Zener Diode
current flow from cathode to anode reverses when zener voltage reached.
See Also: Diode, Laser Diode, Diode Test, Photodiode
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PRO8 Modular Laser Diode Platform
Thorlabs offers the PRO8 modular test and measurement platform in 2-slot and 8-slot configurations. These customizable bench top chassis let users build a compact fiber or laser diode testing platforms for their lab or factory floor. Modules include lasers, TEC controllers, optical switches, and current controllers.
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Tester for Alternator Stator Windings and Diode Bridges
MS014
The equipment combines two devices: tester of stator windings and diode bridges. The device has small dimensions and a light weight, it was developed according to the requirements of contemporary service stations.The feature of the handset tester is diagnostics of stator windings and diode bridges with no additional testing and measuring devices.Diagnostics of stator windings is carried out through automatic identification of phase connection, detecting winding integrity and measuring the difference in phase distortion.
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Laser Diode Burn-In Testing
Laser reliability testing consists of a series of tests that laser diodes can be put under in order to ensure their reliability for post-production use. There are different types of tests that can be carried out and there are multiple measurements that can be taken in order to evaluate the reliability of the device. One of these tests is laser diode burn-in.
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MINIATURE SILICON DIODE TEMPERATURE SENSOR, 2 To 600 Degress Kelvin
Insight Product Company offers SILICON DIODE TEMPERATURE SENSORS CAN BE USED FOR TEMPERATURE Â MEASUREMENTS IN DIFFERENT FIELDS OF CRYOGENIC ENGINEERING AND EXPERIMENTAL PHYSICS. THEY ARE MINIATURE AND OPERATE IN THE TEMPERATURE RANGE FROM 2 TO 600 K.
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Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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PIN Diodes
The SemiGen SGP7000 series of PIN Diodes are processed with a high-resistivity epi that have intrinsic layers that range in thickness from 4 micron to 200 micron depending on performance specifications. These devices are typically manufactured with either a robust thermal-oxide passivation or ceramic glass for durable high-power applications. These diodes are made with a grown junction P++ layer that yields abrupt junction structures that provide low punch through voltages and minimize autodoping. They are available as chips or in your choice of packages.
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Tunable Diode Laser (TDL) Analyzers
Teledyne Analytical Instruments
Tunable Diode Laser (TDL) Analyzers by Teledyne Analytical Instruments






