-
Product
High Parallel Test Handlers
-
High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test.
-
Product
Test Handlers
-
Boston Semi Equipment test handlers are designed for optimum production performance on your test floor.
-
Product
Gravity Test Handlers
-
Microtec offers a wide variation of customizable gravity handlers. The focus of our systems is based on the approach to provide 1 system for many different applications. By pursuing continuous improvements and setting the objective to provide our customers the most convincing test handlers, we are always driven to push our products and its features to the limits and exceed traditional boundaries.
-
Product
IC Pick & Place Handlers
-
Chroma's IC test and handler solutions assure that IC packaging meets the original design specifications and verify the performance of the IC before it is assembled into the electronic product.
-
Product
Gravity Test Handlers
-
Extremely small to very large packages, very wide temperature range, high throughput octal site and quad site testing.
-
Product
Turret Test And Scan Handlers
-
Turret platforms for semiconductor test, inspection and packaging.
-
Product
Observational Systems: Data Handlers And Battery Packs
-
Data loggers allow users to connect a variety of sensors to a single controller that manages, stores, and sends the collected data as a single data stream.
-
Product
TestStation Automated Inline Handler | In-Circuit Test Solution
-
Teradyne’s High-Speed Inline Automated Board Handler with TestStation Multi-Site Test Insert is designed for productivity, fast change-over, and low operating cost. Our in-circuit test solution fits seamlessly into automated production lines to provide “hands-off-lights-out” operation.
-
Product
100Hz-50kHz LCR Meter –
11021/11021-L
-
Chroma Systems Solutions, Inc.
The Chroma 11021/11021-L are the most cost-effective digital LCR Meters available, providing 100Hz, 120Hz, 1kHz, and 10kHz test frequencies for the 11021 and 1kHz, 10kHz, 40kHz, 50kHz test frequencies for the 11021-L. The standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities enable the Chroma 11021/11021-L for use in both component evaluation on the production line and fundamental impedance testing for bench-top applications.
-
Product
MEMS Handler
4664-IH
-
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
-
Product
Universal Off-Line Handler
OLS Series
-
Developed as an economical and versatile solution, it adapts to any offline test application - ICT (In Circuit Test), ISP (Flashing) or FCT (functional). The design of this solution allows the quick and ergonomic change of fixtures , with a change time of less than 3 minutes.
-
Product
6TL36 Plus In-line Test Handler w/Bypass
EA923
-
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
-
Product
Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
System
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
-
Product
High Speed Pick and Place Handler
Commander 2000
-
At throughput rates in excess of 2000 Units per Hour the HT Commander 2000 system provides unparalleled performance for the production handling and programming of flash memory devices or modules.
-
Product
C Meter
DU-6210
-
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 10 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
-
Product
Digital Low Resistance Tester
TH2512
-
Shenzhen Chuangxin Instruments Co., Ltd.
The TH2512 series digital dc low resistance tester i s an intelligent, wide range, high-precision tester which suitable for transformer, inductor copper resistance, relay contact resistance, switches, connectors, wire resistance, contact resistance component solder contact resistance, PCB line, welding hole resistance and metal detection, etc. It’s applied to the production line and can use HANDLER interface and GPIB interface (option) output good/bad signal, in order to improve production line automation testing capability.
-
Product
Tube-To-Tube Gravity Handler
Rasco SO1000
-
The SO1000 test handler’s mature design and high reliability it provides excellent cost of test. Highly flexible as a result of a broad range of device kits can be combined with various Sensor and MEMS applications.Featuring a fast plunger with up to four plunger heads for high speed and high throughput with index time down to 500 ms. Available in single, dual, and quad configurations.
-
Product
Test Handler
HA1200
-
The new HA1200 handler can be linked with a tester to utilize our unique active thermal control technology for testing singulated and/or partially assembled dies. This technology enables testing of powerful high-end SoCs with 100% test coverage. This helps reduce yield loss at final test, thus reducing losses of final multi-die assembled products.
-
Product
ATOM Handler
-
The ATOM-IC Handler is a benchtop handler designed for use on engineering test floors and in development operations. Its innovative design allows for maximum flexibility and minimum cost and maintenance.
-
Product
Super Fast Industrial Gang Programmer
448Pro2AP
-
The Dataman 448Pro2AP is a super fast industrial gang programmer with four independent modules, ISP capabilities and USB 2.0 connectivity• Optimised for use in automated handlers and ATE machines • Over 71,000 devices supported with new devices added monthly • Mechanically stable case design with multiple fixing points • Independent modules supporting concurrent programming • ISP capable using the JTAG interface • Easy to use software compatible with the latest operating systems including Windows 10 • Comprehensive 3 years parts and labor warranty • Free life-time software updates
-
Product
Thunderbolt Interface
NLINE-T1553
USB Interface
Supports Full Real-Time Control the Same as a PCI Express Card in a Server! Much Better than a non-real-time USB.Full Hardware Interrupt Handler Support! AltaAPI SDK Provides Easy Integration – Use the exact same code as other Alta PCIe devices! Windows 10 Support Only
-
Product
Automated ICT System
-
With world-famous in-circuit test technologies and innovations around automated inline handlers, Keysight automated inline ICT solutions are versatile and flexible and provide you:
-
Product
Automatic System Function Tester
3260
-
Chroma 3620 is an innovative system handler for high-volume multi-site IC testing at the system level.
-
Product
CCD Device Handlers
-
Exatron has been in a unique position to supply handling systems for the new CCD device market. Manufacturers of CCD devices came to Exatron when these devices were new, looking for custom handling applications, and Exatron responded by modifying its Model 3000B, 3000BL, 5000, 5080, and 8000 systems to accommodate CCD devices.
-
Product
Configurable OSAT Friendly Pick-and-Place Handler
Delta Eclipse
-
Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors. The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.
-
Product
High-Throughput Film Frame Handler
MCT FH-1200
-
FH-1200™ film frame test handler is designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages. The FH-1200 enables high parallelism testing of post-saw IC devices at ambient temperature. It can accommodate 200 mm and 300 mm wafer rings and custom shapes onto which multiple strips can be mounted. No change kits are required regardless of package size (if same frame is used).
-
Product
Modular Gravity Handler For Small Devices
Rasco SO2000
-
Modular designed gravity handler with various input and output possibilities. SO2000 can handle the smallest possible packages for gravity and provides a broad range of Sensor and MEMS applications.
-
Product
Test Handler
-
Test Handler is an equipment that automates the final testing of semiconductor devices. It handles device transportation, controls temperature during semiconductor testing, and sorts devices based on test results.





























