UUT
assures a constituent's interoperability in a system.
See Also: Unit Under Test, DUT, System Under Test
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Product
JTAG Boundary-Scan Toolkit Software & Hardware Bundle
JTAG Starter Kit
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The Corelis JTAG Starter Kit includes the ScanExpress Debugger software application with a USB 2.0 JTAG controller. Engineers and technicians alike can use the system for a variety of tasks. The JTAG Starter Kit has an arsenal of features to control and observe system signals of a boundary scan compatible UUT.
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Product
USB JTAG controller
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The small, lightweight design means the XJLink2 can easily be moved to the Unit Under Test (UUT). Advanced features, like their programmable JTAG signal pin position, switchable power supply and auto signal skew, make it easy to connect to a wide range of circuit boards. Simple to install and use due to the USB plug-and-play ability.
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Product
PXI/PXIe Microwave Multiplexer, Single SP4T, 6 GHz, 50 Ω, SMA, Failsafe
42-784B-101
Multiplexer Module
The single slot remote multiplexer versions occupy less PXI panel space and allow the microwave relays to be placed closer to the UUT and other RF test equipment. In some applications it can shorten the length of RF cable runs and improve system performance. The remote multiplexers are supplied complete with a 1.5 m interface cable.
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Product
SWB-2833, 4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781420-33
Relay Matrix Module
4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2833 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Test Program Execution for High-Volume Production Systems
ScanExpress Runner Gang
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Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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Product
Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 335 x 250 mm (wxd)
CMCSK-02-01
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
Combination Board Tester
ATE QT2256-640 PXI
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Qmax Test Technologies Pvt. Ltd.
Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.
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Product
Linear Testfixture (Cassette Not Included), UTT 306 x 248 mm
MG-02
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FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for changeable cassette
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Product
JTAG USB Controller
NetUSB-1149.1/E
Controller
The NetUSB-1149.1/E (4 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/E controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz.The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.
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Product
SWB-2810, 4x43, 1 A, Row Access, Reed Relay Matrix Module for SwitchBlock
781420-10
Reed Relay
4x43, 1 A, Row Access, Reed Matrix Module for SwitchBlock - The SWB‑2810 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
SWB-2810, 4x43, 1 A, No Row Access, Reed Relay Matrix Module for SwitchBlock
781421-10
Reed Relay
4x43, 1 A, No Row Access, Reed Matrix Module for SwitchBlock - The SWB‑2810 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
In-Circuit Tester Integration
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The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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Product
Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 580 x 400 mm (wxd)
CMCSK-04-01
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
RF Shielded Fixture
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A semi-automatic, pneumatically operated fixture with a sliding pressure top provides a very short mechanical cycle-time. The unit is prepared for full, multi-station automatic operation using a centrally placed robot arm for UUT load/unload.
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Product
SWB-2815, 4x86, 0.3 A, Row Access, Reed Relay Matrix Module for SwitchBlock
781420-15
Reed Relay
4x86, 0.3 A, Row Access, Reed Matrix Module for SwitchBlock - The SWB‑2815 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
PCI Express Gen 3 Test Backplane
SKU-015-01-PCIe
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PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.
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Product
Combination Board Tester
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Qmax Test Technologies Pvt. Ltd.
Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities and conventional PCBs. An In –Circuit device test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed and on board clock disable HW feature are the all time favorite . The in-built high frequency 14bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices with high degree of accuracy.
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Product
PXI 34x4 Signal Insertion and Monitor Matrix
40-525A-001
Matrix Switch Module
This is a PXI signal insertion and monitor matrix with switched pass thru connections on both X and Y axis. It is also availablein a 16x4 format and can be used for signal insertion and monitoring purposes on connections between the UUT and test system. Each pass thru connection from LX to X can be open or closed to allow the programmatic disconnection of the signal to check the response of the UUT. The matrix can be used to connect test equipment, such as a DMM or scope, to monitor the pass thru signals via Y connections while the LY connections can be used to insert a fault condition or insert external signals. When external signals are injected the LX connections can be opened and the LY connections closed.
