Automated X-ray Inspection
See Also: AXI
-
Product
Thickness and Flaw Inspection
OmniScan SX
-
Olympus is proud to introduce the OmniScan® SX, a flaw detector that benefits from more than 20 years of phased array experience and shares the OmniScan DNA. For improved ease of use, the OmniScan SX features a new streamlined software interface displayed on an 8.4 in. (21.3 cm) touch screen. A single-group and non-modular instrument, the OmniScan SX is easy to operate and cost-effective for less demanding applications.
-
Product
High Energy Industrial CT X-Ray Inspection System
MeVX Series
-
The most advanced industrial DR & CT systems in the world are now available with Linear Accelerators. Offered with energies up to 9MeV, the MeVX series of systems provide the same ease of use as our low energy systems in a high energy format. Utilizing our current efX software platform along with the superior service, support & training that we are known for puts these systems in a class of their own.
-
Product
End Face Inspection
-
Cleave quality inspection. High precision interferometers for checking the end face quality of cleaved optical fibers and for cleave process optimization. Crisp and clear fringe patterns and software with advanced measurement functionality. Ideal for use in production settings and when working with difficult to cleave fibers in laboratory environments. Fiber holder adaptors available for use with cleavers and splicers from the major splicer manufacturers. This facilitates easy transfer of the fiber from cleaver to interferometer and then onto the splicer with no need for reclamping.
-
Product
Xray Food Inspection
-
FlexXray has developed leading, certified technology and processes to use advanced x-ray technology to inspect products specifically for food companies. Although they look like a TSA line at the airport, our systems are highly customized machines and processes built specifically to find contaminants like metal, glass, wood, stone, plastic, and rubber in food products of all types. What we do is find needles in haystacks – but the needles we find are even smaller than needles in a haystack. In fact, FlexXray can find contaminants down to 0.8mm or smaller.
-
Product
X-Ray Systems
-
X-ray and radioactive devices developed by AET, are widely utilized for medical, industrial and research use. The Compact Pulse X-ray Source can accelerate electron beams in a high-gradient electric field, to produce X-rays. Dose Calibrators are utilized for radioactive examinations and treatments in the medical industry.
-
Product
Automated Unit Testing
Topaz for Total Test
-
Compuware Topaz for Total Test transforms mainframe application development by automatically creating tests for logical units of code. Developers at all skill levels can thus quickly and easily perform unit testing on COBOL code just as they do in Java, PHP and other popular programming languages. In fact, Topaz is more advanced than typical Java tools, because it requires no coding and automatically generates default unit test result assertions for developers. The introduction of Topaz for Total Test follows two years of unmatched innovation by Compuware across all key aspects of mainframe application agility, integration of the mainframe into the broader context of cross-platform enterprise DevOps, and the ongoing attrition of veteran IT professionals with specialized mainframe knowledge.
-
Product
Automated Test Equipment
-
Automated test solutions from a broad base of proven technologies reduce your cost of test and improve your time to market.
-
Product
Automated System for Visual Quality Control of Markings
Angara 2.0
-
The automated labeling quality control system is designed to identify and reject pharmaceutical labels that have defects in permanent printing (applied in a printing house) and variable printing (applied by an industrial printer as part of a labeling machine).
-
Product
Compact Photon Counting X-Ray Detector
HyPix-3000
-
Rigaku’s HyPix-3000 is a next-generation two-dimensional semiconductor detector designed specifically to meet the needs of the home lab diffractionist. One of the HyPix-3000’s unique features is its large active area of approximately 3000 mm² with a small pixel size of 100 μm², resulting in a detector with high spatial resolution. In addition, the HyPix-3000 is a single photon counting X-ray detector with a high count rate of greater than 10⁶ cps/pixel, a fast readout speed and essentially no noise.
-
Product
PXI Instrumentation Modules For Automated Test Systems
-
PXI-based test systems often require a variety of general-purpose instrumentation such as digital I/O, waveform generators, voltage & current sources and DUT power supplies.
-
Product
Fully Automated Centration Testing of Aspheres
AspheroCheck UP
-
Designed for production environments, the AspheroCheck UP is a measurement system that allows the testing of centration and tilt of aspheric surfaces. It stands out through the complete automation of the measurement process. Proven OptiCentric® measurement technology is integrated for a highly accurate centration testing. The automated positioning of the aspheric sample under test as well as of the non-contact sensor for the off-axis tilt measurement provide the key factors for a fast and precise test result.
-
Product
Non-Destructive Test Resonant Inspection Station
RAM-TEST-FIXTURE
-
The NDT Test Station, Model RAM-TEST-FIXTURE Resonant Inspection System is an ideal choice for testing when repeatable manual inspections are required. The innovative Test Station allows precise control of part positioning with an adjustable table ranging up to 6.25 inches (158.75 mm) in height.
-
Product
Automated Metrology System
EVG®50
-
High-throughput, high-resolution metrology for bonded stacks and single wafers. The EVG 50 (fully automated stand-alone tool) and the Inline Metrology Module (integrated in EVG''s high-volume manufacturing systems) offer highly accurate measurements at high speed, utilizing different measurement methods for a large number of applications. The tool''s application range covers multi-layer thickness measurements for determination of the total thickness variation (TTV) of an intermediate layer, the inspection of bond interfaces as well as resist thickness measurement, and meets the most demanding requirements of the yield-driven semiconductor industry.
