EMI Test Systems
See Also: Faraday Cages
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Product
Amplifier Systems
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Systems are complete. They plug into an outlet and are ready to go. Our standard systems are 3U, which is 5.25″ and 5U, 8.75″. Systems are available with or without IEEE-488, RS-232 and Ethernet connectivity. Amplifiers Systems are available in both Broadband and Band-Specific frequencies.
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Product
EMI Test Receiver
ESW
Receiver
With its outstanding RF characteristics, high dynamic range and measurement accuracy, the R&S®ESW is the best choice for fast and reliable certification measurements. It meets the most stringent requirements in line with CISPR, EN, MIL‑STD-461, DO‑160 and FCC. The R&S®ESW captures and weights disturbance spectra very fast with its FFT based time domain scan. The real-time spectrum analysis with spectrogram function permits detailed analysis of even the shortest disturbance signals. MultiView mode delivers a simultaneous display of results from multiple operating modes for best instrument usability.
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Positioning Systems
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Whether high-precision, particularly robust or cost-efficient: the requirements for positioning systems are varied. In order to fulfill these perfectly, Pepperl+Fuchs offers various solutions and combines the advantages of optical , camera-based and inductive positioning systems in one portfolio.
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Product
Regenerative Battery Pack Test System
17040
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Chroma Systems Solutions, Inc.
The 17040 Regenerative Battery Pack Test System is a high precision system specifically designed for secondary battery module and battery pack test. It has an energy regenerative function to greatly reduce power consumption during discharge, and ensure a stable power grid without generating harmonic pollution on other devices – even in dynamic charge and discharge conditions. It is capable of recycling the energy discharged by the battery pack test back to the grid reducing wasted energy that traditional equipment discharges in the form of heat.
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Product
PXI System for LRU Test
ARINC 629
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PXI System for LRU Test Support. The system shown here was developed in support of Boeing 777 LRU Production Test.
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Product
Full Wafer Contact Test System
Fox 1
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Unique cartridge technology uses full-wafer contactors combined with parallel test electronics to achieve single touch, full-wafer test
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Product
Fully Automatic Rubber Tensile Testing System
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Compactly Integrating Functions Required for Quality Control of Rubber Shimadzu Fully-Automatic Tensile Testing System This system provides full automation, from measurement of specimen dimensions, supply to the testing machine, and fixing of chucks to measurement of extension between standard lines and data processing. The system can be used for continuous nighttime testing, which helps save labor costs.
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Dynamic Component Test Systems
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RedViking brings advanced engineering and proven implementation expertise to your next dynamic component test stand. We’ve designed entire fleets of multi-model and single-model test systems for new component development and production as well as military and commercial MROs. We have decades of experience building and implementing turnkey dynamic component test systems, and we’ll work with your teams virtually anywhere in the world.
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Product
Benchtop with Drop-In Test System
600 Series Compact ATE Platform
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The Circuit Check 600 Series Compact ATE Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 600 Series Compact ATE, test procedures can become automatic, with test steps and go/no-go limits easily programmable. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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System And Customization
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Fastwel also provides extra services, like coating, customization and assembling, which are often required by customers.
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Product
Sputtering Systems
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Known for precision and cleanliness, Veeco Ion Beam Sputtering (IBS) systems are ideal when engineers need tight control over film thickness, composition, and optical performance. Using a focused ion beam, IBS dislodges atoms from a target, depositing them onto a surface in smooth, ultra-uniform layers.
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Product
System Accessories
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To support the full need of the application Elma offers a comprehensive range of system level accessories to include: I/O solutions, HMI Displays, System/Power Management, Test/Development Boards, and Mechanical Mounting products.
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Product
Air Data Test Set System
B511
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The BRAT Option B511 is an option to the BRAT Test System utilizing Commercial-Off-The-Shelf (COTS) equipment. The system is used to augment the existing BRAT capabilities to test rate of change of altitude or pressure.
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Product
Parallel systems
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Did you know you can couple several Gill AC, Gill 12 and Weld Testers together or any combination of Gill AC, Gill 12 or Weld Tester, to give you a parallel logging multiple Potentiostat / Galvanostat / ZRA / FRA system, capable of recording from each working electrode at up to 60 readings per second. Coupling several Gill ACs or Gill 12s together gives the added abilities of the Weld tester and the ability to perform fast sweeps. Using our latest software, it has never been easier to couple instruments together to provide a Parallel System. In fact up to 32 instruments can be controlled at the same time. These instruments can either have individually enclosures or be rack mounted.
