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Product
IndiRAM CTR With Quantum Characterizer
Spectrometer
The IndiRAM CTR Raman/PL system with Quantum Emitter Microscope is a multi-purpose system capable of performing Quantum Emitter Characterization, Raman, Photoluminescence as well as Optical Emission Spectroscopy. The system consists of a Pulse Laser along with a single photon counting module (SPCM), a Pulse Synchronization unit, Motorized Scanning stage and a research grade microscope (Upright or Inverted) for TCSPC measurements. Along with these, it also contains a High throughput Spectrometer with a TE Cooled CCD and an optics box assembly to perform Raman/PL and OES Spectroscopy and Microscopy. obtained after the multiple set of experiments gives the lifetime function.
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Product
Scanning Electron Microscopy (SEM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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Transimpedance Amplifiers
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Artifex Engineering GmbH & Co. KG
Applications include photodetection with PMTs and photodiodes, spectroscopy, Scanning Tunneling Microscopy, ionization detectors, pyro and piezoelectric detectors.
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Product
PXIe-5763, 16-Bit, 500 MS/s, 4-Channel PXI FlexRIO Digitizer
785161-01
FlexRio Digitizer
The PXIe-5763 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PXIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Product
Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Product
Atomic Force Microscope
NX-Hivac
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Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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Product
PXIe-5763 , 16-Bit, 500 MS/s, 4-Channel PXI FlexRIO Digitizer
785160-01
FlexRio Digitizer
The PXIe-5763 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PXIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
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HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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Fluorescence Microscopy Solutions
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Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology.
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Product
High-resolution, SWIR InGaAs camera
Wildcat+ 640 TE0 and WL Series
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The Wildcat+ 640 TE0 and WL series is based upon a state-of-the-art uncooled InGaAs detector with 640×512 pixels and 20 μm pixel pitch. The WL version uses a special windowless sensor package for laser beam analysis applications. The camera offers superior, high-resolution SWIR imaging capabilities, comes in a versatile and industry-proven Wildcat camera package (GenICam compliant) and offers advanced on-board image processing.The Wildcat+ 640 TE0 and WL cameras output full frame images at 220 Hz via either a CameraLink or USB3 Vision interface.The Wildcat+ 640 TE0 and WL is suitable for semiconductor inspection, display inspection (mobile phone and TV), microscopy and laser beam analysis.Benefits & Features- Compact and industry-proven camera design- High resolution SWIR imaging- Advanced on-board image processing performance- GenICam complaint- Flexible optical mount and lens options
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Product
Imaging & Analysis
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Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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Product
SPA100
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Our highly sensitive source picoammeter is designed for measuring and logging very small currents down to the pA range - making it an ideal instrument for scientific and research applications, including physics, materials science and electron microscopy. Full-featured at an affordable price, the SPA100 combines sensitivity, accuracy and stability to allow users to measure low currents with high precision as well as conveniently source bias voltages for experimentation. SPA100 also doubles as an ultra-high resistance meter, measuring accurately into the teraohm range. As with all our “headless” products, the SPA100 connects to PC via USB and utilises our complimentary software EPIC - enabling users to easily measure, graph and capture readings with timestamps and measurement stability information.
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Product
Industrial Microscope Systems
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Below you can see two industrial microscope systems which can be created using our components. Many other automated microscopy systems are possible using our components.
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Product
X-ray Microscopy
ZEISS Xradia Ultra
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Synchrotron X-ray nanotomography enables non-destructive 3D imaging at the nanoscale but you have to apply for very limited beamtime. What if you didn’t have to wait for synchrotron time anymore? Imagine if you had synchrotron capabilities in your own lab. With the ZEISS Xradia Ultra family, you have 3D non-destructive X-ray microscopes (XRM) at hand that deliver nano-scaled resolution with synchrotron-like quality. Choose between two models: both ZEISS Xradia 810 Ultra and ZEISS Xradia 800 Ultra are tailored to gain optimum image quality for your most frequently-used applications.
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Scientific Solutions
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Our backside illuminated (BSI) and backthinned Charge Coupled Devices (CCDs) and front and back illuminated CMOS image sensors (CIS) are seen as the gold standard for scientific and quantum imaging in applications in spectroscopy, microscopy, in vivo, x-ray and astronomy. We understand that every imaging application is unique and requires our engineers and scientists to work closely with our customers providing highly tailored imaging solutions.
