Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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Electric Servo Motor Type 3-axis Vibration Tester
The Electric Servomotor Vibration Test System Is A New Vibration Test System Developed Based On The Control Technology Of AC Servomotors That We Have Cultivated Since Its Establishment.
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Near Zero Footprint SMT Spring Pin Sockets
Ironwood Electronics socket is a device size or near device size footprint test socket incorporating industry standard high performance spring pins. Ironwood can design a socket to work with any type IC packages- BGA, LGA, QFN, DFN and even leaded devices where you need to fit a socket in place of your device to allow fast, easy testing and development.
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AC and DC Power Sources
CFS100 Series
The CFS100 Series programmable AC or DC output power sources are cost effective source of power for development, test and production applications requiring anywhere from 800VA or less to 4000VA of single phase AC or DC output.
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Semiconductor Test Software Solutions
The test engineering staff at Test Spectrum has developed hundreds of test software projects on all major ATE platforms for numerous product technologies.Whether you need to optimize a current test platform, convert to a lower cost test platform, or design a brand new program for a cutting edge product within incredible time constraints, the Test Spectrum team will exceed your program expectations with quality products and excellent results.
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Functional Test Systems
With extensive experience in functional test equipment, a world-wide service and support organization, and a broad range of software/hardware options, we will supply cost-effective production-ready test solutions to meet your test challenges. Proposals developed by our functional test engineering team include a detailed description of system requirements, test instrumentation, estimated test cycle times (as applicable), footprint, and other key specifications.
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Mini In-Circuit Test System
U9403A
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Flying Probe Test
Producing the highest quality test programs since 2005, Test Coach is the proven specialist firm for flying probe test. Our in depth knowledge of SPEA systems and over 10 years of honed flying probe test techniques guarantees that our test programs offer the highest test coverage possible. As an In – Concert Partner with SPEA, we work closely with their team to keep at the forefront of new product innovations and technology, so that we can provide the latest advancements to our customers. In addition to test program development, we offer board test services, maintaining the systems and staff that allow for high throughput and the ability to consistently deliver the rapid turn times that customers can depend on. And, with 7,000 square feet of space, we feature a modern, clean, ESD safe and ITAR registered facility that surpasses expectations.
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ApTest Services
Applied Testing and Technology, Inc.
We undertake projects ranging from short term engagements to long term partnering, for customers from startups to the Global 1000. Many ApTest projects encompass a complete outsourced test design and development program, while others involve assisting a client with defining or implementing in-house testing programs.
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Open Top BGA Sockets
Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Tool for the Automated Analysis of Measured Data
TRACE-CHECK
Day-to-day testing of newly developed features produces large amounts of data that are never analyzed or used. Sporadic errors often remain undetected and problems relating to complex real-time behaviour are generally hard to identify. To resolve such issues, TraceTronic has designed the tool TRACE-CHECK. This software has been successfully applied in test automation environments,
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Modular Functional Testing Platform
OTP2
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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Software
Software for developing, testing, and troubleshootingSoftware upgrades enable faster production, reduce errors, improve precision, and give engineers the time and headspace they need to innovate.
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Development Switches
TTESwitch A664 Lab v2.0
The TTESwitch A664 Lab v2.0 supports laboratory testing and development efforts for non-real-time to hard real-time operations in distributed systems. The flight-capable TTESwitch Module A664 Pro is the core of TTESwitch A664 Lab v2.0. This enables a reduction in the development cost and time of a flightworthy switch.
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Functional Tester
ESF-2003
The functional tester developed on the basis of our experiences in electric parameters testing technique.Accumulated with 30 years of experiences in electronic testing, Shindenshi Corporation develops this ESF-2003.Shindenshi will provide suitable products to customer for their need.
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Multibus Development and Test Tool for ECUs and Networks
CANoe
The versatile software tool for development, testing and analysis of ECUs and entire networks. Bus systems: CAN, CAN FD, LIN, MOST, FlexRay, Ethernet, WLAN, Car2x ITS G5, AFDX, J1708, ARINC429 > Protocols: TCP/IP, SOME/IP, CANopen, J1939, ISO 11783, J1587, MCnet, GMLAN, K-Line, CANaerospace and ARINC 825. Others upon request.
