X-ray Inspection Systems
See Also: Inspection Systems, Automated Fiber Optical inspection Systems
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Product
Adaptive Target Recognition System
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Information System Technologies Inc.
ISTI’s adaptive target recognition, detection and classification system for sonar imagery can learn in-situ from expert operators’ feedback in order to yield better accuracy and flexibility in making decisions in new environmental and operating conditions. The developed system is based on the intuitive concept of image retrieval, where images submitted to the system are matched to learned images via a similarity measure. An information-based selective sampling measure chooses the new patterns to be used in the in-situ learning.
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Product
Wet Oxidation System For VCSEL Fabrication
VIXEL-320
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The VIXEL-320 is a wet oxidation system intended for the fabrication of Vertical Cavity Surface Emitting Lasers. It is an atmospheric-pressure oxidation system with in-situ monitoring of oxide aperture formation. It accommodates single wafers of up to 150mm (6") in diameter.
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Product
Total Phosphorus Analyzer Liquiline System
CA80TP
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Total phosphorus analyzer for environmental monitoring, industrial and municipal wastewater. Phosphorus is the decisive factor for excessive algae and plant growth in water bodies, that's why continuous monitoring of this parameter is essential. The Liquiline System TP analyzer offers precise online measurement of total phosphorus and ensures highest process safety.
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Product
Linear Rail Systems
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Haydon Kerk offers both motorized and non-motorized linear rails, guides and splines that deliver enhanced system stability, high positional accuracy, low friction and long life for a variety of linear motion applications.
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Product
Inline Measuring System
EBA
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The measuring system consists of a measuring and processing unit together with a double yoke system with all the required coils (exciting coil, secondary coil, tangential field coil). The double yoke system is installed in the production line. The material to be measured is fed through this unit.
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Product
MSF systems
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Meinberg Funkuhren GmbH & Co. KG
DCF77 / WWVB / MSF systems: DCF77, WWVB and MSF time signal receiver, DCF77 generators, DCF77 simulation
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Product
Computer Assisted Microhardness System
C.A.M.S.
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Newage Testing Instruments, Inc.
The C.A.M.S. concept starts with a Newage microhardness tester (or competitive microhardness tester), such as our MT91 Series or MS-ZH Series with video camera, combined with our software, personal computer and any required accessories, such as a motorized X-Y-Z axis positioning table.
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Product
Meteorological System
200M
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The Model 200M is a complete instrument for the measurement of Atmospheric Dew Point, Ambient Temperature, % Relative Humidity, or other Psychrometric Variables. It employs the very reliable optical chilled mirror sensing technique which provides a primary measurement of dew point, and is traceable to NIST. The Model 200M is ideally suited for installations requiring continuous, automatic, and unattended measurement of humidity over a very wide range.
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Product
Systems
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Walter Stauffenberg GmbH & Co. KG
Custom-design and ready-to-install hydraulic pipe, tube and hose assemblies from port to port
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Product
Sample Conditioning System
IntraFlow Series
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Parker’s IntraFlow modular fitting and valve system was developed specifically for analytical, lab and other complex general purpose instrumentation flow control systems. These compact systems meet ISA/ANSI SP76.00.02 requirements
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Product
Automated Measuring System
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The Ford Meter Box Company, Inc.
Accurate test results● Easily interface meter test data with your computer network● Security device provides a secure internet connection with Ford Meter Box● Touch-screen PC provides step-by-step instructions● Test bench is available in single or double row● Performs tests without constant supervision● Optional remote operation (not supplied by Ford)● Tests high, intermediate and low flows● Preprogrammed tests or customized tests
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Product
Custom Gas Measurement System
PA201
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Gasera’s PA201 custom gas measurement system is a gas cell with an integrated detector that can be combined with different types of laser sources, making it an extremely versatile research tool. It also includes the gas exchange module that makes it extremely easy to use.
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Product
Universal ARINC HSI Test System
TA-1000
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This is our ARINC Standard Universal HSI Tester designed to provide a full range of capabilities that allow testing most any HSI you will see come through your shop.
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Product
Magnetic Particle Inspection(MPI)
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Magnetic particle inspection is an inspection method used to identify defects on the surface of ferromagnetic materials by running a magnetic current through it.