-
Product
Printing Quality Inspection Machine
TQM AVI
-
Landrex Technologies Co., Ltd.
Printing Quality Inspection Machine
-
Product
Inspection Instrument for Indicators
i-Checker
-
The i-Checker is specially designed to calibrate measuring accuracy of dial indicators, dial test indicators, and other electronic comparison gage heads with a stroke of up to 100mm (4").±(0.2+L/100)µm indication accuracy. Directly inspects an indicator with a stroke of up to 100mm (4"). The dial test indicator, bore gage and lever-type inductive head can be inspected with optional accessories. Adjustment of the measurement position is very easily accomplished because of semi-automatic measurement and full automatic measurement functions. Creates and prints out the simple inspection certificate. Saves inspection result as CSV file for reusable inspection result by any kind of software.
-
Product
Nano-focus X-ray Inspection System
X-eye NF120
-
Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
-
Product
Software Test Automation Solution
ZAPTEST
-
ZAPTEST is a software test automation solution for testing Mobile; Web; Desktop applications Cross-Platform. ZAPTEST allows testing of any GUI based software on any modern OS, mobile or conventional including iOS; Android; WinMo; Blackberry; Windows; Mac; and Linux, and supports testing of Agile and CI development.
-
Product
Spinstand Automation for Media Testing
V2002
-
The spinstand V2002 with the media-testing automation loads and unloads the cap of the vacuum chuck1 and moves the disk stabilizer shroud on and off media without operator’s intervention. As a result, less time is required for a media replacement, so the same number of disks can be tested faster.
-
Product
AOI/SPI Inspection Systems
-
Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises AOI/SPI Inspection Systems
-
Product
Automated Electrophoresis
-
Exceed your expectations with an automated electrophoresis system from Agilent. With throughput capabilities ranging from ultralow to ultrahigh and multiple kits and reagents to choose from, there is no telling where your research could take you. Learn more about the nine automated electrophoresis instruments Agilent offers as well as the intuitive software and accessories that will take your research to new heights.
-
Product
Automated Liquid Handling System
FlowCam®ALH
-
Yokogawa Fluid Imaging Technologies, Inc.
The FlowCam® ALH - Automated Liquid Handling system from Fluid Imaging Technologies integrates with the FlowCam® 8100 for uninterrupted processing of samples.
-
Product
Automated Bench Test Equipment
-
The Automated Bench Test Equipment (BTE) provides a combination of automatically sequenced and manually selected electrical or electro-mechcanical stimulation to an electronic or electro-mechanical unit under test. The system simulates the normal and threshold operational ranges of each of the inputs and communication channels of the unit under test.
-
Product
Compact Inspection Camera
-
Fits in your pocket or clips on your beltAffordable1 meter drop-proofLong, thin camera-tipped probe with excellent depth of field penetrates tight, hard-to-reach spacesProbe is waterproof, holds its configured shape, and coils inside clamshell case for storageFour camera-lighting LEDs produce bright, crisp video on large color LCDFour screen controlsFour useful probe tip accessories (pickup hook, magnetic pickup, 45 mirror, thread protector)
-
Product
Wafer & Die Inspection
-
SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
-
Product
Thickness and Flaw Inspection
FOCUS PX / PC / SDK
-
Olympus offers a complete advanced phased array integration solution that meets the requirements of your most demanding customers. The solution includes the FOCUS PX, a powerful and scalable acquisition unit; FocusPC, a powerful data acquisition and analysis software program; and three software development kits (SDK), FocusControl, FocusData, and OpenView SDK, to customize your software interface based on your application and control FocusPC for a fully automated inspection solution.
-
Product
Drone Inspection Software
Qii.AI
-
Qii.AI automates the detection and analysis of defects. It is the only enterprise AI platform that combines drone inspection software with an AI labeling tool, AI-assisted computer vision, and machine learning.
-
Product
Vector Network Analyzer Automation Suite
ZNrun
-
For a facility manager the yardstick for optimization could be maximizing the daily production yield, while for a test-engineer it might mean being able to easily define a test setup and have it loaded on each device in the factory in seconds. A tester might be interested in seeing only the result of the measurements, after having started it by scanning a barcode, while quality managers might find it convenient to be able to download real-time yield statistics on their way to the factory. The R&S®ZNrun software suite was designed with optimization in mind and acknowledges these re-quirements by offering each party the possibility to expedite their workflows as much as possible.
-
Product
Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
Test System
High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
-
Product
Automation
ZETLAB Formula
-
ZETLAB Formula is a program used for mathematical operations with signals, signal filtration, and parameters measurements, producing signals with various shapes. ZETLAB Formula is a virtual measuring tool allowing to perform arithmetical and logical operations and filtration of constant data flows received from ADC and DAC modules and virtual channels in real-time mode. In the post-processing mode, it is possible to perform various operations with the files created by means of “Signals recording” program.
-
Product
Test Automation System for Emission Testing
STARS VETS
-
STARS VETS is a Vehicle Emission Test System application available with the STARS Automation platform for chassis, engine and powertrain dynamometers. The application provides test cycle execution, emissions equipment control, results calculation and reporting in compliance with the different legislative standards throughout the global regions. Its flexible design offers a wide range a customization, and it addresses the various requirements for R&D, COP and certification testing.
