Flash Memory
retains data absent of power. Also known as: Flash Device
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High-Speed Memory Test Solution
UltraFLEX-M
The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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Programmable Read Only Memory (PROM)
Is a Static Random Access Memory. The pinout is the JEDEC 28 pin, 8-bit wide standard, which allows easy memory board layouts which accommodate a variety of industry standard ROM, PROM,EPROM, EEPROM and RAMs.
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Volatile Memory
CAES offers an extensive volatile memory portfolio developed to handle the demands of harsh space and terrestrial environments.
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QML Memory
DPA Components, International (DPACI) has answered the call by offering our own line of QML Military memory SRAM products.
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Flash Point Tester
Weshine Electric Manufacturing Co., Ltd
Closed flash point tester, when the test sample is used in a closed environment (such as transformer oil), to determine the closed flash point value of petroleum products. Use touch screen instead of keyboard operation, adopt foreign advanced technology, large LCD screen LCD full Chinese display man-machine dialogue interface, full screen touch key prompt input, convenient and fast, open, fuzzy control integrated software, modular structure, in line with national standards, the United States, EU and other standards.
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Memory Tester
RAMCHECK
RAMCHECK is our most advanced memory tester and is the latest in our product line. Highly modular and user friendly, it redefines the capabilities of an affordable and portable ram checker.
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Programmer AUTO300 Weilei Memory
AUTO300 is the newest programmer from weilei company. That programmer is dedicated to automotive electronics. The main advantages are : reliability, speed, and the ratio of quality to price, the software in ten languages and 3-year warranty
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8 channel Memory Earth Resistivity and IP Meter
SuperSting R8 IP
The SuperSting R8 IP is a state-of-the-art multi-channel portable memory earth resistivity meter with memory storage of readings and user defined measure cycles. It provides the highest accuracy and lowest noise levels in the industry.This new instrument revolutionizes the field of resistivity imaging surveys by its capability to simultaneously measure up to 8 channels using a high power transmitter so that field data production can reach previously unheard of speeds
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Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Memory Interface Chips
Providing memory bandwidth and capacity to unleash the power of multicore processors
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Utility Card: Flash Programming Applications
This new feature enables the Keysight Medalist i3070 ICT to perform higher speed flash programming at the ICT station in the printed circuit board assembly manufacturing line. You can combine programming and testing into a single phase, to save time and money. This in-system programming (ISP) flash solution is tester-based and does not rely on fixtures, thus enabling greater flexibility and ease of debugging.
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Shared Memory Network PCI & PCIx Interface
PCI-SMN
Avionics Interface Technologies
2.125 Gbps Optical loop network - Single-mode and Multi-mode optical interfaces supported - Up to 256 Shared Memory Network nodes supported - Up to 200 MByte/sec sustained data rates - Maximum 500 nS latency between nodes - Network interrupts supported - Compatible with PCI & PCIx Host System Slots - Software Drivers available for Windows, Linux, LabVIEW Real-Time, and VxWorks
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Laser Flash Photolysis
This system that makes complex electronics, cumbersome software and large optical benches a thing of the past. The LFP system incorporates everything needed except the excitation laser. This is a simple, yet powerful instrument, ready to perform a wide range of time resolved kinetic and spectroscopic measurements involving transient absorption or diffuse reflectance. The LFP system, including the monochromator and digitizer is completely computer controlled, making it easy to obtain
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Reflective Memory Hub
ACC-5595
The ACC-5595 is a managed hub designed to operate with our 5565 family of Reflective Memory real-time network products. The Reflective Memory hub can automatically bypass ports when it detects a loss of signal or the loss of valid synchronization patterns, allowing the other nodes in the network to remain operational.
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Integration of Flash / Controller Programming
Flash or microcontroller programming can be integrated in a wide variety of ways, depending on the type and scope of the application.
