PC Test
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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High-Performance Integrated Functional Test Platform
Spectrum-9100™
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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SAS Protocol Test System
Sierra M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Industrial All-In-One Touch Panel PC Based On 7th Gen. Intel® Core™ Processor
STC2-KL Series
- Intel® Core™ i3-7100U/i5-7300U/i7-7600U- 10.1"/15.6”/21.5” 16:9 LCD with LED backlight up to 50,000 hours- With up to 1920 x 1080 resolution- 10-point PCAP touchscreen- Anti-fingerprint surface treatment- IP 65 rating for water and dust protection- Robustness with wide 9-36V DC input- Ease of installation with optional VESA mount
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Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Bottom Electrode SMD Test Fixture
16197A
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Terminal Test Kit (19 PCS)
3604
Peaceful Thriving Enterprise Co Ltd
1. Checks voltage on 6, 12 and 24V systems.2. 12-feet flexible rubber wire with spring relief.3. Tough plastics handle lights up if circuit is good.4. 4mm connection for banana plugs.5. Facilities the measurement on connectors and components without destroying the insulation or the plug connection.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Scienlab Combined Battery Test Solution
SL1133A
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Panel PCs
The Senses panel PC range is our own brand of entry-level to high performance panel PCs. These systems provide affordable and reliable quality flat panel PCs and are used in Human Machine Interface (HMI), SCADA, process control, factory automation, building control and home automation applications.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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PC Software
DawnEdit™
DawnEdit™ is a database editor that customizes data acquisition for vehicles. DawnEdit determines the available parameters and builds a database for each vehicle model, so you only need to select the parameters of interest from a table. DawnEdit configures the DAWN Mini Loggers for OBD, J1939, and analog data.
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Industrial PCs
Modern board architecture and robust mechanical design ensure capability of Fastwel BoxPCs to withstand high shock and vibration levels and demonstrate resistance to aggressive environment without operability loss.
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ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
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PC Based Comprehensive Test Setup for Luminaires
Our zest for innovation has resulted in continuous upgrades in the existing line of products. Till now we used to manufacture 3 different equipments for Driver, MCPCB and Luminaires Component testing. We at SCR Elektroniks have developed our comprehensive tester to incorporate all the 3 systems in a single bench. Here in this tester one can test all the three DUT in a single bench. Since all the 3 testing procedures have many tests in common, we have incorporated all the tests in a single bench such that testing of Luminaire driver, Luminaire PCB and Final Luminaire set is performed in single test bench. Only these tests are performed over the DUT else other are disabled for them.
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Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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PC System Electronics
Keysight PC electronics provide state of the art laser interferometer performance in the convenient PC backplane format. Axis, servo-axis and compensation boards are available.
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Configurable Functional Test System
ATS-5000
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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Embedded PCs
EPC-R Series
EPC-R Series are Arm-base embedded PC designed for 3.5” motherboards.
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Embedded PCs
EPC-S Series
EPC-S Series are slim and fanless system designed for embedded single board computers.
