Probing
See Also: Probers, Probing Stations, Nano Probes
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High 1.50 (43.00) - 9.60 (272.00) Long Travel Bead Probe
BPLT-1F-9.6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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20J3 SHEET RESISTANCE METER
Non-contact measurement of Ohms/sq, Ohms-cm, resistivity, thickness, and moreMeasures nearly all thin conductive materials or coatingsChoose a sensor in one of four ranges, from .005 Ohms/sq to 100,000 Ohms/sqadd other sensors laterFor benchtop or inline applicationsSimple one-button operationSmall footprint with detached sensor probeOptions include vacuum-ready probe, PC-based productivity software, Ethernet connectivity, stage, and more
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Micropositioner
MP-80
Engineered for highly demanding probing needs, the Korima Model MP-80 Micropositioner is precision-built for micropositioning to meet ever smaller industry standards. Featuring linear motion on all three axes, the MP-80 provides precise control for sub-micron probing.
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Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2F-2
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Data Communications And Semiconductor Device Related Products
Using our original micro springs and MC probes, these are highly durable products that are also lead-free. It is used for inspection of finished semiconductor products.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type I, Ø1.26mm, 305gf
K100-I126305-SKAU
K100 Series, Pitch 100mil, Tip Style I, Tip Diameter Ø1.26mm, Spring force 305gf, Steel with Gold Plating.
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1.5 GHz, 1 MΩ, 0.9 pF Active Probe
ZS1500
Engineers must commonly probe high frequency signals with high signal fidelity. Typical passive probes with high input R and C provide good response at lower frequencies, but inappropriately load the circuit, and distort signals, at higher frequencies. The ZS Series features both high input R (1 MΩ) and low input C (0.9 pF) to reduce circuit Loading across the entire probe/oscilloscope bandwidth. The ZS1500 is ideal for 1 GHz and lower oscilloscopes.
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6 GHz ProLink Differential Probe with Dx20-SI Solder-In Tip
D620-A-PL
- Choice of 4 GHz or 6 GHz bandwidth models- Up to 5 Vpk-pk dynamic range with low noise- ±3 V offset range- Low loading and high impedance for minimal signal disturbance- Ideal for DDR2, DDR3, LPDDR2- Deluxe soft carrying case- Innovative QuickLink architecture- Wide variety of tips and leads-- Solder-In Lead-- Optional Positioner (Browser) Tip-- Quick Connect Lead-- Square Pin Lead-- HiTemp Solder-In Lead
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Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72I15-7
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Magnetic Field Measurement Systems
The magnetic field probe performs non-contact current measurements and can be used for real traces. The probe of higher resolution enables pinpoint measurements.
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Combination Board Tester
Qmax Test Technologies Pvt. Ltd.
Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities and conventional PCBs. An In –Circuit device test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed and on board clock disable HW feature are the all time favorite . The in-built high frequency 14bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices with high degree of accuracy.
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UL60950 Wedge Probe
CX-S113
Shenzhen Chuangxin Instruments Co., Ltd.
The NAF2 is one of two new accessibility probes required by UL 60950 for paper shredders. UL found that children and small women could touch hazardous parts of some shredders. The other probe now required in the standard is UL Articulated Finger Probe, Model ULP01.
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Light 0.75 (21.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-25H-2
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 0.50 (14.00) - 3.40 (96.00) Non Replaceable General Purpose Probe
C-S-R
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 45Full Travel (mm): 1.14Recommended Travel (mil): 30Recommended Travel (mm): 0.76Overall Length (mil): 395Overall Length (mm): 10.03Rec. Mounting Hole Size (mil): 46.5Rec. Mounting Hole Size (mm): 1.18Recommended Drill Size: 56
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SSP Switch Probes
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Spring Force Remark: Force at switch point: 2.36 (66)Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 150Full Travel (mm): 3.81Recommended Travel (mil): 100Recommended Travel (mm): 2.54Mechanical Life (no of cyles): 100,000Overall Length (mil): 1,210Overall Length (mm): 30.73Switch Point (mil): 25Switch Point (mm): 0.64
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type C, Ø1.50mm, 230gf
K100-C150230-SKAU
K100 Series, Pitch 100mil, Tip Style C, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
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Analyzer Probes
The following probes are available for the MA51x0 and MA41x0 series analyzers. These probes are designed for low-voltage and high-speed midbus probing or probing with an interposer. The following JEDEC memory standards are widely used by these probes: DDR5 (JESD79-5), DDR4 (JESD79-4), DDR3 (JESD79-3), LPDDR5 & LPDDR5X (JESD209-5), LPDDR4 & LPDDR4X (JESD209-4), and LPDDR3 (JESD209-3).
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type I, Ø1.26mm, 230gf
K100-I126230-SKAU
K100 Series, Pitch 100mil, Tip Style I, Tip Diameter Ø1.26mm, Spring force 230gf, Steel with Gold Plating.
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CUSTOM Sensors
Over half of our orders are customized. Custom systems include simple calibrated range changes, vacuum compatability, mechanical probe changes, unique driver electronics, unusual calibrations, and completely new designs for inclusion in OEM products.
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Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3E
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-1T1-10
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25L-8
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Tester Electrical Interfaces
The primary element of the tester electrical interface is the Probe Pin Ring (PPR). Sometimes referred to as a ‘tower,’ this array of spring-loaded probes can be arranged to provide a controlled impedance path, a low leakage connection, a low inductance arrangement for high currents, or just about any connection characteristic you require. inTEST EMS provides electrical interfaces in various OEM-supported designs, inTEST standards, and custom configurations.
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Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2J40
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1I-4-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1T30-4
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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4 Channels DC Power Data Acquisition Device
NuDC-4U
NuDC-4U is an innovative product that provides better solution for power probing. Common DC power statistics including voltage, ampere and even the watt can be read instantly via NuDC-4U. Moreover, up to 4 sets of individual powers can be monitored simultaneously and the LCD screen can also display the maximum and minimum value of the current power during the test.
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Differential Probe
With signals becoming faster, and power supply voltages going lower, these active differential probes will allow floating measurements from 100uVolts to as high as 7000 volts. These probes provide high CMRR and a broad frequency range.
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13 GHz Differential Probe with ProLink Interface
DH13-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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MmW Probe Station
EB-6V
The EB-6V probe station is designed for all frequency extenders such as those from VDI, OML, R&S, Keysight, Anritsu. If you are using an Anritsu VNA VectorStar ME7838A4 model, or commonly Anritsu 3743A mmW Extenders and related sizes, the station of interest is the EB-6A.