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Product
Handset Noise Under RF Test System
BK8021
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If you need to evaluate the resistance of cellphones to RF interferance, the BaKo Type BK8021 Handset Noise Under RF Test System is what you need. It performs four tests to evaluate the Sending Noise, Sending Sensitivity, Sending Loudness, Sidetone Masking, Receiving Sensitivity and Receiving Loudness. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When testing is complete, you can print the data as an MS Excel report or save it for comparison and analysis.
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Product
Dynamic Test System
3430-SW
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The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
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Product
Probe Systems
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We offer a complete line of premium performance analytical probe stations for precise device test and measurement directly on wafer.
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Product
Application-Specific Test Systems & Components
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Ease system integration with Keysight System products and services. You can be sure you´re getting outstanding system-ready instruments, open software, and PC-standard I/O that give you the freedom to choose the best tools for your test, and the assurance that they´ll work together, every time.
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Product
AC Hysteresis Graph Test System
DX-2012M
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Automatic measurement of the dynamic magnetic hysteresis loop of oriented and non-oriented silicon steel under the condition of 50 Hz, 60 Hz, 400 Hz and 1 kHz, accurate measurement of the static magnetic characteristic parameters such as amplitude permeability μa, loss angle δ, specific total loss Ps, remanence Br and coercivity Hc. With special testing fixture, it can directly measure the iron core and stator core of the transformer.
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Product
Lamp Cap Temperature Rise Test System
CX-T1
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Shenzhen Chuangxin Instruments Co., Ltd.
Lamp Cap Temperature Rise Test System is according to IEC60360-1998 and GB2512-2001(Standard method of measurement of lampcap temperature rise). It is used to test the working and environmental temperature as well as temperature-rise of the burner and lamp. It meets the requirement of IEC and GB Standards
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Product
Analysis System
Neptune (EDS-WDS)
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By integrating Energy Dispersive Spectroscopy (EDS) and Wavelength Dispersive Spectrometry (WDS) analytical techniques on a single platform, Neptune provides the power and flexibility of EDS with the resolution, precision, and detection limits of WDS. Together the two techniques extend X-ray microanalysis capabilities and provide solutions to the most challenging analysis problems. Each technique can be used independently or the data can be integrated to provide results which were previously unachievable.
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Product
System
SYS-28
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This 28" box coater has a separately ventable top chamber, to allow for faster parts changes and increased productivity. It also is equipped with our FTC-620 flip controller. The flip and rotation motors can be seen on the top. This system uses a Varian tri-scroll pump and a bottom mounted 16" APD cryopump.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
Pneumatic Horizontal Shock Response Spectrum Test System
KRD15 series
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KRD15 series is the state-of-the-art shock response spectrum tester that adopts compressed gas energy to provide impact energy, push the shock hammer to impact the resonance plate, and generate high energy shock. Comparing to traditional pendulum shock response spectrum tester, this machine has the advantages of high energy, stable performance, high reliability, good repeatability, easy adjustment, safety and environmental protection. It is mainly applied in the industries of aerospace, aviation and ships.
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Product
Various Systems
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Our experienced and highly qualified engineering team enables Innco systems to offer a wide range of possibilities to design positioning systems according to your specifications or measurement applications.The control of the system, singular or complex can be realized with our standard CO3000 controller, which allows connections to your measurement systems by GPIB or LAN.
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Product
Camera Barrel Test System
BK8612
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We designed the BK8612 2 Channel Noise Test System to provide noise and vibration testing for your digital camera barrel DC Motors. Because it is based on the BaKo BK2120B DAQ, it is capable of monitoring a microphone and an accelerometer concurrently to obtain data from the motor. Because you can change the parameters of functions and limits, it is versatile but still quick and easy to set up. In addition, you can look at data in real time and also store it for future analysis. Easy to use and set up, fast and accurate; if you need to maintain the quality of your camera barrel motors, this is the tester you want.
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Product
Electrodynamic Vibration Test Systems
CV-series
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CV-series is suitable for transportation tests. The lateral support stiffness and maximum displacement of the CV-series are large enough to be accommodate vibration tests of the specimens with high center of gravity.
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Product
LT-200A Aging-Life Test System For LEDs
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Hangzhou Everfine Photo-E-Info Co., LTD
LT-200A is mainly used for normal aging, accelerated aging test, lumen maintenance characteristic test, life test and temperature characteristic test of single LED and LED module.The system can monitor the photoelectric parameters and base temperature of the LED sample in real time, process the data, draw the aging curve, and calculate the lifetime exploration of the LED sample.
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Product
Measurement System For Testing & Binning Of Back-End LEDs
TP121-TH
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The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.
