Parametric Test
determine whether a DUT's electrical characteristics meet specification.
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Product
Parametric Test Solutions
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Reduce your cost-of-test up to 20% with our ultra-fast CPU Overcome your process test challenges Boost measurement throughput and lower costs with our synchronous/asynchronous parallel test capability Better low-level measurement performance Create customized waveforms Reduce transition costs
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Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Universal Launcher Test Set
TS-217
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The TS-217 is an I-level and Depot-level Universal Launcher test set supporting fighter aircraft launchers including the LAU-127, LAU-128, and LAU-129 (AMRAAM), LAU-117 and LAU-88 (Maverick), and LAU-7 (Sidewinder) missile launchers, launcher electronic assemblies, launcher power supplies, and circuit cards. The TS-217 is also used as a depot-level tester for F-18 armament including launchers (LAU-127, LAU-7, LAU-115, and LAU-116), bomb racks (BRU-32), and aircraft pylons (SUU-62 and SUU-63). Additionally, the TS-217 supports MAU-169 Paveway kits, subassemblies, and circuit cards. The TS-217 performs full parametric functional testing as well as troubleshooting to the faulty LRU (I-Level configuration) and SRU (Depot-Level configuration). The TS-217 can be used as an I-Level tester or as a Depot / Acceptance tester for launcher subassemblies.
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Product
LXI Reed Relay Matrix - Dual 128x4 Plugin, Direct Y Access, 12 Analog Buses
65-221-001
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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EXG X-Series RF Vector Signal Generator, 9 kHz to 6 GHz
N5172B
Vector Signal Generator
Achieve faster throughput and greater uptime with cost-effective performance optimized for manufacturing testPerform basic parametric testing of components and functional verification of receivers with industry-leading ACPR, EVM, and output powerReduce the time you spend on signal creation with Signal Studio software; purchase only the waveforms you need with 5- and 50-pack licensingMinimize downtime and expenses with self-maintenance solutions and low-cost repairs
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PXIe-2515, 35-Channel, 0.25 A PXI Signal Insertion Switch Module
780587-15
Signal Module
PXIe, 35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXIe‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXIe‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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LXI Reed Relay Matrix - Single 128x4 Plugin, Direct Y Access, 12 Analog Buses
65-221-002
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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Product
64 MB RAM Tester
IST-6500
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IST Information Scan Technology, Inc.
The IST-6500 is a low cost, fully programmable tester for functional and parametric testing of DRAM, SRAM, VRAM, and SIMM devices up to 144 bits wide and 64 MB in size. The 6500 offers four different ways to automatically measure the access time of these devices from 2ns to 160ns with a resolution of 2ns. The DRAM timing parameters are programmable at the resolution of 1ns to allow for testing DRAM, SIMM, or VRAM at their required operating speeds, thus providing real time test conditions.
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LXI Reed Relay Matrix - Single 32x16 Plugin, Direct Y Access, 3 Analog Buses
65-225-002
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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Product
High-Resolution Precision SMU (10 FA, 210 V)
PZ2110A
Source Measure Unit
The Keysight PZ2110A is a precision source / measure unit (SMU) that expands precise measurements from conventional static measurements and pulsed measurements, to fast dynamic measurements. It is ideal for a wide variety of current versus voltage (IV) measurement tasks that require both high resolution and accuracy. The PZ2110A can accurately perform characterization, parametric tests, and reliability tests of semiconductors, active / passive components, and general electronic devices.
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Product
LXI Reed Relay Matrix - Dual 128x4 Plugin, No Direct Y Access, 6 Analog Buses
65-221-111
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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Test Contactor/Probe Head
Atlas
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QuadTech™ probe solution with cruciform tip strength that stands up to lateral force without bending, plus an enhanced compliance window to accommodate package stack height tolerance.Atlas™ test contactor offers electrical performance that allows the customer to test to the true performance of the device. Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Cohu’s QuadTech flat probe technology. The Atlas offers a short electrical path, with lower capacitance and inductance, that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.
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SoftTest Design Testing Services
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We are a one-stop turn-key solution provider for the design, development, integration and support for Automated Test Systems. Our capabilities include Functional parametric and non-parametric test systems, intelligent go/no-go gauges, vision systems and a variety of fixtures and adaters to interface with the product under test the most efficient way possible. SofTest Designs can adapt the development architecture to meet the preferences or requirements of our customers in terms of instruments, interfaces and software. With our own in-house machine shop, our development and integration times are greatly reduced optimizing resources and transfering the benefits to our customer's applications.
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LXI Reed Relay Matrix - Dual 64x8 Plugin, Direct Y Access, 6 Analog Buses
65-223-001
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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Product
EXG X-Series RF Analog Signal Generator, 9 kHz to 6 GHz
N5171B
Signal Generator
Achieve faster throughput and greater uptime with the cost-effective performance optimized for manufacturing testPerform basic parametric testing of components and functional verification of receivers with industry-leading output powerThoroughly verify receiver performance by simulating complex analog modulation scenarios with multi-function generator capabilityMinimize downtime and expenses with self-maintenance solutions and low-cost repairs
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Test System
ITC57300
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The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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256 Channel Power Supply
IDPS750
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Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
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PXIe-4190, Up To 2 MHz, Up To 40 V PXI LCR Meter
788088-01
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The PXIe-4190 helps you measure and test the inductance, capacitance, and resistance (LCR) of electronic equipment. It includes an LCR meter with fF-class capacitance measurements and a precision source measure unit (SMU) with fA-class current measurements. You can use PXIe-4190 meter in capacitance-voltage/current-voltage (CV/IV) automated test systems for semiconductor applications including integrated passive device (IPD), microelectromechanical systems (MEMs), multi-layer ceramic capacitor (MLCC), and parametric testing. Additionally, the PXIe-4190 is supported by the NI-DCPower instrument driver, which includes APIs for LabVIEW, C, C# .NET, Python, and other programming languages.
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Probe Card
VC43™/VC43EAF™
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VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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LXI Reed Relay Matrix - Dual 32x16 Plugin, Direct Y Access, 3 Analog Buses
65-225-001
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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Product
Probe Card
VC20E Lab
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*20 millimeter ceramic probe card*Optimized for DC parametric test, modeling and characterization, and single site WLR*Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor*Effective operating temperature range from -65° to 200° C*Leakage as low as 5fA/V. If you require faster settling time, click here*Can be configured with up to 48 probes
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LXI Reed Relay Matrix - Single 32x32 Plugin, Direct Y Access, 1 Analog Bus
65-227-001
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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DDR4 Parametric Test Reference Solution
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Keysight's DDR4 parametric test reference solution helps verify the signal integrity of DDR4 memory designs according to JEDEC specifications.
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LXI Reed Relay Matrix - Single 32x32 Plugin, No Direct Y Access, 1 Analog Bus
65-227-101
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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DWV/IR Test Systems
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When used in conjunction with ART's own parametric relay test systems such as the RT290, the RT900 offers high speed AC and DC Hipot (dielectric withstand voltage) and Leakage testing of relays or other multi-pin passive devices.
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Programmable Parametric Tester For Discrete Semiconductors
IST-8800
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IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
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EXG Signal Generators
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The cost-effective EXG X-Series signal generators address critical speed and uptime needs for manufacturing test. With analog and vector models, the EXG provides the signals you will need for basic parametric testing of components and functional verification of receivers.
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Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
