Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Product
RFID Test Instrument
RAIN Xplorer
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The CISC RAIN Xplorer is a unique RFID test product developed for convenient tag frequency sensitivity, communication range, and backscatter measurements. The RFID tester is designed for open area tests and measurements in an RF-controlled environment using portable or fixed RF test chambers. The system is supplied with software and a reference tag for self-calibration.
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Product
AMIDA 3001XP Tester
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AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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Product
500Mz Tracing Signal Genrator
SM-5006
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is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Product
Pickering's Software Drivers and Application Software Packages
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In test system development, the best hardware is only usable if its software control environment is robust and easy to use. If you are a test system developer, you need to look at both the hardware and software aspects of your vendors of choice.
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Product
Counterfeit Defect Coverage Tool
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The SAE Counterfeit Defect Coverage Tool is a dynamic, web-based application that supplements SAE Standard AS6171 authored by the SAE G-19A Test Laboratory Standards Development Committee. It provides potential test sequences for the identification of counterfeit electrical, electronic, and electromechanical (EEE) parts along a range of risk levels and EEE part types. Allowing users to compare alternative test sequences as a function of resources needed to implement those tests, the SAE CDC Tool is appropriate for those ordering counterfeit detection tests as well as those performing the tests.
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Product
3U up to 10 Slots (VPX) / 12 Slots
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Designed to be beautiful, this chassis provides flexibility and ease of use to meet all the requirements by test and development engineers. With its exceedingly high-performing 1800W ATX power supply the chassis is designed for up to 120 amperes at 12 volts.
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Product
PCI Express 4.0 Protocol Analyzer Exerciser
Summit T416
Protocol Analyzer
The Summit™ T416 analyzer is the computer industry's first high speed PCIe 4.0 protocol analyzer that meets the challenge of 16GT/s and up to x16 lane width protocol analysis. Many PCIe 4.0 product designs are already in progress using the PCIe 4.0 specification. Companies are currently working with the Teledyne LeCroy Summit Z416 protocol exerciser for PCIe 4.0 at the deployment of PCIe 4.0 for host system emulation with their testing needs. This combination of a protocol analyzer and exerciser make Teledyne LeCroy the only supplier of protocol test and development tools for PCIe Gen 4. High speed interposers that provide protocol analyzer connectivity to CEM or other form factor sockets on system boards will still continue to be the principle way to capture PCIe traffic into the protocol analyzer.
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Product
Rugged Data Acquisition Systems
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Our team of engineers have decades of experience in performing structural testing in the aerospace, off highway, automotive, construction equipment, pulp & paper, and utility markets. We have used our testing expertise to develop a line of Rugged Data Acquisition (RAC) Systems that perform under harsh testing conditions.
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Product
Power Analyzer
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E-Mobility - eDrive, and Electric Vehicle TestingAdvanced and easy to use solutions for complete electric and hybrid vehicle testing in the development, validation and production phase. One-stop solutions for electric motor and inverter testing, battery and battery charge testing, combustion analysis, hydrogen engine testing and more.
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Product
PCIe Compliance Testing
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Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 4.0 and PCIe 5.0 specification. This solution combines a Summit Z58 or Summit Z516 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 4.0 and PCI Express 5.0 Link and Transaction Layer Compliance Testing.
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Product
IC Tester
ICE1
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The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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Product
Caibration Equipment For Lab Use
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In the field of high-power semiconductor testing, PONOVO has launched a smart test platform with high-speed high-frequency, high-voltage, high-current power sources, combined with high-speed, high-precision high-voltage, high-current analog acquisition technology and high-speed digital processing control system. The platform can complete the testing of dynamic parameter parameters, static parameters, thermal parameters and mechanical parameters, and power life parameter of various types of high-power semiconductor devices, modules, and chips, which could meet different testing requirements. It is the universal testing platform for automated testing for different application purpose, such as the research and development testing, engineering acceptance test, factory acceptance test, etc.
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Product
MIMIC® MQTT Simulator
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MIMIC MQTT Simulator is a scalable, customizable, programmable, predictable, dynamic simulation platform designed to enable rapid development / testing / deployment / tuning / training / demonstration of large-scale Internet of Things applications.
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Product
Multi-Layer Analyzer
GPON Xpert™
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The GPON Xpert multi-layer analyzer is a unique protocol analyzer for G-PON products. GPON Xpert is a modular tool designed for R&D, laboratory and field application engineers engaged in the development, testing and deployment of G-PON standard-compliant solutions. GPON Xpert verifies the interoperability of G-PON products offered by different vendors, and indicates compliance of any combination of OLT and ONT/ONU modems to the G-PON standard.
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Product
Digital I/O Vector Development Software
DIOEasy
Digital I/O
DIOEasy offers test engineers an efficient tool for developing, debugging, and executing digital test vectors for Marvin Test Solutions' GX5050 series, GX5150 series, GX5280 series and GX5291, GX5292, GX5293 and GX5295 dynamic digital instruments.Digital I/O (DIO) systems are very complex and typically require a substantial amount of programming effort to define data vectors. In order to simplify vector development, Marvin Test Solutions developed Windows-based DIOEasy, providing users with an easy to use interface. Toolbars and menus provide quick access to vector editing and viewing tools.
