostatic decay, voltageretention, ionizer performance and other static measuring functions.• Creates detailed reports to help determine the risk of equaling or exceeding damaging or hazardous HBM dischargevoltages in static sensitive facilities.• Analyze Footwear & Flooring Combinations: Records personnel walking voltages in accordance with ANSI/ESD STM97.2 Body Voltage measurements as required by ANSI/ESD S 20.20 ESD Program Standard• Other Equipment Applications include voltage generation of chairs, carts and process equipment
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Bench-top Insertion & Return Loss Test Station
STC-IRL3201
Shanghai Stone Communication tech Co., Ltd
STC-IRL3201 is a high performance loss test station that is designed specially for Optical Passive Components production Test and Lab Test. It combines three different working modes as a return loss meter, optical power and loss meter and a stable laser source in one test station.
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Bottom Electrode SMD Test Fixture
16197A
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Reflectance/Transmittance Test Set
RT-500
An Integrating Sphere is a hollow sphere which has its interior coated with a paint that is nearly perfectly diffuse or Lambertian and which has extremely high reflectance. Light energy introduced in an integrating sphere is reflected from the wall and distributed uniformly around the interior. A detector which is placed at a hole or 'Port' in the sphere wall sees an output which is completely independent of the angularproperties of the input light. The independence of the output of a sphere from the angular properties of the input and the uniform internal distribution of light make integrating spheres ideal for many uses.
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Automatic Relay Test Set
DRTS 34
DRTS 34 is the most powerful diagnostic test set designed to perform accurate tests on protection relays, transducers, energy and power quality meters. This advanced test equipment is also thought to satisfy all the needs related to commissioning and substation maintenance. 3 Current and 4 Voltage generators simultaneously available.
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HV AC Test Set
SERIES S400 TYPE RX I O/ I OACP
K&S Engineering and Scientific Ltd
The output is continuously variable from zero to 10 kV by means of the panel mounted regulator. An output trip is fitted which operates when the output exceeds 25 mA switches off the test set and operates a neon overload indicator. Primary protection is provided by two panel mounted fuses. The output is protected by the output trip and a magnetic/hydraulic circuit breaker.
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Test Leads Adapter Sets
A physical device used to connect electronic test equipment to a device under test.
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Oil Test Set
We are the most reliable manufacturer and exporter of Oil Test Set that is ideal for testing of Breakdown / Withstand Test of Transformer and Circuit Breaker Oil. This test set is manufactured using premium quality raw material under the supervision of versed professionals. Moreover, the offered test set is checked by our quality inspectors on various parameters to ensure its flawlessness at clients' end. Our valuable clients can avail this Oil Test Set from us at competitive prices.
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Optical Test Lab
Every object affects or interprets light differently, so appropriate and accurate measurements are needed in order to determine how much light is being produced by a source or cast upon an object. This can be measured with respect to power requirements, as well as how the human eye interprets that light.
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Duplex Double Test Insertion/Return Loss Test Station
JW8302
Shanghai Joinwit Optoelectronic Tech,co.,Ltd
JW8302 Duplex double test Insertion/Return Loss Test Station is a professional equipment to test CWDM device, multi-wavelength device, PLC, fiber optical patch cord and other passive optical devices. It is a new-generation precision optical instrument of JOINWIT who combined with so many years experience in optical passive detection. It equipped with VFL or 850 light source , supporting threshold determination, automatic multi-wavelength detection, system integration, secondary development, upper computer solution, etc. Double LC interface or other different interfaces can be tested simultaneously which is convenient for testing and improves efficiency; The VFL function could automatic on and off, no need to replace the connector.
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1x13 Optical Switch
N7734A
The N7734A is a 1x13 fiberoptic switch, available for single-mode or multimode fiber connections. These enhance accurate measurements and ease automation with excellent repeatability, fast switching time and flexible interfacing with LAN, USB and GPIB.
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Automatic Relay Test Set
MT2000 Series
Portable single phase dual current manual and automatic relay test set. Readymade test modules. Independent control of Phase angle, frequency and amplitude.
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Protection Relay Test Set
HT-802 / 301
Wuhan Huatian Electric Power Automation Co., Ltd.
Special instrument for microcomputer relay protection test of microcomputer industrial control machine.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Optical Talk Set
TM4103N
TM4103N Optical Talk Set is an intelligent and efficient instrument that combines in one set the functions of both a digital optical phone and a stabilized light source. It is widely used in operations of installation, optical testing, maintenance and fiber attenuation value testing in data network, CATV and Telecommunication network. The TM4103 Talk Set can carry out full-duplex communication with high quality connection and not be affected by distance.
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High Voltage Test Set
Hi-Pot Series
SCOPE introduces a high voltage test set, these high voltage testing sets comes with Power frequency AC high voltage /DC high Voltage test /AC-DC high Voltage test set for testing transformers, motors, insulators, cables etc. Further, these testing sets are capable of giving continuously variable HIGH VOLTAGE from zero to maximum rated output voltage. Wide range of up to 100 kV is available in user selectable combinations.
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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DC Hipot Test Set
KVZG
KV Hipot Power Test Equipment Co.,Ltd
DC Hipot Tester is applied to measure output voltage and leakage current for zinc oxide arresters, magnetic blowing arresters, power cables, generators, transformers, circuit breakers and other equipment.
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Secondary Injection Test Set
PTE-100-C Pro
The values which are presented in the LCD display are highly accurate, easy to read, and independent of the injection made by the PTE-100-C base unit.The display shows continuously the phase difference between the voltage and the current injected, and can be adjusted during the test with an accuracy of 0.1º. This facilitates the test for directional relays or reclosers and synchronizing relays, etc.
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Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Common Armament Test Set
MTS-209
The MTS-209 is a state-of-the-art portable test set for various armament systems used on the F-16, F-15, F-18, TA-50, FA-50 and additional aircraft. The MTS-209 supports a wide range of Alternate Mission Equipment (AME) including launchers, pylons, and racks. It combines the test capabilities of an I-Level test set in a compact, rugged, flight-line qualified enclosure. The MTS-209 performs parametric functional tests on AME components including Launchers (LAU-117, 16S210, LAU-127,, LAU-128, LAU-129, LAU-7,etc.), bomb racks (MAU-12, MAU-50, SUU-20, TER-9, etc.), Remote Interface Units (RIUs) and Pylons. The MTS-209 can also test MIL-STD-1760 aircraft stations and weapon systems.
