Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Open Top BGA Sockets
Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Hall Effect Measurement system
HMS-3000
Hall Effect Measurement System is very useful for measuring Carrier Concentration, Mobility, Resistivity and Hall Coefficient that should be pre-checked in order to grasp the electrical specifications of semiconductor device. Therefore, it is essentially required system to understand the electrical characteristics of semiconductor device.Ecopia’s HMS series consist of constant current source , terminal conversion system by Van der Pauw technique, low temperature(77K) test system and magnetic flux density input system. So, it is well-established system that has all the things needed to Hall Effect Measurement System.
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Software Capabilities
In test system development, the best hardware is only usable if its software control environment is robust and easy to use. If you are a test system developer, you need to look at both the hardware and software aspects of your vendors of choice.
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Miniature Electrodynamic Shakers
Miniature electrodynamic shakers are small, portable units designed to simplify your vibration testing needs. From the SmartShaker™ with an integrated amplifier, to an Inertial Shaker System for testing in hard-to-reach areas, mini shakers offer flexibility when testing. Miniature shaker systems range from 2 lbf (9 N) to 7 lbf (31 N) sine peak force excitation.
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MATCO TECH MULTIMETER
MD257
*Provides readings for volts, amps and ohms required for automotive electrical system tests as well as diode and continuity tests*Lo-Z ghost voltage buster drains ghost voltages leaving only hard signals on meter readings*Beep-Jack audible warning beeps against improper a-terminal plug in and decreases the risk of damage
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SWB-2817, 16x22, 0.3 A, Reed Matrix Module for SwitchBlock
781420-17
16x22, 0.3 A, Reed Matrix Module for SwitchBlock - The SWB‑2817 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Phase Noise Analyzer
NXA-6
This new NXA-6 is a sea-change in Phase Noise Test Systems. Making both residual and absolute noise measurements out to 6 GHz, this self-contained instrument uses either internal or external references with cross correlation for maximum dynamic range.
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Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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PXI High Density Precision Resistor Module, 18-Channel, 2Ω to 470Ω
40-298-014
The 40-298-014 is a high density programmable resistor module with 18 channels which can be set between 2Ω and 470Ω with 2Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Vacuum Inspection
INDEC
INDEC vacuum test systems monitor a wide range of containers during the production process, including bottles, jars and cans, by measuring the cap panel concavity of their closures which is dependent on the vacuum inside. This non-contact inspection reliably identifies defective containers for automatic rejection.
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PXI Power Supply Modules
Fixed power supply modules provide you with up to four separate voltage outputs isolated from the PXI backplane. Any combination of 3.3V, 5V, 12V or 15V can be specified with a maximum current capability of 4A for the 3.3V option; the software provides on/off control and status monitoring for each output. Dual programmable power supplies are capable of supplying up to 60 Watts of power. These are ideal solution for applications where a self contained test system with a high power supply power capability is required in a PXI format.
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Cloud Semiconductor Testing Service
CloudTesting™
All-in-one platform for semiconductor test and measurement Extensive test and measurement library Microcontroller, Memory, Analog and more. CloudTesting™ Service is the test and measurement system that you can build your own environment by selecting and combining Testing IPs. Fees for Testing IPs are paid monthly.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Brake Testing
Vehicle Brake Test and ABS TestingWe offer an easy-to-use measurement system for brake testing and ABS testing according to ECE, ISO, FMSSV, and SAE international standards. Our test system offers automated workflow, is flexible and robust and used for brake R&D, brake comfort and vehicle testing with regenerative braking. High-accuracy GPS and IMU hardware are available to achieve the highest possible velocity and distance accuracy.
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Medium-power DC Electronic Load (900W~6000W)
FT6400A Series
Shenzhen FaithTech Technology Co., Ltd.
The FT6400A series has modular design, with strong adaptability, high reliability and high maintainability. Mainly used in power electronics testing fields such as power batteries, medium and high power DC power supplies, DC generators, etc. The FT6400A electronic load not only provides OCP, OVP, OPP, OTP, RVP but also provides Von and Voff functions and programmable protection functions for the device under test. These features can greatly improve the reliability of the product, and it is a reliable product for engineering test and automatic test system integration.
