Modulation Transfer Function
measures the various levels of detail an object transfers to an image.
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Product
Measuring Systems For Night Vision Systems
MTF Master IIT
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Optik Elektronik Gerätetechnik GmbH
Measuring system for MTF, SNR and EBI of Image Intensifier Tubes (IIT). The MTF MASTER IIT was specially developed to classify the quality of image intensifier tubes by the objective criteria of the MTF (Modulation Transfer Function).
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Product
SINE FBI Charts
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There are two SINE Sinusoidal arrays designed for FBI applications: the SINE M-13-60-S-RM and the SINE M-13-60-FBI Kit.The SINE M-13-60-S-RM was designed jointly by the Federal Bureau of Investigation, of Washington DC, and MITRE, of Bedford MA. The primary function of this Target is for computing Modulation Transfer Function (MTF) evaluation in live scanner fingerprint systems for conformance to Integrated Automated Fingerprint Identification Systems (AFIS) image quality requirements. The array is on reflective material measuring 16mm x 16mm with sinusoidal arrays ranging in frequency from 1.0 to 10.0 cycles per mm; with nominal modulation of the sinusoidal areas at 60%. The top and bottom rows are density scales, from 0.20 to 1.20 densities.The SINE M-13-60-FBI Kit consist of two individual components, the SINE M-13-60-1X-RM and the RR1-N-RM Ronchi Ruling grating.
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Product
Optics Test Equipment
MTF Measuring Systems For Industrial Applications
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Optik Elektronik Gerätetechnik GmbH
The MTF (modulation transfer function) is a recognized quality criterion for the imaging quality of optics. OEG GmbH develops and manufactures computer-controlled, fully automatic measuring systems for MTF and other parameters for quality assurance in optics production, incoming goods inspection, research and teaching.
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Product
MTF Measuring Systems For Industrial Applications
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The MTF (modulation transfer function) is a recognized quality criterion for the imaging quality of optics. OEG GmbH develops and manufactures computer-controlled, fully automatic measuring systems for MTF and other parameters for quality assurance in optics production, incoming goods inspection, research and teaching
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Product
LXI 50Ω Microwave Transfer Switch
60-808-415-003
Microwave Transfer Switch
These LXI (Ethernet-controlled) Microwave Transfer Switches are suitable for routing 50 Ω signals up to 50 GHz. With up to 16 switch banks, they are ideal for constructing complex microwave switching systems for many applications. Connection is by front panel mounted SMA. SMA 2.9 or SMA 2.4 connectors.
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Product
Arbitrary/Function Generator,2 Ch,150 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing
T3AWG2152
Function Generator
Arbitrary/Function Generator,2 Ch,150 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing.
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Product
Solid State FET Transfer Switch, 300 KHz To 18 GHz
U9400C
Dual Transfer Switch
Offers outstanding performance in isolation, switching speed, and video leakage over a broad operating frequency range
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Product
Automotive Electronics Functional Test System
TS-5020
Functional Test
The Keysight TS-5020 Automotive Functional Test System is a low cost, scalable test system designed with “just-enough-test” concept for medium complexity electronic control modules, such TPMS, RKE and body electronic modules
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
Digital Bit Pattern Generator
FAB-3226
Function Generator
The FAB-3226 Digital Bit Pattern Generator connects digital ports to an user-defined FPGA logic. As the FPGA is user-programmable all kind of operation can be implemented: input, output, and closed loop operation where input and output are processed in real-time. All this can be controlled by an user-defined application program running on a computer system (PC or embedded).
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Product
Solid State Switch, 45 MHz to 50 GHz, SPDT
85331B
Dual Transfer Switch
The Keysight 85331B single-pole-double-throw (SP2T) solid state switch maximizes your frequency range from 45 MHz up to 50 GHz, offering excellent performance with high isolation and fast switching speed.
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Product
Functional Test
UTS
Functional Test
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Product
PXI Three Channel Function Generator
41-620-003
Function Generator
The 41-620 is a compact 3 channel function generator provided in a PXI 3U single slot module. It is capable of generating sine waves to 10MHz with 48-bit frequency resolution referenced to the 10MHz PXI clock or to an external standard. The 41-620 can generate arbitrary waveforms loaded into the internal 256k memory, allowing the function generator to emulate many waveform types, including the typical waveforms of automotive and aerospace sensors.
