ATE
ATE systems are used to test semiconductor devices, printed circuit boards, and electronic systems during manufacturing. AI prompted RL created', prevails upon the UUT to demonstrate It's fulfillment of test requirements.
See Also: Automatic Test Equipment, ATS, Functional ATE, Combinational ATE, Semiconductor Test, PXI Switching, PXI Chassis, PXI Matrix, Automated Test Equipment, Automated Test Systems
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ATE Test & Engineering Services
We can provide a limited scope project or a full turn key solution where we analyze a data sheet and provide a full test plan. Our wide range of ATE test equipment and experienced team can support first silicon debug to release to high volume production for a wide range of products, from Digital to RF, including wafer sort and packaged part testing. Test platforms include Verigy, Teradyne, Advantest.
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RF/Microwave ATE Systems
Over two decades ago, In-Phase Technologies founded our company for the purpose of designing and producing reliable high quality RF and microwave Automated Test Equipment (ATE). We continue that tradition today, providing the best, world-class automated test equipment. Our system designs bring together the right combination of Commercial Off the Shelf (COTS) test equipment, custom designed and built Interface Test Adapters (ITAs), lightning fast and accurate measurement software, and the optimum user interface to make all of this technology easy to use.
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ATE Design & Build
PXI has become the de-facto standard for housing the high performance modular instrumentation required to meet the demands of testing today's high performance products. Based on the PCI bus, PXI (PCI Extensions for Instrumentation), this platform is used in most of our new ATE designs.
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Satellite ATE
MS 1123
Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
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Semiconductor ATE Systems
Our testers allow for the high-volume production of electronics that touch people’s lives in communication, safety, entertainment, and much more.
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Solar ATE
MS 1534
The Inverterless ATE is an automatic test equipment which is used to test the all functional and various test conditions of Inverterless Solar Unit. This ATE shall be a GO/NOGO Tester for Inverterless Solar Unit. All production units can be tested with this ATE for functional testing and clearance. This ATE reduces the man effort for quality checks and detects the failure units. The Inverterless ATE can check the UUT with minimum user interactions. It shall test and generate test report in PDF format for the conducted tests with necessary data. The ATE operates on 230V AC power. The ATE has In-Built AC-DC converter which provides 12V DC for operate the unit. Also it has additional AC-DC converter to simulate solar power to the Inverterless units. The main objective of the ATE is to test the Inverterless S in all possible test scenarios without external test equipments and less user interactions.
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ATE & Test Systems
Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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ATE For ADC Module
MS 1527
The Semi-ATE is used for testing the analog ADC. It shall carry out the functional test on ADC analog module. The ATE shall have all necessary IO signals on the connector end. The semi-ATE can carry out the functional tests on ADC analog module with host PC or laptop. It provides +15V, -15V, +5V & -5V to module and +2.5V high precision reference voltage. It can able to control keysight N6700B Power supply mainframe using RS422 interface.
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Automatic Test Equipment (ATE) Automatic Electrical Measurement Platform
i7000 Series
Automatic Test Equipment (ATE) Automatic Electrical Measurement Platform by ADSYS
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Quickly Upgrade RF ATE Testers
MP5800 / MP5806
*MP5800 Quickly Provides 3380 / 3650 RF ATE Test Capabilities*MP5800 and 3380/3650 hardware and software are fully integrated*Provide complete and user-friendly RF / Digital debug tools*Provide a complete solution for IOT applications*Provide API for production automation software*Integrate Zimmer 3380/3650 to provide RF/Digital comprehensive ATE test solution
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ATE Computer
MS 1201
This system used for multi-purpose applications such as data acquisition and Automatic Test Equipment. ATE Computer has ISA Bus based eleven slots with inbuilt power supply. Micro Processor board or USB Controller is used to drive the back plane.
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RF ATE
IFF-7300S Series IFF/Crypto/TACAN Automated Test System. IRIS 2000/IRS 1200 ATE Software Revision Service. RF Expansion Module (RFEM).
