Automated X-ray Inspection
See Also: AXI
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Fracture Testing Machines: Automation
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The digital sensors are used for the purpose of tests automation. The sensors measure the applied force value and the changes in linear dimensions of the specimen.
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Magnetic Particle Inspection(MPI)
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Magnetic particle inspection is an inspection method used to identify defects on the surface of ferromagnetic materials by running a magnetic current through it.
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Thickness and Flaw Inspection
OmniScan SX
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Olympus is proud to introduce the OmniScan® SX, a flaw detector that benefits from more than 20 years of phased array experience and shares the OmniScan DNA. For improved ease of use, the OmniScan SX features a new streamlined software interface displayed on an 8.4 in. (21.3 cm) touch screen. A single-group and non-modular instrument, the OmniScan SX is easy to operate and cost-effective for less demanding applications.
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Test Automation Software
INERTIA
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INERTIA™ is a highly configurable automation software for real-time control, data acquisition, and test applications that enables test, manufacturing, and R&D engineers and scientists to quickly and easily develop, configure, and operate test cell systems using a configuration-based software application. INERTIA is ideal for creating, upgrading, and modernizing real-time control and data acquisition systems.
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Automated Pick And Collection Tool Of Cell Colonies
CELL PICKER
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Pickup and Remove Cell Colonies with Complete Freedom
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Dual Illumination Inspection Scope
0700-7950
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KITCO Fiber Optics introduces our new 200X dual illumination inspection scope.
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Programmable Controllers for Advanced Machines & Automation Projects
Vision Series
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An award-winning series of programmable controllers (PLC + HMI) , ranging from palm-sized controllers with onboard I/O to large-screen controllers with snap-in I/O. Vision is a true workhorse: reliable, versatile, field-hardened – a cost-effective All-in-One controller.
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Semiconductor Wafer Defect Inspection Management Software
ProcessGuard
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Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.
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Mixed Signal Automated Tester
MSAT
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Whether you are testing radar systems for the Department of Defense (DoD), or the next actuator circuit card for aircraft landing systems, ARC’s Mixed Signal Automated Tester (MSAT) offers flexible automated testing capabilities for nearly every budget.
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Vision Inspection System
Vision Station
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Design and manufacture vision inspection system for SOT, SOD, TO, DPAK, SOIC, TSOP, SSOP, QFN/MLP, ODFN and LED inspection.
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X-ray Fluorescence, XRF Analysis Services
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Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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Automated Filter Tester
8127
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The Automated Filter Tester 8127 is designed to comply with commercial respirator standards around the globe and has a proven track record of durability, reliability, and minimal maintenance, meeting the demanding requirements of manufacturing and quality control environments. Whether you are looking for a stand-alone tester to check a few filters per day or need to integrate your tester in an automated, high volume production line, CERTITEST AFT’s are up to the challenge
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Inspection Systems
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Video Inspection Systems with?or without measurement capabilities are an excellent way to evaluate and test small items or items in?difficult to access locations. Many options are available in addition to the measurement capability. Video Inspection is used for a variety of purposes including the ability to see? and measure items that are much smaller than the eye can see or that hand tools can measure. Video systems can also reduce the eye and/or back strain associated with production environments where an operator must look in a microscope all day.
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Wafer Sorter and Inspection
SolarWIS Platform
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Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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X-ray Diffraction (XRD) Instruments
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X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
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Automated Data Collection
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Three-phase multifunctional static electricity meters AMT B0x-FxxTIIx are determined for measurement of active and reactive electric energy, instantaneous active power for consumption and supply, maximum demand, voltage, current and power factor in threephase four wires networks in diredct or indirect connection.
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Automated Discrete Semiconductor Tester (ATE)
5300HX
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The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
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Concrete Inspection System
StructureScan Pro
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Geophysical Survey Systems, Inc.
StructureScan Pro is a versatile concrete inspection system offering a wide variety of antenna options for concrete and other applications. Based on the SIR 4000 controller, the StructureScan Pro provides the GPR professional with solutions to any scanning situation.
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Test Automation Platform
Perfecto
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Perfecto is a proven, enterprise test automation platform for powering 5-star mobile applications. Speed testing velocity by adding Android emulators and iOS simulators to your mobile testing strategy.
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Automated Granular Material Analyzer
VideometerLab XY
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VideometerLabXY is designed for fast and accurate measurements where a large sample size is needed. The unit is an automated system integrating illumination,camera, and computer technology with advanced digital image analyses and statistics.
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Soldering Inspection Video Microscope
MS-1000
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The MS-1000 is a highly portable microscope for exclusive use with BGA, CSP, and QFP. It is highly efficient in inspecting portions which cannot be inspected by the X-ray inspection method.Specifically, it is efficient for inspecting the following conditions: fillets of soldered balls, melted condition of soldered parts, cracks, defective soldering, etc.
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Video Inspection Scope
BK3000
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• Integrated 8.5 mm high-res imager allows for ease of use and ensures the product is always ready to go. Imager is resistant to dust, dirt, and water ingress for 30 minutes at depths of up to 3 meters.
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Cabinet X-ray System
XPERT 80- L
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Kubtec's XPERT 80-L, for large area imaging, is a multi-purpose cabinet x-ray system bringing high quality medical-grade imaging and ease of use to applications in scientific research, pathology and industry. A small focal spot with an x-ray source of up to 130 kV offers brighter images with higher contrast for visibility of the smallest details and most subtle variations in density. Optional sources are available for micro-focus and soft x-ray applications.
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Automated Measurement System
EVG®40NT
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The EVG40 NT (stand-alone tool) and the AVM (HVM-integrated module) enable measurement of lithography relevant parameters like critical dimension, as well as bond alignment accuracy.Because of the high-measurement accuracy, it is possible to verify compliance to tight process specifications and instantly optimize integrated process parameters.
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Automation Testing
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At Updoer Technology, we strive to provide a streamlined experience. We follow the test-driven approach to maintain your app's quality, and you get bug-free software and quality at its best! As a valued client, we want to ensure that you're getting what you paid for; Your satisfaction comes first at Updoer Technology because we value relationships over everything else.
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SATA 3 Receiver Test Automation Software
N5991ST3A
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The N5991ST3A is the latest receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize SATA devices and hosts.
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Complete Non-Contact Inspection System For OLED/TFT/LTPS
GX3/GX7
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*Fastest*Workable to large panel as well as fine pattern of medium-small panel*Workable to large mother glass of every generation*Possible to dock width Repair Machine
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Inspection + Cleaning for High Volume Manufacturing Environments
AVIT-2020
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AVIT-2020 is a fully automated system that removes human subjectivity from the entire inspect-clean cycle. With integrated cleaning and fast, robotic mechanics, operators simply press the process button, allowing them to complete a week’s worth of inspections in just a couple of hours with almost zero active operation.
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Inspects MEMS and Wafer Level Devices
NorCom 2020-WL
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The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.
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Automated Production Testing
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MegiQ provides an Application Programming Interface (API) for controlling the VNA application and measurements.This API is used for developing custom automated measurements in a factory.