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Product
Combination Board Functional Test System
QT 4256 ATE
Functional Test
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
Microwave Transfer Switch
60-808-510-001
Microwave Transfer Switch
These LXI (Ethernet-controlled) Microwave Transfer Switches are suitable for routing 50 Ω signals up to 50 GHz. With up to 16 switch banks, they are ideal for constructing complex microwave switching systems for many applications. Connection is by front panel mounted SMA. SMA 2.9 or SMA 2.4 connectors.
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Product
NI's Wireless Connectivity Functional Test Solution
Functional Test
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
Wireless Device Functional Test Reference Solution
Functional Test
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Product
PXI Dual Transfer Switch 26.5GHz 50Ω SMA
40-782-532
Dual Transfer Switch
The 40-780 Microwave switching module consists of one, two, three or four changeover switches capable of switching frequencies to 18GHz (optionally to 67GHz) in 50Ω or 2.5GHz in 75Ω. The 40-782 module consists of one or two microwave transfer switches. It has a characteristic impedance of 50Ω and is available in versions with maximum operating frequencies of 18GHz, 26.5GHz or 40GHz.
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Product
PXI-2798, 40 GHz, Dual-Transfer PXI Transfer Switch Module
782358-01
Dual Transfer Switch
40 GHz, Dual-Transfer PXI Transfer Switch Module—The PXI‑2798 can route RF or microwave signals in automated test applications. Designed to operate with less than 1 dB insertion loss at up to 40 GHz, the PXI‑2798 appears almost invisible to signals at much lower frequencies as well. You can use this module for basic signal routing or inserting and removing components in a signal path. The PXI‑2798 is also well-suited for passing high-order harmonics from RF upconverters or routing multiple sources to RF downconverters.
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Product
PXI-2598, 26.5 GHz, 50 Ω, Dual-Transfer PXI Transfer Switch Module
778572-98
Dual Transfer Switch
26.5 GHz, 50 Ω, Dual-Transfer PXI Transfer Switch Module—The PXI‑2598 is a general-purpose switch module for routing RF or microwave signals in automated test applications. You can use this module for basic signal routing or inserting and removing components in a signal path. The PXI‑2598 is also well suited for passing high-order harmonics from PXI RF Signal Upconverter modules or routing multiple sources to PXI RF Signal Downconverter modules. You can use its onboard relay count tracking to predict relay lifetime and reduce unexpected system downtime.
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Functional Test
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
SINE Sinusoidal Vision Demonstration Array
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The Sinusoidal Visual Demonstration Array is designed to demonstrate the Modulation Transfer Function (MTF) of the human eye. Its transmittance varies sinusoidally and increases in spatial frequency from 0.2 to 20 c/mm, following a logrithmic scale. The modulation increases linearly from top to bottom. One can see, in the image, where the visual contrast contour disappears which is the MTF of the eye. Ideally suited for teaching and demonstration, the Array is available on film mounted in glass (-G), or mounted in a 2″x 2″ projection slide.(-SL)
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Product
LXI 50Ω Microwave Transfer Switch
60-808-015-006
Microwave Transfer Switch
These LXI (Ethernet-controlled) Microwave Transfer Switches are suitable for routing 50 Ω signals up to 50 GHz. With up to 16 switch banks, they are ideal for constructing complex microwave switching systems for many applications. Connection is by front panel mounted SMA. SMA 2.9 or SMA 2.4 connectors.
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Product
PXI Three Channel Function Generator
Function Generator
Our PXI Function Generator is capable of generating sine, square and triangle waveforms to 10MHz with 48-bit frequency resolution referenced to the 10MHz PXI clock or to an external standard. It can generate fast swept frequency signals, permitting the output to emulate the operation of variable speed devices. The module can also generate arbitrary waveforms loaded into its internal 256k memory, allowing the emulation of many waveform types including the typical waveforms of automotive and aerospace sensors.
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Product
Benchtop Automated Functional Test
midUTS
Functional Test
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Product
Functional Test System
TS-5040
Functional Test
The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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Product
Arbitrary Function Generator
HMF2525/HMF2550
Function Generator
Powerful pulse generator Provides pulses with a recurrence rate of up to 12.5 MHz/25 MHz; the pulse width can be set from 15 ns to 999 s with a resolution of 5 ns. Rise/fall time can be selected from 8 ns to 500 ns – a very useful feature when characterizing input hysteresis of semiconductor devices Easily create arbitrary waveforms Arbitrary waveforms can be developed with PC software. Stored waveforms can be loaded via front USB port or imported via the complimentary HMExplorer software (available for download)
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Product
Functional Test Fixtures
Functional Test
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