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Product
POWER INTERFACE BOX
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The POWER Box is in charge to provide power supply lines towards the UUT simulating the power distribution unit. The box has been designed to host, in any mixed configuration, two kind of plug in modules:
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Product
Linear Testfixture (Cassette Not Included), UTT 586 x 248 mm
MG-03
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FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 586 x 248 mm (wxd• Outer dimensions: 750 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for changeable cassette
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Product
M/MA Module Carrier
VX405C
Carrier Board
The VX405C carrier provides the mechanical and electrical interfaces between the VXIbus and up to six (6) VITA 12-1996 standard M/MA-Modules. The carrier provides VXI register configuration and access to the M/MA-Module I/O space and memory (if present). Each M/MA-Module is controlled separately and appears as a different logical address in the VXI environment. Over 100 M/MA-Modules are available that can provide custom interfacing to the unit under test (UUT). Up to six (6) unique interfaces may be provided in a single VXI slot.
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Product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
LED Power Driver ATS
8491
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1. DC Electronic Load : Chroma 6310A/6330A Series2. Transducer Unit/Module*1 : Chroma A849101/A849102, A849103, A8491043. Time/Noise Analyzer : Chroma 80611 & 80611N card4. Sytem Controller*2 : Industrial PC5. DC Source: Chroma 62000P Series6. Digital Power Meter : Chroma 66200 Series7. OVP/Short Circuit Tester : Chroma 806128. ON/OFF Controller : Chroma 80613*1 : A849101 transfers UUT output signal to voltage signal, and measure by 84911 LED power driver measurement card (200kHz). The optional 80611N Noise card is required for 20MHz ripplecurrent measurement.*2 : The controller includes both 84911 LED Power Driver measurement card and 84903 control card.- 84911: Measure rms current, dimming current/frequency/duty, timing, power & ripple current (200kHz)- 84903 : Provide BL control signal(DC level, PWM, SM bus), and enable ON/OFF signal.C Source : Chroma 6500/61500/61600 Series
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Product
Power Switches
SMX-2002 (Power)
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The SMX-2002 is the only switch module in its class with the ability to switch up to 16A. Some applications include: AC line power switching, switching of DC or AC power supplies, control or driving relays for industrial machines (robotics, numerical control machines), automotive engine control, and solenoid switching. Since this module typically switches power to the UUT or interface, the SMX-2002 includes failsafe pins on the front panel which can be configured to open all relays when a failsafe signal is activated. This approach can instantly removes all power to the UUT or interface.
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Product
Display Color Analyzer
Model 7123
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Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station
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Product
SWB-2812, 16x9, 1 A, Reed Matrix Module for SwitchBlock
781421-12
Matrix Switch Module
16x9, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2812 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
High Performance 50 MHz Dynamic Digital I/O PXI Subsystem
GX5960 Series
Digital I/O
The GX5960 digital subsystem represents the highest level of performance available for PXI-based digital instrumentation and features high performance pin electronics and a timing generator / sequencer in a compact, 6U PXI form factor. The GX5960 series consists of the GX5961 clock generator board with 16 driver / sensor channels and the GX5964 driver / sensor board which supports 32 bi-directional I/O channels. Up to 528 digital I/O channels can be supported by the GX5960 digital subsystem. Each digital channel features a wide drive / sense voltage range of -14 V to +26 V (maximum swing of 24 volts) which can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and a load value (with commutation voltage level) – offering the user complete flexibility when creating test programs and fixtures for multiple UUTs. In addition, each channel offers a parametric measurement unit (PMU) for DC measurements.
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Product
Single Bus 64-Channel 2A PCI Fault Insertion Switch
50-190-101
Fault Insertion Unit
This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
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Product
Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 500 units, Max UUT 197 x 114 mm (wxd)
CMK-05
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