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4-CH 16-Bit 10/40 MS/s PCI Digitizers with 512 MB Memory
PCI-9816/9846
The ADLINK PCI-9816/9846 are 10MS/s, 40MS/s sampling 16-bit 4-CH digitizers designed for digitizing high frequency and wide dynamic range signals with an input frequency up to 20 MHz. The analog input range can be programmed via software to ±1 V or ±0.2 V and ±5 V or ±1 V. With a deep onboard acquisition memory up to 512 MB, the PCI-9816/PCI-9846 are not limited by the data transfer rate of the PCI bus to enable the recording of waveforms for extended periods of time.
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In-Line Flashing Station
AR302
The 6TL AR302 In-Line Flashing Station is designed with the most innovative numeric movement control technologies and ensures reliability and precision.With multiple flash programmer options, it offers a high PCB transfer speed and includes a stopperless system. Up to 40 devices in parallel can be programmed and no compressed air is required for operation.
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1 Channel 100 MHz Flash ADC
NIMbox DNAE
NIMbox DNAE - 1 channel 100 MHz flash ADC with 3 programmable TTL I/O ports, 2 channel DAC 100 MHz, 4 LE discriminators and 5 NIM or TTL I/O
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Memory Recorder
MR8847A
High-speed 20MS/s, 16-channel, Fully Isolated Memory Recorder for On-site Jobs and R&D
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Memory And Storage
Intel provides technically advanced products that support every level of computing—from data center workloads to enthusiast usage. Intel® Optane™ memory creates an accelerated bridge between memory and storage. Intel® Solid State Drives (Intel® SSDs) provide storage flexibility, stability, and efficiency.
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Acute 4GS/s 136 Channel Logic Analyzer With 32Gb Memory
Acute LA3136B+
*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis
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MRAMs - Magnetoresistive Random Access Memory
Teledyne e2v’s MRAMs type EV2A16A is an extended-reliability version of the MR2A16A from Everspin. It is the ideal memory solution for applications that must permanently store and retrieve critical data quickly. It perfectly suits the requirements of critical embedded applications such as avionic, aerospace and defence environments.
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Flash SATA Disk/mSATA Mini SATA 3 SLC, MLC
FSA 301 Series
*SATA III (6.0Gb/s) interface*Capacity: SLC 1 GB to 32 GB, MLC 4 GB to 64 GB*iSMART disk health monitoring*Intelligent error recovery system*Write protection security*Anti-vibration mechanical design*Excellent data transfer speed*Zero mechanical interference*JEDEC standard MO300B dimension
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Acute 4GS/s 68 Channel Logic Analyzer With 32Gb Memory
Acute LA3068E+
*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis
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High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Programming on-chip flash in your processor
XJDirect
XJDirect is an advanced and innovative method for programming the internal flash of your processor and implementing some aspects of board test through JTAG when traditional boundary scan techniques cannot be used.
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Parallel Memory Test Solution
Magnum2
Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.
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Flash Chromatography Systems
Teledyne LABS’ is a leader in the research, development and manufacturing of flash chromatography. The advantages of automated flash chromatography are many. It’s easy, fast, relatively inexpensive, requires minimal development time, uses less solvent, and offers more exacting results. These advantages make flash one of the most popular techniques for purifying pharmaceutical intermediates, as well as final organic products. It is also widely used in natural products research.
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Flash SATA CFast™ SLC ,MLC
FSC Series
*Compliant with CFast™ 2.0 Standard, Capacity SLC: 2 GB ~ 64 GB, MLC: 4 GB ~ 128 GB*SATAIII interface*Suitable for high demanding applications*Well performed under harsh operating environment and industrial temperatures*Anti-vibration & shock resistance*Support static wear leveling algorithm*S.M.A.R.T. & i-S.M.A.R.T. Supported*Intelligent system for error recovery*Excellent data transfer speed*Extremely low power consumption*High operating reliability & durability*Hardware write protect*Enhanced power cycling management
