PCI Express Test
See Also: PCI Express, PCI Express Analyzers, PCIe
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Product
Test Equipment
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Shenzhen Star Instrument Co., Ltd.
Star Instrument Test Equipment - reference meters, test analyzers, power supplies, and more.
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Product
8 SE Or 4 Diff. Input Channels, 4 Analog Current Output Channels, PCI Express
APCIE-3121-8-4C
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Input range:?± 10 V, 0-10 V software programmable0-5 V, ± 5 V, 0-2 V, ± 2 V, 0-1 V, ± 1 V (gain)0-20 mA (option) ? software-programmable amplifier:PGA x1, x2, x5, x10 ? Conversion triggered through software,scan, timer, external event ? Onboard FIFO buffering for 256 analog values ? Data exchange through 16-bit I/Oor 32-bit memory (PCI DMA) ? Sequence RAM ? Overvoltage protection ? input filter: 160 kHz
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Product
Piezoelectric Testing
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Radiant Technologies, Inc. specializes in the measurement of electrical and piezoelectric properties of non-linear materials. The Piezoelectric Task captures a sample's displacement as a function of voltage profile along with the sample's polarization response. An external displacement measurement instrument must be attached to a Radiant Precision Test System to make this measurement. All of the Radiant testers are equipped with a high-impedance voltage input to capture the output of a displacement sensor. Every Vision measurement task will collect data from that sensor input simultaneously with the measurement being executed. Radiant's test systems work easily with displacement sensors which include:
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Product
Test Solution
Eye-BERT MicroX
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The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information. Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability). With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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Product
Testing and Measurement
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AkroMetrix provides a variety of products to help you identify and evaluate warpage: For warpage measurements along a production line or at room temperature, AkroMetrix has developed the LineMoiré Production Level Automated Flatness Inspection System. If you need to measure warpage and flatness during pre-defined temperature profiles, AkroMetrix's TherMoiré In-Process Warpage Measurement Systems may fit your requirements.
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Product
PCIe-6351, PCI Express, 16 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO Multifunction I/O Device
781048-01
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PCI Express, 16 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO Multifunction I/O Device - The PCIe‑6351 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6351 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
LED Probes for testing
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Advanced Probing Systems, Inc.
Probe Needles are used for the fabrication of most probe cards, however there exist applications for which these materials may not be appropriate, e.g., hubrid device and gold pad probing.
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Product
Universal Test Fixture
CAM/GATE
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The Low Cost Solution for Accurate and Dependable Universal Functional TestThe CAM/GATE ® Universal Test Fixture System is your afforable, efficient solution for functional test. No need to have multiple fixtures in your test area...
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Product
PCI 32 Channel Reed Relay Output Digital Interface
8007
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The 8007’s PCI digital I/O interface reed relay outputs provide high quality, long-life, low-current (10 Watt maximum), dry contact switch closures. Reed relays are well suited for low current applications. The relays are normally open, and close when energized.
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Product
Testing Tool Development
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We can create a custom software testing tool for your needs.As developers who love testing, we invest in R&D, combining our product testing and software development expertise to deliver customized testing solutions for you, utilizing open source stacks combined with Artificial Intelligence for added power.
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Product
Test Software
Elektra
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The R&S®ELEKTRA test software controls complete EMC systems and automates measurements of equipment under test (EUT) being certified for emissions (EMI) and immunity (EMS). R&S®ELEKTRA simplifies configuration of test systems and test descriptions in accordance with common standards. It speeds up test execution and paves the way to quickly generating a comprehensive test report.
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Product
PCI Multifunction Board
PCI-1602/8K/S
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The PCI-1602/1602F series is a family of high performance and high resolution data acquisition boards for the PCI bus. It features a continuous, 100KHz for PCI-1602 (200KHz for PCI-1602F), gap-free data acquisition under DOS and Windows. The PCI-1602 family has the same hardware architecture as PCI-1802L. The PCI-1602 provides 32-channel single-ended or 16-channel differential analog inputs. Like the PCI-1802 family, the PCI-1602 series features a "Magic Scan" function, M-function, X-function, and Continuous Capture function.
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Product
Wireless/RF Testing
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NCEE’s experienced iNarte EMC/EMI qualified staff provide wireless and radio frequency (RF) testing of intentional radiators to ensure they meet the FCC, CE, and many other international regulatory requirements for transmitting and receiving (radio) devices. Frequent regulatory changes and complex testing requirements are common with wireless/RF equipment. NCEE Labs stays current with the most recent requirements and can help you navigate your requirements while supplying quality testing services to demonstrate worldwide compliance!