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SWB-2834, 8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781421-34
8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2834 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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SWB-2815, 4x86, 0.3 A, No Row Access, Reed Relay Matrix Module for SwitchBlock
781421-15
4x86, 0.3 A, No Row Access, Reed Matrix Module for SwitchBlock - The SWB‑2815 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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CPCI
Modules in compact PCI from Data Patterns are available for Data Acquisition and Control, Simulation, Communication Automatic test equipment, Rugged systems, Fail-safe systems, Computer controlled logic controls, Plant automation and similar requirements. Other I/O functions available from our IP and Mezzanine Module families can be directly integrated into our cPCI systems.Data Patterns has also pioneered cPCI derivatives such as 9U High Voltage systems, Multiple backplane support with Hot Standby Switchover capabilities. Continuous innovation enables MMI options such as CRT & LCD displays, Keyboards, Pointing devices, Finger print security devices and so on.
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High Precision Spectroradiometer Integrating Sphere System
LPCE-2(LMS-9000)
LPCE-2 is an Integrating Sphere Spectroradiometer LED Testing System for identifying the performance of single LEDs and LED lamps. LED’s quality should be tested by checking its photometric, colorimetric and electrical parameters. According to CIE127-1997, IES LM-79-08 and IES LM-80-08, it recommends to using an array spectroradiometer with integrating sphere to test SSL products. The LPCE-2 system is applied with a CCD Spectroradiometer (LMS-9000B or LMS-9000A) and worked with A molding integrating sphere with testing holder base function which will be more circle and the test results will be more accurate than the traditional integrating sphere.
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Electromagnetic Resonance High Frequency Fatigue Testing Machine
PLG Series
Jinan Testing Equipment IE Corporation
The series of electromagnetic resonance fatigue testing machines are used for fatigue tests of metal materials and components under tension, compression or reversal loads. If relevant grips are provided, three-point bending test, four-point and circle test, gear wheat, bolt, connecting rod, roller chain, crackle expanding test can be available. The series of electromagnetic resonance fatigue testing machines feature an optimized design and a rational structure. The automatic controlled system adopts an advanced and wide-pulse-control system and a new-type of power amplifier to improve the reliability of the electric system. The electromagnetic resonance fatigue testing system is with high efficiency, easy and non-stop shake, low energy consuming, accurate control, and small fluctuation.
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Maxirack - 200 x 60 x 80 cm
OTP2 module no003
The rack serves as the basic framework for your individually designed test system. Various OTP² modules can be installed in the 200 x 60 x 80 cm rack in order to meet the most varied of test requirements.The modular architecture of the OTP (Open Test Platform) is based on a flexible instrumentation matrix, LXI-based sources and measuring devices, combined with a high-quality transfer interface for connecting the test adapters. The systems can easily be expanded with customer- and application-specific functions. We use standardization to build cost-effective systems that still fit your requirements exactly.
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Computer-controlled Torque Testing System
Torque Testing System,
Our top-of-the-range Vortex-i torque testing system gives optimum testing performance and evaluation options, enabling you to get the most from your test measurements.
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PXI 2.5W Programmable Resistor Module, 2-Channel, 1.5Ω to 472Ω
40-251-120
The 40-251-120 is a programmable resistor module with 2 channels which can be set between 1.5Ω and 472Ω with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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VXI Waveform Generators
Astronics Test Systems offers VXI Arbitrary Waveform Generators with a long, reliable heritage for military use.
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Multi-Purpose RF Test System
SPA441
The S - Series multi-purpose RF test system can be used in many applications such as R&D lab, ATE factory testing, EMC testing, field testing, and general purpose RF design. The S - Series is a flexible alternative to expensive and bulky RF test equipment. As shown in the setup in the upper right the S-Series system can be utilized to simultaneously provide all RF functions using its 7 inch front panel display or can be connected to a larger monitor for ease of viewing multiple windows at the same time
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Power Module And Device Testing System
Dynamic and static test system Meet the power IPM module dynamic and static electrical parameters test
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Digital and Analog Test Sets
Our analog and digital automated test system experience covers a wide variety of applicationsfrom multiple path resistance, capacitance, and inductance testing using various Interface Test Adapters (ITA)to inter-connect multiple customer units under test (UUT). Other systems have included: equipment to monitor and record telemetry, digital data streams, and systems that evaluate packet data using a variety of VME, VXI, PXI, and LXI equipment.
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Multi Protocol Analyzer
LE-8200A
The LE-8200A is the top-level model of battery-powered communications protocol analyzer. The LE-8200A has an enlarged display in response to an increasing demand without degrading the excellent portability of the LE Series. It is ideal for development tests of communications systems and industrial equipment, as well as for after-sale services and communication trouble analysis.
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Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.





























