Frequency Sources
A stable oscillator used for frequency calibration or reference. (atis.org)
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Product
Millimeter-Wave Noise Source, Q-band, 33 To 50 GHz
Q347B
Noise Source
The Q347B waveguide noise source (33 to 50 GHz frequency range), allows you to make accurate noise figure measurements on millimeter-wave devices...
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Product
120 GHz Frequency Extender
N5295AX01
Frequency Extender
The N5295AX01 modules are compact lightweight modules designed to interface to the N5292A test set controller that is driven with a PNA/PNA-X B model vector network analyzer.
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Product
Four-Port Tunable Laser System Source
N7714A
Laser Source
The Keysight N7711A and N7714A tunable lasers are single-port and four-port sources, available with C-band or L-band wavelength coverage. The narrow linewidth and offset grid fine-tuning capability make them ideal sources for realistic loading of the latest transmission systems. All models can reach any wavelength point within their specified wavelength range just like all other Keysight tunable lasers. In this mode, code compatibility with existing test setups based on Keysight's range of full-size and compact tunable lasers is a great asset. In system loading applications, it may be preferable to grid-tune the lasers like system transmitters, simply by changing the channel index. The channel grid is adjustable to standard ITU-T grid spacing like 50 GHz, and to arbitrary grids. Likewise, the zero frequency (base channel) of the chosen grid is adjustable. A 12 GHz fine-tuning range allows de-tuning the frequency.
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Product
NI-9326, 6-Channel, 150 V, 128 kHz C Series Frequency Input Module
786999-02
Frequency Input Module
6-Channel, 150 V, 128 kHz C Series Frequency Input Module - The NI-9326 is a channel-to-channel isolated frequency input module for CompactDAQ and CompactRIO systems. This module includes six differential input channels with a 0 Vrms to 150 Vrms input range. The NI-9326 also features configurable thresholds for connection to a variety of variable reluctance sensors, single channel encoders, and hall-effect sensors. You can use the included embedded counters to perform frequency measurements or edge-counting for tracking total counts on a periodic signal. Additionally, the NI-9326 supports configurable Butterworth filters to help you perform low-noise frequency measurements.
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Product
120 GHz Frequency Extender
N5295AX51
Frequency Extender
The N5295AX51 modules are compact lightweight modules designed to interface to the N5292A test set controller that is driven with a PNA/PNA-X B model vector network analyzer.
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Product
Standard 0.79 (23.40) - 1.75 (49.60) High Frequency Probe
CSP-40G-021
High Frequency Probe
Your product description goes here.
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Product
Fixed Wavelength CW Laser Source (DFB)
Laser 1200 Series
Laser Source
The Laser 1200 Series is a highly customizable fixed-wavelength Continuous Wave (CW) laser source available in a wide range of wavelengths and powers.With seamless PXI integration, it can be easily integrated into new or existing PXI test setups. Save space, lower your costs and improve testing efficiency while delivering reliable and repeatable results in production or research environments.
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Product
Standard 3.06 (86.70) - 4.00 (113.40) RF Probe For SMA Connectors
CSP-30ES-013
High Frequency Probe
Nominal Impedance (Ohms): 50Current Capacity (Amps) @ 20° C: 1.00Bandwidth @ -1dB (GHz): 35.00Return Loss @ -20dB (GHz): 22.00Test Center (mil): 328Test Center (mm): 8.33Recommended Travel (mil): 100Recommended Travel (mm): 2.54Full Travel (mil): 200Full Travel (mm): 5.08Overall Length (mil): 1,033Overall Length (mm): 26.24Rec. Mounting Hole Size (mil): 297Rec. Mounting Hole Size (mm): 7.54
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Product
Fixed Wavelength CW Laser Source (FP) - PXI
Laser 1100 Series
Laser Source
The Laser-1102 is a Continuous Wave (CW) laser source offering high power 850 nm output into multimode fiber with stable output power operation.
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Product
Standard 3.27 (93.00) - 8.13 (231.00) High Frequency Probe
K-50L-QG
High Frequency Probe
Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 0.80Nominal Impedance (Ohms): 50Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 225Recommended Travel (mm): 5.72Overall Length (mil): 1,830Overall Length (mm): 46.48
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Product
Performance AC Power Source, 1750 VA, 300 V, 13 A
6813C
Power Source Analyzer
Maximize your investment with five instruments in one device Increase your productivity with extensive built-in power measurement capabilities Flexible IO: LAN/LXI Core, USB and GPIB Lower your cost of ownership with global support & the longest standard warranty in the industry
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Product
Standard 6.20 (175.20) - 8.00 (226.80) High Frequency Probe
CSP-40A-015
High Frequency Probe
Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Recommended Travel (mil): 133Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,231Overall Length (mm): 31.28Full Travel Remark: Shield: 275 (6.99) including travel of probes
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Product
Step-Tunable Laser Source, High Power and Low SSE, Basic Line
N7779C
Laser Source
The new N7779C basic line step-tunable laser source is ideal for cost-effective testing of broadband optical devices. It can also serve as a highly stable, tunable local oscillator for receiver testing or transmission experiments.
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Product
RF High Frequency Probes
High Frequency Probe
*Low impedance*High bandwidth up to 20 GHz*Repeatable measurements*Coaxial design*Interchangeable center conductor
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Product
USB Smart Noise Source, 10 MHz to 26.5 GHz, Nominal ENR 15 dB
U1831C
Noise Source
The USB-powered U1831C provides broadband noise figure measurements from 10 MHz – 26.5 GHz with modular signal analyzer and benchtop X-Series signal analyzers.