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FlexVNX+ Test And Development Platform Aligned To SOSA And VITA 90 Standards
39S08VPX98Y2VAN
Elma’s all-new FlexVNX+ Test and Development chassis is the next generation portable test platform designed to accelerate development and test of VNX+ plug-in cards (PICs) aligned to The Open Group® SOSA™ Technical Standard and VITA 90.
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RF/Wireless Test Fixtures
Test‐Head Engineering develops and manufactures RF Test Fixtures which allow the testing of RF and Wireless modules and components.
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Test Program Sets (TPS)
Data Review, Corrections, & Generation (Reverse Engineering). Technical Requirement Documentation (TRD). Test Strategy Reports (TSR). Test Program Development – Software. TPS Sell-Off & Acceptance. Life-Cycle Support. Technical Interface Test Adaptors (ITA) – Hardware. Training - TPS Development, ATE/TPS Operator, Fault Diagnostic, ATE Maintenance.
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Waveform Function Generators
Teledyne Test Tools generate fixed or arbitrarily defined waveforms and signals for use in the development, testing and repair of electronic systems.
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JTAG based Test & Flash Programming Services
We offer EMS companies and design houses services and solutions in manufacturing testing with bias towards JTAG (IEEE 1149.x Boundary Scan) and functional test: System-level DFT rule checking for production testing and inspection. Test strategy development and optimization for test cost reduction. JTAG, functional, and emulation-based test development and deployment. Product testing and troubleshooting services. Ultra fast in-system programming solutions (Flash, EEPROM).
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Pattern Converter for WGL/STIL to ATE
VectorPort
VectorPort is a versatile, low-cost test development tool for converting WGL or STIL vectors to targeted ATE tester formats, including pattern, timing, and pinmap data. VectorPort can read and write all major formats in both parallel (Flat) vectors and serial (SCAN) vectors.
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Electric Vehicle Test Solution
As the automotive industry advances power conversion and battery technologies, Chroma has been actively working to improve electric vehicle (EV) testing performance and cost by developing flexible automated power conversion test platforms and regenerative battery test systems. Chroma ATE is a world leading manufacturer of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and turnkey test and automation solutions. Chroma’s Automated Test Systems for Electric and Hybrid Electric Vehicles consist of standard test platforms that are combined into one expandable test system that can test most power components in an EV’s power system. Compared to specialized test equipment developed for a single EV model or application, Chroma’s systems provide greater flexibility.
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VFTLP+ Test System
4012
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Reach Power-over-Ethernet (PoE) Testers
After assembly, electronic equipment manufacturers need to test functionally of their products. They want to provide the most test coverage, in the shortest time, for the least cost. When test engineers develop product test plans, they select the most appropriate off-the-shelf general purpose test equipment available. Reach designs and manufactures custom test equipment which is a better fit than general purpose equipment. It not only reduces test time but also reduces costs.
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Silicon Nails Feature Development And Runtime, GTE 10.00p
K8228A
The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
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3U VPX Development Kit
This development kit enables efficient 3U VPX backplane design and software verification.- 3U VPX architecture- One CPU blade, one GPU blade (optional), SOSA-aligned- 1TB NVMe pre-installed in CPU blade- Rear transition module(s) included- Test Frame with backplane pre-installed
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VXI Switching
The Aerospace and Defense industries were early adopters of modular test platforms. One of the first successes was VXI test systems and VXI switching. They served these industries very well for more than 20 years. Now, as VXI test systems become obsolete, test systems developers are looking to PXI as the next generation modular test platform for their industries. We offer a few different references to help you in making a switch to PXI.
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COM-HPC Server Type Ice Lake-D Starter Kit
The COM-HPC Server Type Starter Kit consists of a COM-HPC Server Type module, memory, and thermal solution of your choice with an extended ATX size COM-HPC Server Type reference carrier board, as well as necessary cabling. It allows you to quickly emulate the functionality of your end product for software development and hardware verification. Carrier board design files (schematics, mechanical drawings), COM-HPC module drivers, BSP, and user manual are also offered to aid you in designing your own custom carrier board.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
