IC Test
See Also: IC, Digital IC Testers, IC Clips, IC Probes, IC Test Systems
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Product
Handheld Compact Professional IC Tester
LinearMaster
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The ABI LinearMaster Compact Professional is a low-cost, hand-held out-of-circuit IC tester. The LinearMaster is designed for testing analogue ICs with up to 16 pins through a ZIF socket (see ChipMaster for digital devices). A range of adapters is also available for SOIC and PLCC devices.
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Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
Test System
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Product
IC Measurement Technology
Emission
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is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) according to IEC 61967-4 at IC pins.
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Product
Shallow Water Ice Profiler
SWIP
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The Shallow Water Ice Profiler (SWIP) is a real-time acoustic ice thickness measurement (ice draft) instrument for shallow water applications. The underwater components include a low-cost acoustic transducer, a tilt sensor, a high-precision pressure sensor and a temperature sensor, all providing suitably high resolution for shallow water measurements.
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Product
Ice Point Calibrators
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These ice point calibrators are designed to accurately calibrate probes at the freezing point of water. These devices have multiple thermowells to calibrate multiple sensors simultaneously.
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Product
Memory Test System
T5511
Test System
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
6TL23 Off-Line Seat Operation Base Test Platform
H71002300
Test Platform
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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Product
Power ICs - Smart Load Switches
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Combining multiple functions in a single IC, Vishay smart load switches eliminate the need for external circuitry . A simplified GPIO interface allows for power distribution and sequencing of multiple sub-systems. Slew-rate-control devices provide a controlled supply ramp to reduce inrush current, while fault protection and isolation switches increase robustness with reverse current, overtemperature, current limiting, and short circuit protection features. The ICs offer quick output discharge and small footprints, while their integrated design saves PCB space compared to discrete solutions, reduces BOM counts, and lowers manufacturing costs.
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Product
RF Front-End ICs
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Analog Devices offers RF Front-End ICs for phased array antenna solutions. These RF Front-End ICsare placed right at the antenna element and can quickly switch between transmit and receive functions in radar applications. The power amplifier on the transmit side is highly efficient operating in short pulse durations. The low noise amplifier on the receive side has a low noise figure with high linearity so that it won’t distort the incoming return signal. The RF Front-End IC also incorporates a high performance switch to toggle between the transmit and receive paths. Highly integrated planar phased array antennae need small form factor solutions, and Analog Devices has integrated the switch, low noise amplifier, and power amplifier into a small surface mount package as well as the decoupling capacitors, providing an optimal solution.
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Product
Optimize Throughput And Cost For MmWave 5G Device Functional Test
Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Product
EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Product
Physical Layer Test System
N19301B
Test System
The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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Product
ICs For PFC Power Supply
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Equipped with a variety of functions for improving efficiency, driving higher efficiency and eco-friendliness for power supply systems of electric devices, and thus society as a whole. Driver ICs are also available for high-accuracy, high-efficiency LED lighting systems.
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Product
Test Port Adapter Set, 3.5 Mm To 3.5 Mm
85130D
Test Port Adapter
The Keysight 85130D test port adapter protects the test set port from being directly connected to the device under test. These adapters have a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 3.5 mm to PSC-3.5 mm male adapter and a 3.5 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 28 dB or better.
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Product
IC EMC Analysis
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We carry out standard measurements according to BISS/IEC and analysis of the interference immunity and interference emissions of ICs during development.With the targeted EMC analysis, we uncover weak points in the ICs so that the IC developer can use them to develop improvements for the product
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
GNSS ICs
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Teseo III, the latest generation of ST's GNSS ICs, offers reduced power consumption and carrier-phase tracking, allowing higher accuracy for automotive applications.
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Product
ICs For Factory Automation (R-IN)
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The advancement of Industry 4.0 and the Industrial Internet of Things (IIoT) brings with it a growing need to boost factory productivity. The use of Ethernet-based networks in factories is becoming more widespread, as deterministic, safe communications across all levels of the factory are more critical than ever. Renesas has a comprehensive portfolio of products to support Industrial Ethernet solutions leading to increased factory productivity and reduced production cost.
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Product
COM-HPC Server Type Ice Lake-D Starter Kit
Software Development Kit
The COM-HPC Server Type Starter Kit consists of a COM-HPC Server Type module, memory, and thermal solution of your choice with an extended ATX size COM-HPC Server Type reference carrier board, as well as necessary cabling. It allows you to quickly emulate the functionality of your end product for software development and hardware verification. Carrier board design files (schematics, mechanical drawings), COM-HPC module drivers, BSP, and user manual are also offered to aid you in designing your own custom carrier board.
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Product
Scienlab Combined Battery Test Solution
SL1133A
test
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
Test System
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
Voltage Protection ICs
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ST’s voltage protection devices prevent external overvoltage (or undervoltage) peaks from damaging circuitry. They are commonly implemented on the power charging patch of portable devices to prevent USB or AC charger power failure. ST’s devices offer the advantage of very precise voltage thresholds, so that the protection is activated accurately, and without fail.
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Product
PCIe 2.0 Test Platform
PXP-100B
Test Platform
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
Ka-Band Silicon 5G Quad Core IC
AWMF-0108
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The AWMF-0108 is a highly integrated silicon quad core IC intended for 5G phased array applications. The device supports four Tx/Rx radiating elements, includes 5 bit phase and 5 bit gain control for analog RF beam steering, and operates in half duplex fashion to enable a single antenna to support both Tx and Rx operation. The device provides 26 dB gain and +9 dBm output power during transmit mode and 28 dB coherent gain, 5.0 dB NF, and -28 dBm IIP3 during receive mode. Additional features include gain compensation over temperature, temperature reporting, Tx power telemetry, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 48 lead 6x6 mm QFN for easy installation in planar phased array antennas.
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Product
SSD Test Systems
MPT3000ES / MPT3000ES2
Test System
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
