PC Test
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
2m BNC Test Cable
16048D
Test Port Cable
The 16048D test leads extend the measurement port with a 4-terminal pair configuration. It provides a BNC female connector board to allow attachment of user-fabricated test fixtures.
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Scienlab Battery Test System – Module Level
SL1001A Series
Test System
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Product
Modular Embedded Box PC With Intel® Core™ Ultra CPU (Series 2)
UNO-2484V3
Box PC
Intel® Core™ Ultra Processors (Series 2), including Ultra 5 225U & Ultra 7 255U (formerly Arrow Lake)Wide operating temperature: -20 ~ 60 °C; power input: 10 ~ 36 VDCUp to four display outputs (DP + HDMI + 2 x Type-C)4 x LAN, 3 x USB 3.2 Gen2, 1 x USB 2.0, 2 x Type-C4 x RS-232/422/4852 x M.2 M-key, 1 x M.2 E-key, 1 x M.2 B-keyUser-friendly design: side-extractable SIM card, easy RAM & logo replacement, reserved punch-out holes for antennasOptional DDR5 slots x2, each channel supporting up to 32GB, enabling flexible memory expansion and optimized system performance
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Product
ARINC-429 Module
M4K429RTx
Test Module
The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
Test Handler
M6242
Test Handler
Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
11th Gen Intel® Core™ I5-Based Fanless Embedded Computer
EMP-510 Series
Box PC
- 11th Gen Intel® Core™ i5 BGA SoC processor- DDR4 SODIMM up to 64GB- FHD/4K/8K up to 4x independent displays- 2x GbE, 1x COM, 4x USB ports- M.2 2280 SSD- Wi-Fi 6/LTE compatibility
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Dielectric Material Test Fixture
16453A
Test Fixture
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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Product
Modular TPC - Computing Box Module With Intel® Core™ Processors (13th Gen)
TPC-B520
Panel PC
Modular Computing Box powered by Intel® Core™ processors (13th gen) i5-1335UE deca-core/ i7-1365URE deca-core processorSingle DDR5 Memory slot supports up to 32GBSupport expansion via three M.2 slots (NVMe, Wifi, 5G)LAN, POE, isolated serial port and isolated digital I/O via iDoor technologySupport Type C connector with USB 3.2, DP 1.4a, 15W power deliverySupport fieldbus protocols/GPS/GPRS/Wi-Fi capabilities via iDoor technologyModular Front Panel modules ranging from 12.1" to 23.8" with P-CAP multi-touch in selection (12.1", 15", 15.6", 21.5" with high brightness panel option)
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Product
Fastest In-Circuit Test Platform
TestStation
Test Platform
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Product
Dielectric Test Fixture
16451B
Test Fixture
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Product
SAS Protocol Test System
M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
Intel® Atom™ E3900 Series Embedded SBC Fanless Slim System
EPC-S202
Embedded PC
ntel® Atom™ E3900 series.Onboard 4GB LPDDR4-2400MT/s, 32GB eMMC.Semi-Industry Fanless slim systen, Din Rail or Wall mount design.Support HDMI x 1 , GbE x 2 USB 3.0 x 2, COM x 2, DIO x 2.Flexible expansion M.2 E key, mSATA/mPCIe.Supports iManager, SUSI APIs, WISE-DeviceOn and Edge AI Suite.No RED certification.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
Test Fixture
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
NI HIL and Real-Time Test Software Suite
test
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
Small-Size Modular Embedded Box PC With Intel® Atom™ E3845/Celeron® J1900/J3455
UNO-2372G
Box PC
Intel Atom® E3845, Celeron® J1900/J3455 quad-core processor with 4G DDR3L memoryCompact, robust, fanless and cable-free system with high stabilityModular design with optional SSD/ NVME/ Wi-Fi/Bluetooth/cellular scalabilityMicrosoft Azure IoT Edge and Amazon AWS IoT Greengrass certified
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Product
ARINC-708 Module
M4K708
Test Module
The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
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Product
Industrial Fanless Mini PC (Dual 4K Media Player)
EMP-100 Series
Box PC
- Palm size and slim design (H: 28mm)- Intel® Celeron® N6210/J6412 processor- Support 2x HDMI output- Support 12V DC input- 1 x DDR4 SO-DIMM, up to 16GB- 1 x M.2 2280 Key M for optional storage device- 1 x M.2 2230 Key E for optional Wi-Fi/BT Module- 3 x USB 3.2 Gen.1 (Type-A)
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Product
7th Gen. Intel® Core™ Processor-Based Fanless Open Frame Touch Panel PC
SP2-KL Series
Panel PC
- 7th Gen. Intel® Core™ Proc- 10.1"/15.6"/21.5" PCAP touch screen- Wide input voltage range 9-36V DC- Full customization for fast integration with all form factors, kiosks, and all-in-one panel PC applications- Enhanced protection in case of sudden power outage with back-up battery (Optional)- Pre-compliance EMC testing and high ESD tolerance
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Product
Intel Atom® Processor-Based Fanless Open Frame Touch Panel PC
SP2-EHL Series
Panel PC
- High power efficiency with Intel Atom® x6000E series processors (formerly Elkhart Lake)- 7"/10.1"/15.6"/21.5" PCAP touch screen- Wide input voltage range 9-36V DC- Full customization for fast integration with all form factors, kiosks, and all-in-one panel PC applications- Extensive I/O and function expansion through board-to-board connectors (Function Modules)- Simple cabling with optional Power Over Ethernet (60W)- Supports up to 3 displays, including integrated panel, DisplayPort, and USB Type C (Optional)- Pre-compliance EMC testing and high ESD tolerance
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Product
Conformance Test System
TS-RRM
Test System
The R&S®TS-RRM 5G and LTE test system is a test solution for running 5G NR and LTE inter-RAT RRM test cases for certification of wireless devices.It is a fully automated conformance test system for running validated RRM conformance test cases. In addition to the RRM test cases required by GCF/PTCRB, the R&S®TS-RRM also supports carrier acceptance specific RRM tests.
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Product
Control/Gateway/Display All-In-One Industrial Panel PC
PanKonix Series-HMI Panel PC
Panel PC
The PanKonix® series HMI is an Intel® Core™ i3/i5 and Intel Atom® x5/x7-based panel PC equipped with user-friendly, full-featured HMI software. It ensures seamless PLC connectivity through Modbus protocol support and incorporates trend charts, data logging, alarms, and cloud connectivity functions with RESTful API, MQTT, and OPCUA support for efficient data visualization and machine monitoring.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