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ATE Core Configurations
ATE Core Configurations streamline the design, procurement, and deployment of automated test systems with highly integrated mechanical, power, and safety system infrastructure. These off-the-shelf systems reduce lead times and simplify standardization and global deployment. Lower your total cost of ownership for your test systems with ATE Core Configurations.
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6000 Series ATE（AC Source）
Voltage output has totally six ranges，maximum up to 500V，convenient for 300V above the voltage regulation test
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Obsolescence Solutions for Legacy ATE
Our obsolescence solutions, products, and services are used by the DOD and all major Mil/Aero companies to extend the life of their legacy ATE.
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ATE System Integration
Cyth Systems is a Systems Integration Company specializing in Automated Test (ATE), Embedded Controls, and Machine Vision. Our skilled and experienced team uses their natural talent for problem-solving to create solutions in a wide range of industries. We build our solutions starting with the National Instruments (NI) platforms including LabVIEW and PXI, and by adding best-in class sensors and components.
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ATE
QT 200 NXG
Qmax Test Technologies Pvt. Ltd.
QT 200 Nxg a Highly sophisticated ATE, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software.
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RWR ATE MKII
MS 1111
Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
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Aerospace & Defense ATE Systems and Services
TE solution design, development, and integrationMeasurement / Test Process analysis and consultationEasy-to-use software interfaces for Engineers and UsersFactory automation for test processesAll major instrument brands available & supported
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ATE System Power Supplies
For more than 50 years, Keysight's automated test equipment (ATE) power supplies have changed the way engineers prove their designs, understand issues, and ensure product quality. Our programmable ATE system power supplies' compact design makes it easy to integrate them into any system. Keysight power supplies make it easy to update a test program with modern interfaces, LXI-core capability, and SCPI language. Accelerate test time with fast command processing and quick settling times.
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Turn-key ATE Interface Boards
We offer services for modeling and simulation and complement that work with measurement and validation of those models, at your desired frequency and your required fidelity specifications. Our design and programming expertise includes: Teradyne Catalyst through Integra FLEX; Advantest 3340 through T2000; Verigy 82000 through 93000. turn-key solution for ATE interface boards, we understand the limits of the interconnect technology (laminate, conductors and via’s, connectors and sockets) and use that understanding to guide our principles of design.
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ATE Integration
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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Benchtop with Drop-In Test System
600 Series Compact ATE Platform
The Circuit Check 600 Series Compact ATE Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 600 Series Compact ATE, test procedures can become automatic, with test steps and go/no-go limits easily programmable. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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PXI Very High Density Multiplexer, 99-Channel, 2-pole
40-670C-022-99/2
The 40-670C-022-99/2 is a 99-channel, 2-pole MUX and is part of a series of very high density multiplexer modules featuring a wide range of switching configurations. Typical applications include signal routing in ATE and data acquisition systems. The 40-670 multiplexer may be operated as a conventional multiplexer with break-before-make action when a new channel is selected. In addition multiple channels may be simultaneously selected (not available in 1 pole mode).
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LXI High Density Dual 24x64 2A Matrix
60-552-010
A high-density single pole LXI matrix module capable of switching up to 300VDC/250VAC, 2A (60W max). The use of high-quality electro-mechanical relays offers high switching confidence for signal routing in large ATE systems.
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PXI Very High Density Multiplexer, 10-Channel, 16-Pole
40-675A-002-10/16
The 40-675A-002-10/16 is a 10-channel, 16-pole MUX and is part of our range of PXI very high density low cost multiplexer modules. These modules are suitable for signal routing in high channel count ATE and data acquisition systems. The modules use high quality electromechanical signal relays allowing each channel to switch current up to 1A at 150VDC/100VAC. Connections are made via a front panel 200-pin connector.
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LXI High Density Dual 32x64 2A Matrix
60-552-011
A high-density single pole LXI matrix module capable of switching up to 300VDC/250VAC, 2A (60W max). The use of high-quality electro-mechanical relays offers high switching confidence for signal routing in large ATE systems.