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Product
sCMOS Camera
Dhyana 400D
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Fuzhou Tucsen Photonics Co.,Ltd
Dhyana 400D is equipped with a brand new 1.2 inch scientific CMOS sensor, which provide 80% quantum efficiency at 600nm. The 1.2 inch sensor size and 6.5X6.5um pixel size is more suitable for microscopy standard C-mount imaging. When comparing to other existing scientific CMOS camera products, Dhyana 400D has a hardware 2X2 binning function which make it superior sensitivity for low light imaging. When comparing to other existing scientific CMOS camera products, Dhyana 400D has a hardware 2X2 binning function which make it superior sensitivity for low light imaging.
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Static Image Analysis System Particle Size
PSA300
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The HORIBA PSA300 is a state of the art turn-key image analysis solution. Seamless integration of Clemex's powerful particle characterization software and an automated microscope with high-resolution camera creates an intuitive, easy-to-use imaging workstation. Addressing a need in the field of particle characterization, the PSA300 is a versatile particle size and particle shape analysis tool that can be used in a wide range of applications in the pharmaceutical industries and material science. It is a turn-key solution for labs that want to maintain an analytical microscopy environment with minimum intervention by the operator yet still yield maximum detail in the results.
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Product
Electron Microscope Sample Preparation
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Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
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Product
Desktop Fluorescence Microscope
Nanoimager
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The complete package for super-resolution microscopy
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Product
PXIe-5763, 16-Bit, 500 MS/s, 4-Channel PXI FlexRIO Digitizer
785162-01
FlexRio Digitizer
The PXIe-5763 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PXIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Product
Fourier Transform Infrared Spectroscopy (FTIR)
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Rocky Mountain Laboratories, Inc.
FTIR Analysis is used to analyze organic materials. Bulk and small particle materials can be analyzed. FTIR microscopy analysis allows for the identification of particle as small as 10 µm.
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Product
Cubes/Holders
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IDEX Health & Science stocks filter cubes used in fluorescence microscope platforms from the major microscope manufacturers, including Leica Microsystems, Nikon Instruments, Olympus Corp., and Zeiss Microscopy. Our super-resolution filter cubes set the new standard for laser-based microscopes and are optimized for mounting half-wave flatness, 1 mm thick super-resolution dichroic beam-splitters. Whether you order a custom or catalog filter set, complimentary filter mounting into the filter cube of your choice is performed by the certified staff.
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Product
Software Options
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Sonix offers powerful microscopy analysis software to enhance packaged semiconductor imaging, accelerate production and adapt systems based on the ECHO platform to customer-specific requirements.
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Product
Scientific CCD Image Sensors
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Our front and backside illuminated (BSI) and backthinned Charge Coupled Devices (CCDs) are seen as the gold standard for scientific and quantum imaging in applications in spectroscopy, microscopy, In vivo, x-ray and astronomy. We understand that every imaging application is unique and requires our engineers and scientists to work closely with our customers providing highly tailored imaging solutions.
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Product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Product
Highly Dynamic XY Linear Motor Scanning Stage
L-731
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Physik Instrumente GmbH & Co. KG
The magnetic linear direct drive is designed to provide high velocity and acceleration for inspection and microscopy. With a travel range of 205 mm square and solid velocity to 100 mm/sec, the L-731 is equipped to deliver high accuracy and smooth motion. Precision crossed roller bearings with anti-creep cage assist enable superior guiding accuracy (1.5 m straightness for loads up to 20 kg). An integrated optical reference encoder and limit switch provide further positioning control and accuracy for this compact stage with 5 nm resolution. DC servo motor versions are available on request.
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Product
Analytical Software for Microscopy
SPIP
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SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.
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Product
Tunable, Ultrafast TI: Sapphire Laser
SPRITE XT
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Sprite XT is a flexible ultrafast, femtosecond laser source. It delivers stability, reliability and productivity and is equally at home in the lab or as part of an OEM application. Choose your output power (up to multi-Watts), pulse width (femtosecond or picosecond models), wavelength range (fixed wavelength or tunable), and pulse repetition rate (<80 MHz to multi-GHz). All Sprite models are designed for alignment-free and maintenance-free operation and can be controlled from a web browser. It’s ideal for multi-photon excitation (MPE) and FLIM, quantum optics, time resolved spectroscopy, nonlinear optics, pump-probe experiments, microscopy, amplifier seeding, and electro-optic sampling.
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Product
Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
