PCI Express Test
See Also: PCI Express, PCI Express Analyzers, PCIe
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Product
Munitions Testing
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E-Labs has an extensive background in the development and testing of Less Than Lethal (LTL) devices. We were the first to develop a measuring system to capture blunt force or impulse of a round in real time. The Ballistic Impulse Measuring System (BIMS) developed by E-Labs was used on USMC programs to evaluate LTL rounds and compare impulses on a one to one basis.
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Torque Testing
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Torque testers measure properties such as torsional strength and stiffness and are used in quality control of various fields including medical devices, metals, and aerospace
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Protection Testing Accessories
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Protection testing programs can vary from team to team and company to company.
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Function Test Fixtures
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Modulized UUT BFT Test Fixture, Multilevel BFT Fixture, Over Clamp Test Fixture, Rack Mount Test Fixture, Self Contained Pogopin Test Fixture, Simple Low Cost PCBA Test Fixture, Tight Seal Required RF F/T Fixture, and more from IST Engineering
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Product
Radio Testing RED
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dB Technology has been providing radio testing services for more than 30 years. With so many electronic devices now containing radio devices, it is critical that manufacturers are aware of their regulatory obligations, and our knowledgeable and experienced team is on hand to provide advice and guidance accordingly.
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Membrane Conductivity Testing
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Designed for membrane and separator characterization in a liquid environment. Measure resistance, conductivity, permeability, cross-over, and selectivity.
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Product
Flexible MiniPCI to MiniPCI Express Adapter
SKU-054-0X
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The Flexible MiniPCI to MiniPCI Express Bus Adapter (Adapter) was designed to convert a standard MiniPCI bus into a MiniPCI Express bus. It allows you to connect a MiniPCI Express board (half-size or full-size) to a motherboard that has a standard 124-pin MiniPCI connector.The Adapter includes a MiniPCI Express adapter board (downstream), MiniPCI host board and PCI Express flat cable.
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Automation Testing
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If you want to test all the major features of your application just before release, but you are short of time for complete testing, opt for Automation Testing.
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Product
Memory Test System
T5835
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The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Product
Test Adapter / Extender
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The test adapter is used for measurement and testing of test specimen boards, which gives optimal access of signals, address lines as well as power from backplane assembly.
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Materials Testing
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Materials testing is a diligent approach to ensuring that your infrastructure and vital equipment will provide continued production, undergo minimal degradation and are designed with optimal performance in mind. Materials testing can also supply a wealth of information about the materials you are developing or incorporating into products to ensure they perform within expected specifications.
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Product
3 Channel Sync/Async Serial Interface PCI Mini Card
TMPE863
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The TMPE863 is a standard full PCI Express Mini Card, providing three high speed serial data communication channels.
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Product
Custom Test Fixtures
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For popular high speed components like semiconductor packages, and test contactors, we have developed a custom test fixture which allows the use of high bandwidth microprobes to measure virtually any I/O pin, according to GigaTest's methodology and requirements.
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Product
Test Finger Probe
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Shenzhen Bonad Instrument Co., Ltd.
BONAD’s test fingers, test probes and test needles comply with IEC 60065, IEC 60238, IEC 60335, IEC 60529 and IEC 61032 standards and are essential instruments for the protection against electric shock of household and similar electrical appliances. For more information, please contact us and BONAD will provide you with professional technical advice and high-quality testing equipment.
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Impact Testing
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Educated Design & Development, Inc.
1250 g body includes release mechanism and striking element guide.250 g striking element comes with cocking knob and hammer head, polyamide face, is hemispherical with a radius of 10 mm, has a hardness of HR85-100.60 g release cone with a 10N release force.Single Impact Force models range from a 0.2 J Hammer to a 2.0 J Hammer.Custom padded carrying case included.
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Product
8-Slot 64-Bit 6U Compact PCI Backplanes
cBP-6418U
Backplane
- 1 Segment: 1 system + 7 peripheral slots- cPCI BUS: up to 64-bit/66MHz- Power connectors: ATX connector x 1 DC Screw terminals
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Product
Test Sphere Probe
CX-500
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Sphere Probe This sphere is intended to verify the degree of protection of enclosures for an IP2 Code per IEC 529. Sphere is hardened steel with chrome finish. TOP
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Custom Test Systems
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Circuit Check has extensive expertise in the design, development, and deployment of custom test systems. Each of the Circuit Check solutions are formulated with modularity in mind. Our broad-based knowledge of testing principles, automation and wide customer base allow us to deploy solutions for even the most challenging application.
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Product
Test Probes and Pins
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Spring Loaded Test Probes for Circuit Board Testing, "Pogo Pins" Test Electronics sources and stockes a large variety of Test Probes and Spring Loaded Test Pins. Let our applications engineers help you find the correct pin for your test fixture application.
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Product
PCI Precision Resistor Card 18-Channel, 1Ω To 239Ω
50-297-013
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Test Probes
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Our innovative Test Probes are the upgrade version of Auto Multi Meter. It can perform multiple circuit system test such as power supply feed, voltage and resistance measurement, continuity test, ground test, polarity check and components activation.
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Product
PCI 32xSPST Shielded Reed Relay Card
50-125-021
Reed Relay
The 50-110/115 range of PCI shielded switching cards are available in both Changeover (SPDT) and Normally Open (SPST & DPST) configurations. Connections are made via a front panel 200 pin female connector.
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Product
PCI Very High Density Multiplexer, 24-Channel, 4-Pole
50-670C-021-24/4
Multiplexer Module
The 50-670C-021-24/4 is a 24-channel, 4-pole MUX and is part of a series of very high density multiplexer cards feature a wide range of switching configurations. Typical applications include signal routing in ATE and data acquisition systems.The 50-670C shares exactly the same architecture as the established 40-670 range of PXI modules.
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Product
Parametric Test Solutions
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Reduce your cost-of-test up to 20% with our ultra-fast CPU Overcome your process test challenges Boost measurement throughput and lower costs with our synchronous/asynchronous parallel test capability Better low-level measurement performance Create customized waveforms Reduce transition costs
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Product
Testing LTE, And VoLTE
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Long Term Evolution (LTE) is the so called 4th Generation (4G) mobile standard in the rapidly evolving mobile technologies. Its distinguishing feature is an all IP infrastructure and significantly greater air interface bandwidth to the mobile handset. It was developed as an enhancement to the existing 3G UMTS System (Universal Mobile Telecommunications System) to provide users enhanced mobile radio and internet access.
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Product
PCI 2 Amp Multiplexer, Quad 8-Channel, 2-Pole
50-635A-009
Multiplexer Module
The 50-635A-009 is a quad 8-channel, 2-pole MUX and is part of a range of PCI Multiplexer cards available in 9 standard density and 9 half density configurations, all using high quality electro-mechanical signal relays allowing each channel to switch current up to 2A and voltage up to 300VDC/250VAC.
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16 bit, 125 MS/s PCI Digitizer
ATS660
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ATS660 has been designed from the ground up for OEM applications, which require very high reliability, high performance, high quality and reasonable prices. ATS660 uses COTS analog components and FPGAs to provide you more features and benefits and at the same time reduced manufacturing costs without compromising quality. The result is that you get more digitizer for less money.
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High-Temperature Test Systems
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HT-PEM (high-temperature polymer electrolyte membrane) technology represents a further development of PEM fuel cell technology. Unlike conventional PEM fuel cells, which operate at lower temperatures, HT-PEM fuel cells can reach temperatures of up to 200 °C.
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PCI Precision Resistor Card 4-Channel, 2Ω To 102kΩ
50-297-134
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