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Product
120 GHz Frequency Extender
N5295AX03
Frequency Extender
The N5295AX03 modules are compact lightweight modules designed to interface to the N5292A test set controller that is driven with a PNA/PNA-X B model vector network analyzer.
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Product
DFB Laser Source Module
LaserPXIe 1200 Series
Source Measure Unit
The LaserPXIe 1200 Series is a highly customizable DFB laser source available in a wide range of wavelengths and powers.
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Product
NI-9326, 6-Channel, 150 V, 128 kHz C Series Frequency Input Module
786999-01
Frequency Input Module
6-Channel, 150 V, 128 kHz C Series Frequency Input Module - The NI-9326 is a channel-to-channel isolated frequency input module for CompactDAQ and CompactRIO systems. This module includes six differential input channels with a 0 Vrms to 150 Vrms input range. The NI-9326 also features configurable thresholds for connection to a variety of variable reluctance sensors, single channel encoders, and hall-effect sensors. You can use the included embedded counters to perform frequency measurements or edge-counting for tracking total counts on a periodic signal. Additionally, the NI-9326 supports configurable Butterworth filters to help you perform low-noise frequency measurements.
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Product
SNS Series Noise Source 10 MHz to 26.5 GHz (ENR 15 dB)
N4002A
Noise Source
The SNS series N4002A noise source was designed to measure DUT noise figures reliably and accurately up to 30 dB from 10 MHz to 26.5 GHz.
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Product
Fixed Laser Source Module
Laser Source
Keysight offers a broad choice of fixed laser sources, which are available as single-wavelength and dual-wavelength modules as part of the Keysight Lightwave Solution Platform. The Keysight 8165xA Fabry-Perot laser sources can be used in conjunction with optical power meter modules for insertion loss, optical return loss and PDL measurement of broadband components and fiber. The Keysight 81663A Distributed Feedback Laser Sources are best suited for amplifier test and WDM system test applications. Keysight covers PON and common WDM wavelengths with its 81663A Distributed Feedback (DFB) laser source modules. The precise tunability around ITU-grid center wavelength gives you the flexibility to match test setups to the latest requirements of the DWDM-system. The fine-tuning allows to shift the center wavelength from one DWDM transmission channel to the adjacent channel in dense WDM systems. The built-in isolator ensures highest laser stability, even when reflections are present in the optical path.
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Product
PXIe-4141, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit
781743-01
Source Measure Unit
PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4141 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
PXI/PXIe Source Measure Unit Family
PXS(e)840x
Source Measure Unit
The PXS840x PXI SMU family is a high-speed, 4-quadrant source measure unit. Carry out measurements directly on the DUT with the integrated CMU and VMU.
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Product
K-50 Series Probes
High Frequency Probe
The K-50 coaxial probe provides an instrumentation-quality interface for broadband R.F. measurements up to 4 GHz. With the K-50 R. F. circuit design, impedance characterization measurements can be performed using it as a Network Analyzer port-extending accessory. Accurate and repeatable small signal and R.F. power (50 Watts) measurements provide consistent and repeatable results.
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Product
50 µs Pulse Medium Current Source/Measure Unit (MCSMU)
B1514A
Source Measure Unit
The 50 s Pulse Medium Current SMU is an SMU designed for faster pulsed IV measurement. It enables a pulsed measurement down to 50 s pulse width, a 10 times or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers a wider range and versatility, up to 30 V / 1A, with voltage/current programmability. It is useful to characterize high to medium power devices on the new materials such as SiC and GaN, and organic devices, and the MCSMU expands your choices of pulsed IV measurement.
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Product
110 GHz Frequency Extender
N5293AX01
Frequency Extender
The N5293AX01 modules are compact lightweight modules designed to interface to the N5292A test set controller that is driven with a PNA/PNA-X B model vector network analyzer.
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Product
Noise Source, 1 GHz up to 40 GHz
346CK40
Noise Source
The Keysight 346CK40 is the ideal companion to Keysight´s noise figure solutions when working on high frequency applications. Since it is broadband (1 GHz to 40 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source greatly reduces measurement uncertainty, which are commonly reflections of the test signals. This is a coaxial noise source with a 2.4 mm coaxial connector. ENR typically 14 dB at 1 GHz, decreasing to 5 dB at 40 GHz (typical).
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Product
PXI Isolated Single Channel Voltage/Current Source, 100V
M9186A
Source Measure Unit
The V/I source lets you source a voltage and measure the resultant current, or source a current and measure the resultant voltage. It consist of two separate amplifiers, denoted "low" and "high" that share a common output connection. The "low" amplifier provides voltages in the range of 16 volts at up to 200ma and the "high" amplifier provides voltages in the range of 100V at up to 20mA.
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Product
Standard 3.27 (93.00) - 8.13 (231.00) High Frequency Probe
K-50L
High Frequency Probe
Current Rating (Amps): 5Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 1.90Nominal Impedance (Ohms): 50Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 225Recommended Travel (mm): 5.72Overall Length (mil): 1,830Overall Length (mm): 46.48
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Product
Standard 1.90 (53.90) - 8.00 (226.80) High Frequency Probe
CSP-40B-012
High Frequency Probe
Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Full Travel Remark: Shield: 275 (6.99) including travel of probesRecommended Travel (mil): 133Recommended Travel (mm): 3.38Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,151Overall Length (mm): 29.24
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Product
Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe
K-50B-QG-75R
High Frequency Probe
Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,637Overall Length (mm): 41.58
