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Product
PC Controlled Low Voltage Tester
Cablescan S32
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The Cablescan S32, with a 32-board Expansion Cabinet, may be ordered with 1 to 32 low-voltage 128-point scanner boards. Fully loaded with scanner boards, this tester provides 4096 test points.
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Product
SWB-2834, 8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781420-34
Relay Matrix Module
8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2834 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
High Voltage Differential Probes
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A high voltage differential probe is used for measuring the voltage difference between two test points where neither test point is at ground. High voltage differential probes from Tektronix can be used for signals up to 6000 V. These probes are the best choice for making non-ground referenced, floating or isolated measurements in large part due to their common mode rejection capability. These products are designed, manufactured, and serviced by Tektronix.
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Product
PNA-X Measurement Receiver for Antenna Test
N5264B
Receiver
A new industry standard for antenna test with 400,000 point per second data acquisition on all five measurement channels Twice as many receivers available compared to any other antenna receiver on the market Replace existing 8530A and 8360 solutions for a system speed improvement that is 10 times faster Built-in 8510/8530A code emulation software provides a drop-in replacement for existing antenna ranges utilizing an 8530A
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Product
ABex Matrix Module with 172x4 or 86x8 Cross Points
ABex AM-301 Matrix
Matrix Switch Module
The ABex AM-301 is a 172×4 matrix designed as a universal connection between the test points and the measuring instrument. This can be done locally or via the ABex. The ABex AM-301 can be configured as a matrix with 4 or 8 busses. The internal matrix busses can be switched to the analog bus.
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Product
Optical Voltage Probe
400-02
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Srico’s optical voltage probe uses advanced, proprietary optical chip technology to achieve precise, interference-free measurement. Our sensor and optical fibers are made of dielectric materials. This facilitates a high degree of isolation between the voltage test point and the instrumentation system ⎯ at a safe distance of 100 meters and more. This system senses, measures, and transmits electrical data very accurately.
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Product
Miniature Surface Mount Test Points
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Compatible with vacuum and mechanical pick and place assembly systems
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Product
Low Voltage Test System
CKT T1
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The CKT T1 is a compact size solid-state test system featuring 128 test points.
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Product
Cable/Harness Test System with Rack-Mounted Switching
CKT1175-20
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The CKT1175-20 is a high-voltage wiring analysis system that features rack-mounted switching matrices. This system is expandable in 100 test point increments to 96,000 test points, and available with a wide variety of adapter cable interface connectors, with the standard interface being the CKT MAC interface system.
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Product
Fineliner
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The parallel tester Fineliner enables two-sided contact with fne structures. Withvisual detection of both substrate sides and corresponding adapter position correction≥ 300μm test points can be contacted. The rigid needle adapter with a pitch of ≥ 400μmalso allows a high contact density. This results in a large test depth on the substrate.The integrated DMC reader ensures a correct test result assignment. Multiple PCB canbe tested step by step through in the X-direction of the Fineliner, further eliminatingsubstrate tolerances in the X-direction, and enabling more cost-effective adapters andmeasurement techniques. A quick-release system with identifable replacement kitsensures safe and quick retooling.The measuring technology can be defned customer-specifcally. There are 2040 pyloninterface points per side.
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Product
Basic Contact Probe F05079B050G150
1166650
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F05079B050G150 (item number 1166650) belongs to the Basic Contact Probe range for precise, repeatable contacting of electronic test points. F05079B050G150 belongs to the basic probe range for ICT/FCT, where tip geometry, spring force and surface finish are matched to the target test point. F05079B050G150 combines a pitch of 1.27 mm / 50 mil with tip style 79 (6-point crown flattened) and a tip diameter of 0.5 mm. F05079B050G150 operates with 150 cN spring force and 4.3 mm nominal travel. The continuous-current rating of F05079B050G150 is 3 A.
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Product
Diagnostics & Testing Equipment
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Parker offers an array of diagnostic and test solutions for measuring hydraulic and pneumatic data and for troubleshooting operational problems. These include analog and digital flow and pressure meters and viscometers as well as associated devices such as sensors, vacuum and pressure controllers, quick couplings, and test point connectors.
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Product
SWB-2811, 8x21, 1 A, Reed Relay Matrix Module for SwitchBlock
781421-11
Reed Relay
8x21, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2811 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Breakout Box
T1000-15
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T1000-15 breakout box with dual 15 pin D-Sub connectors for signal capture or monitoring. Dual connectors provide a total of 30 test points plus a ground jack. All test points use standard size 4mm banana jacks. Test points may be connected using shorting banana cable to allow signal continuity. Ideal for continuity measurements, isolation testing, and signal capture.