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Product
JTAG based Test & Flash Programming Services
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We offer EMS companies and design houses services and solutions in manufacturing testing with bias towards JTAG (IEEE 1149.x Boundary Scan) and functional test: System-level DFT rule checking for production testing and inspection. Test strategy development and optimization for test cost reduction. JTAG, functional, and emulation-based test development and deployment. Product testing and troubleshooting services. Ultra fast in-system programming solutions (Flash, EEPROM).
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Product
Compact Protocol Analyzer
LE-1500R
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"LE-1500R" is a protocol analyzer (line monitor) dedicated for asynchronous communication monitoring with affordable pricing. LE-1500R can run as a stand- alone by the internal battery for long time and can be remotely controled by a PC or a smart phone via Wi-Fi (Wi-Fi function is available only in USA, Canada, Japan, and EU). The analyzer has a TTL measurement port (which supports UART communication) as its standard port besides RS-232C, RS-422, and RS-485. It can monitor communication data of max 500Kbps for up to 32MB (8,000,000 data) in real time and also can execute a simulation testing of send/receive data. It also has a BERT function (which is not equipped with the analyzers of this pricing level) as its standard function. The correct time stamp, the measurement of idel time (which are the difficult for other software analyzers), and the capturing ability (without missing data) are the best options for trouble shooting and development test of a communication sytem which requires a reliablity.
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Product
Flying Probe Test Programming & Testing Services
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Zero Defects International LLC
ZDI utilizes a Seica flying probe tester in order to provide test program development and testing services to customers in Silicon Valley and throughout North America. This is a very cost-effective solution for printed circuit assembly manufacturers who do not have in-house equipment of their own but have customers who require test services.
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Product
Comprehensive Suite of Software Tools for Semiconductor Test Applications
ICEasy Test Suite
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Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
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Product
Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
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According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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Product
Boundary Scan / JTAG Test Development System
onTAP Development
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The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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Product
Data & Protocol Converter
uMACC
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The uMACC is a wholly contained Communications Converter (data converter - protocol converter or translator). Its small size makes it a complete solution for developing & testing both in the lab and in the field.The uMACC can carry up to 4 modules. Each module can be one of the following protocols: 1 dual redundant MIL-STD-1553/1760 interface1 H009 channel5 MMSI channels5 ARINC-429 channels2 ARINC-708 channels2 ARINC-717 channels5 ARINC-825 (canbus) channels2 Serial channels (RS-232/422/485, NMEA 0183)Ethernet (10/100/Gigabit)10 Discrete I/O signalsAnalog to Digital / Digital to Analog
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Product
9-Slot, 3U cPCI Serial E-Frame
39E09ZZX94Y3VC2X
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Taking a new board level product or system from concept to deliverable requires feature rich development and testing tools. Elma's 3U cPCI Serial test and development platform is the ideal environment for bringing your next project to fruition.
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Product
Automatic Test Equipment, Test Interface Units and Test Program Sets
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Axis Aerospace & Technologies Ltd.
AXISCADES is a pioneer in Test Solutions and has a long pedigree in developing Test Systems. AXISCADES has designed and developed Automatic Test Equipment, Test Interface Units/Interface Test Adapters and associated Test Program Set Software for Indian and Global, Aerospace and Defence OEMs and End Users.
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Product
Toolset for NI TestStand
TS+
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MESULOG TS + includes new configurable TestStand steps that simplify product characterization and validation, while reducing the time and cost of developing test sequences. With TS + , you can easily create advanced loop structures, save and replay datasets, display data dynamically, and include screenshots in your reports.
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Product
API testing suite
Postman
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Postdot Technologies Pvt. Ltd.
Postman helps you be extremely efficient while working with APIs. With Postman, you can construct simple as well as complex requests quickly, save them for later use and analyze the responses sent by the API. Postman can dramatically cut down the time required to test and develop APIs. Postman adapts itself for individual developers, small teams or big organizations equally well.
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Product
RF/Wireless Test Fixtures
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Test‐Head Engineering develops and manufactures RF Test Fixtures which allow the testing of RF and Wireless modules and components.
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Product
Software For Transformer Measuring Professional
T-Base Pro
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T-Base Pro is a new powerful software for electrical testing, developed by Raytech GmbH. Years of experience in building world-class testing equipment flowed into the development, resulting in a state-of-the-art software framework. Its functionality ranges from simple data import and export using a USB stick, to the full control of the sophisticated Raytech testing devices and measurement systems remotely.
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Product
Test Program Modules
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The BRAT Test Program developed will provide functional validation of an assembly based on customer supplied documentation. This does not include hardware (e.g., Interface Test Adaptors), documentation (e.g., technical orders), travel or travel related per diem, or site verification test or installation.
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Product
ATE & Test Systems
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Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