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Product
PCI Daughter Boards
DB-8225/2 (with 2 meter D-Sub 37-pin cable)
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Screw terminal boardusing 37 pin cable I/O ports for A-82X seriesPCI-1800 series. (16 channel single-ended or 8 channel differential)Blank padsfor break detectionlow-pass filtercurrent shut and voltage attenuation.On board cold junction circuit in analog input channel 1jumper selectable single-endeddifferential modeDimensions :118mm x 174mm
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Product
Motorized Test Stands
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AMETEK Sensors, Test & Calibration
Our motorized test stands are optimized for production floor operation. They provide a constant test speed and require a force gauge to be integrated with the test stand.
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Product
Petroleum Testing
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Intertek petroleum testing services support the entire petroleum products range: crude oil, refined petroleum products, refined fuels including gasoline, diesel, fuel oil, residual oil, LPG, petrochemicals, industrial gases, and natural gas. Intertek is a world leader in providing petroleum testing, petroleum sampling and petroleum inspection services to oil, chemical and related companies on a global basis.
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Product
PCI Very High Density Multiplexer, 198-Channel, 1-Pole
50-670C-022-198/1
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The 50-670C-022-198/1 is a 198-channel, 1-pole MUX and is part of a series of very high density multiplexer cards feature a wide range of switching configurations. Typical applications include signal routing in ATE and data acquisition systems.The 50-670C shares exactly the same architecture as the established 40-670 range of PXI modules.
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Product
Scalable Test Solution for Mixed-Technology Test Applications
Spectrum RF Systems
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The Spectrum RF Systems are fully integrated, configurable test platforms combining several digital, analog, RF, and switching instruments to provide automated functional test solutions for a wide range of mixed-signal and microwave test applications including radars, Electronic Warfare, missile, and satellite communications.
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Product
PCI Precision Resistor Card 3-Channel, 3Ω To 5.82MΩ
50-297-152
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The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
DNS leak test
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Sometimes a VPN can fail to protect your device’s DNS queries even when the rest of your traffic is concealed by the VPN tunnel. This is called a “DNS leak.” If your DNS leaks, unauthorized entities, like your internet service provider or DNS server operator, can see which websites you visit and any apps you use.
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Product
Insulation Testing
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Weshine Electric Manufacturing Co., Ltd
Insulation is one of the most important constituents of a transformer. Any weakness in the insulation may cause failure of transformer. To ensure the effectiveness of the insulation system of a transformer, it must confirms the dielectric test. But the power frequency withstand test alone can not be adequate to demonstrate the dielectric strength of a transformer.
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Product
Advanced SoC Test System
3680
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The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
COM Express basic Type 7 with Intel Atom processor
COMe-bDV7
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The COM Express module COMe-bDV7 based on the Intel Atom processor C3000 series extends Kontron's product family of server-grade COM platforms. The COMe-bDV7 as an entry level platform is as a complementary product to the high performance class COMe-bBD7 equipped with the Intel Xeon processor D-1500 series. The COMe-bDV7 module features scalable CPU performance with up to 16 cores.
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Product
Meter Test Switches
Meter Test
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TESCO introduced the original Meter Test Switch in the early 1920's. TESCO's current line of Test Switches have been designed with the intention to combine the best features of tried and proven switching methods with improvements in materials and construction.
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Product
Functional Test Fixtures
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EMC Technologies designs and manufactures discretely wired and wireless functional test fixtures used for performance verification of PCBs and Electronic Assemblies. Commercial applications have included work in support of many industries including: satellite TV, computer servers, medical, networking, and telecommunication.
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Product
EMC Testing Services
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Our sophisticated technology can meet the diversified needs of customers. Component Tests: Immunity, Radiated Immunity, ALSE, TEM cell, Bulk Current Injection, Stripline, Conducted Immunity, Transient Immunity, Power Supply Variations, Electrostatic Discharge Emissions, Radiated Emissions, Conducted Emissions, Transient Emissions. Vehicle Tests - Radiated Immunity, Radiated Emissions.
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Product
UAT testing
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A successful UAT is crucial for deploying systems with no errors and business risks. However, implementing UAT in an agile environment might lead to frequent and reduced cycles of testing. This mandates UAT testers to develop skills of optimized testing techniques, automation and work in collaboration with the development and QA teams.
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Product
Optical Test
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Optical components such as micro-lenses, diffractive optical elements (DOE), meta optical elements (MOE) and micro lens arrays (MLA) are now largely used on consumer electronics and even more optical elements need to be integrated into smaller and smaller packages. Nowadays mass-production industries key to success lies in increasing the yield by means of strongly automatized testing machines, with statistical analysis.