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Product
Testability analysis
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Using TestWay, ASTER provides advanced Testability report, Rules checking for In-Circuit Test, Functional Test and Boundary-Scan test. Test point optimization – Up to 70% of test points saved, automated backannotation to CAD system and CAD/CAM/CAT tools.
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Product
Cable and Harness Tester
CHT
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The Cable and Harness Tester (CHT) provides multiple testing capabilities for up to 300 connector/harness test points. Test capabilities include DC Insulation Resistance (IR), DC and AC Dielectric Withstanding Voltage (DWV), and 2-Wire and 4-Wire Continuity.
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Product
SWB-2810, 4x43, 1 A, Row Access, Reed Relay Matrix Module for SwitchBlock
781420-10
Reed Relay
4x43, 1 A, Row Access, Reed Matrix Module for SwitchBlock - The SWB‑2810 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
2 Pole 12 X 4 Low Thermal Relay Matrix Module
DP-cPCI-4113
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A matrix is the most versatile switch topology. It is made up of rows and columns that connect any input to any output. With matrix switching system, it is easy to connect a number of instruments or sources to various test points of the UUT. The benefit of matrix switching is simplified wiring with which the overall test system can easily and dramatically change the internal connection paths without any manual intervention.DP-cPCI-4113 offers switching matrix in a single slot 6U sized cPCI module with flexibility to configure for 48 cross-points or 72 cross-points on factory selectable basis.
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Drive-Thru Feature, GTE 10.00p
K8218A
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The DriveThru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.
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Product
SWB-2817, 16x22, 0.3 A, Reed Matrix Module for SwitchBlock
781421-17
Relay Matrix Module
16x22, 0.3 A, Reed Matrix Module for SwitchBlock - The SWB‑2817 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Stand Alone Low Voltage Tester
Model 256/PC
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Internal Memory: 8 program locations without test point labels or 2 program locations with test point labels. Removable Memory: 16 program locations without test point labels, or 4 program locations with test point labels.
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Product
Electrical Test System TY-CHECKER
Type E Series
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High-speed, high-precision testers offered with a broad lineup, matching a range of test point numbers. Can be used alone and on our press systems.
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Product
Basic Contact Probe F10007S170L300
1011111
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The Basic Contact Probe F10007S170L300 (item number 1011111) is a spring-loaded probe for temporary electrical contact with test points. With tip style 07 (Hexagonal 90° stepped), F10007S170L300 combines ICT/FCT use with a geometry intended for plated vias and pads where sharp edges penetrate contamination and oxide layers. F10007S170L300 combines a pitch of 2.54 mm / 100 mil with tip style 07 (Hexagonal 90° stepped) and a tip diameter of 1.7 mm. For F10007S170L300, spring force is 300 cN at a nominal travel of 4.3 mm. F10007S170L300 is rated for 5 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F10007S170L300 is made of steel and uses Longtime Gold plating.
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Product
Backplane Test System
402HV
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Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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Product
Basic Contact Probe F58837S050P300HP
1019481
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F58837S050P300HP (item number 1019481) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 37 (4-point crown stepped), F58837S050P300HP combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F58837S050P300HP combines a pitch of 2.54 mm / 100 mil with tip style 37 (4-point crown stepped) and a tip diameter of 0.5 mm. For F58837S050P300HP, spring force is 300 cN at a nominal travel of 9.3 mm. F58837S050P300HP is rated for 5 A continuous current with a typical contact resistance of 60 mΩ. For demanding test points, F58837S050P300HP combines functional Progressive Coating with the higher preload of the HP spring, supporting reliable contact on OSP surfaces and areas affected by flux or contamination.
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Product
SWB-2812, 16x9, 1 A, Reed Matrix Module for SwitchBlock
781420-12
Matrix Switch Module
16x9, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2812 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Debug Fixture
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With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.
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Product
PXI Based Multifunction Measurement and ICT Instrument
PXI-501
Multifunction Switch/Measure Unit
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
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Product
SWB-2815, 4x86, 0.3 A, No Row Access, Reed Relay Matrix Module for SwitchBlock
781421-15
Reed Relay
4x86, 0.3 A, No Row Access, Reed Matrix Module for SwitchBlock - The SWB‑2815 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