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Product
AM Control System
Clamir
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*Continuous monitoring of melt pool dynamics and geometry.*Ensures quality and repeatability.*Compatible with most laser heads.*Compatible with a wide range of materials.*Easy mechanical integration.*Quick configuration.*Helps to reduce CO2 emissions.
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Product
High Voltage Cable/Harness Test System
CKT1175-50
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The CKT1175-50 is a high-voltage wiring analysis system that features a switching matrix that can be distributed around the workshop or in and around the assembly to be tested. This system is expandable in 100 or 150 test point increments to 96,000 test points, and is available with a variety of adapter cable interface connectors, with the standard being the CKT MAC interface system
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Product
Three-phase Fully Automatic Test System
TS41
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Calmet Smart Calibration Devices
The Calmet TS41 test system consists of a three-phase reference meter of accuracy class 0.02% (or 0.04%) and an integrated three-phase current and voltage source up to 3x120A/600V. It makes possible automatic testing of electricity meters in meter test stations
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Product
Hybrid And Fusion Bonding Systems
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Hybrid bonding extends fusion bonding with embedded metal pads in the bond interface, allowing face-to-face connection of wafers. The main application for hybrid bonding is advanced 3D device stacking.
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Product
Vision System
Project X
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Project X is different. It utilises a totally new, patented technology XY scale, that records not only X and Y position but also any rotational movement of the camera system. In addition, this is an absolute scale system, which means as soon as you switch on the machine it knows exactly where it is - no need for referencing. The camera is free to glide around the measurement area mounted on a simple air bearing system, without any worry about constraining the mechanics to avoid losing accuracy.
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Product
CMP Process and Material Characterization System
CP-4
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he new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes. Reproduces full-scale wafer polishing-process conditions. Provides unmatched measurement repeatability and detail. Performs tests on small coupons rather than whole wafers for substantial cost savings.
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Product
Wireless Torque Sensor Systems
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Advanced Telemetrics International
are utilized in applications where conventional torque transducers are not practical due to high shaft speeds, vibration, and dirty, oily environments.
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Product
VME & CPCI Systems
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Verotec has a selection of configured systems plus individual elements such as backplanes, power supplies and cooling products, compliant with the PICMG / VITA specifications, and supported by a range of accessories. We offer these in standard VME and CompactPCI platforms across various mechanical form factors with customising options to suit specific applications.
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Product
Partial Discharge Test System
TPP
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The Partial Discharge Test System type TPP is used for non-destructive insulation and quality testing of electrical components (for example according VDE 0110-1, EN 50178, IEC 60270 and IEC 60060).
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Product
System Tests Radar Pulse Stability
PN9002
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Noise eXtended Technologies S.A.S.
The cost-effective PN9002 test simplifies the testing and analysis of pulse-to-pulse amplitude and phase stability for radar systems and components to 18GHz.
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Product
Scalable Studio Monitor System
Amie Systems
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The compact, self-powered Amie Precision Studio Monitor is engineered to excel in critical audio workflows requiring accurate mix translation to a variety of environments. Amie flawlessly reproduces source material at any volume level, and exhibits a remarkable power-to- size ratio as well as true phase linearity for ultra-precise spatial imaging.
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Product
Embedded Systems Projects
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Precision Development Consulting Inc
Module Controller in Track System for silicon wafers, Static Headstack Tester, DOS Device Driver, LED Wafer Prober
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Product
Nano-focus X-ray Inspection System
X-eye NF120
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Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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Product
Bypass Diode Thermal Test System
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King Design Industrial Co., Ltd.
* Power: the heating board control panel uses 220V single-phase power.* Power consumption: 1.0KVA, 1000W(Max)* Volt: 220VAC* Current: 4.5A* Heating board: one controller per board* Power rate: room temperature raise to 75°C± 5°C within one minute.* Heating board dimension: 500mm x 1,000mm* 6-sheet electrical heating boards test: used to test the 2,200mm x 2,600mm module. It can be customer-designed.* The length of board power cable and thermal sensor cable shall exceed 3,000mm.* To get uniform heating effect, the electrical board is sandwiched by 2mm aluminum sheets at both sides of board.
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Product
Multipurpose X-Ray Diffractometer with Built-In Intelligent Guidance
SmartLab SE
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The SmartLab® SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and advanced photon counting hybrid pixel array detectors (HPAD).
