Si
atomic number 14 tetravalent metalloid chemical element.
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Product
Si Detectors & Spectrometers
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Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
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Product
UV TOCONs
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SiC based UV sensor with integrated amplifier and 0 – 5 V voltage output. Measures intensities from 1.8pW/cm² up to 18W/cm². Spectral response for broadband UV or filtered for UVA, UVB, UVC or UV-Index. Also available for blue light (GaP chip) or visible light (Si chip) measurement. Available in TO5 housings or as miniature sensor probes (stainless steel or plastic). Special TOCONs for hydrogen flame sensing (TOCON_F) and for fire detection (TOCON_N) available. Also available for operating temperatures up to 120°C (standard is 85°C). Please learn more about the sglux TOCONs here: TOCON selection guide and here: TOCON User Guide.
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Product
Velocity Calibration
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Trescal provides full Velocity Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Velocity Calibration services can be delivered at your site or at our lab. Accreditations for our velocity calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Photodiodes
Avalanche
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Similar to photomultipliers, avalanche photodiodes are used to detect extremely weak light intensities. Si APDs are used in the wavelength range from 250 to 1100 nm, and InGaAs is used as semiconductor material in APDs for the wavelength range from 1100 to 1700 nm.
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Product
Resister
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Our ARFC type Film Flat Chip Resistor & ARFCN type Thin Film Chip Resistor Network are high precision Metal Film resistors produced with high purity. Alumina Substrate and Ni-Cr-Si Resistor Film based on high precision Etching Technology. The electrode Terminals are made with Spattering Film and Nickel-Solder Plating, and solderability is very good in all Flow, Reflow and Dipping type soldering for Hybrid IC, SMT, PCB etc. Our ARFC Metal Film Resistor & ARFCN type Thin Film Chip Resistor are being produced under the thorough quality control, and are being used widely in high precision and high reliability electronics circuit such as Measuring Instrument, Medical Instruments, Communication and other Industrial Instruments.
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Product
Power Meters andCalibration Cells
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The Solar Reference Cell consist of a 20 x 20 mm monocrystalline silicon Photovoltaic Cell encased in a 92 x 70 x 16 mm metal enclosure with a protective quartz window and a temperature sensor. The temperature sensor is a 100 ohm platinum Resistance Temperature Detector (RTD).The Solar Reference Cells come with a Certificate of Calibration and compatible set of connecting cables. The following parameters of the reference cell are certified: Isc, Imax, Voc, Vmax, Pmax, Area, Fill Factor and Efficiency. The certification is accredited by NIST to the ISO-17025 standard and is traceable both to the National Renewable Energy Laboratory (NREL), and to the International System of Units (SI). A compatible cable set is also supplied with each Solar Reference Cell.
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Product
RF Front-end
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The RF integrated passive device (RF IPD) uses a high-resistivity substrate to integrate quality factor components such as capacitors and indictors. Many functions like impedance matching networks, harmonic filters, couplers, baluns, and power combiners/splitters can be designed using IPD technology. ST's IPDs are manufactured using thick film and HiRes Si or glass wafer manufacturing technology and photolithography processing.
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Product
Silicon Irradiance Sensors
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Measure the irradiance intensity on your photovoltaics system precisely at an affordable price with IMT Technology’s robust silicon solar irradiance sensors (Si sensors).
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Product
KV CAPS
1000 V
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Macom Technology Solutions Holdings Inc.
The MACOM KV CAPS™ Si high voltage capacitors feature very high working voltage ratings, very low loss and excellent stability by virtue of their novel internal construction and very high-quality dielectric layers. These capacitors are available in surface mount (SMT) plastic packages or in hermetic ceramic packages.
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Product
Humidity Calibration
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Trescal provides full Humidity Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Humidity Calibration services can be delivered at your site or at our lab. Accreditations for our humidity calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Flow Calibration
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Trescal provides full Flow Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Flow Calibration services can be delivered at your site or at our lab. Accreditations for our flow calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Force Calibration
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Trescal provides full Force Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Force Calibration services can be delivered at your site or at our lab. Accreditations for our force calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Automated I-V/AOI/EL and Sorting System
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OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Product
4-Port Serial Interface
APCI-7500-3
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This Model has a 37-pin D-Sub male connectorRS232, RS422, RS485, 20 mA Current LoopModular structure through SI modulesWith or without optical isolationMode configuration free for each port128-byte FIFO-buffer, common interruptTransfer rate programmable up to 115,200 BaudOption: up to 1 MBaud for RS485 and RS422Automatic direction recognition for RS48Mode: configurable RS232, RS422, RS485, 20 mA Current Loop (active, passive) with or without isolation (SI modules)Transmission mode asynchronous, full, half duplexTransfer rate: progr. up to 115.2 kBaud up to 1 MBaud on requestProtocol: 5, 6, 7 or 8-bit character 1, 1? or 2 stop bitsParity: even, odd, none, mark or spaceInterrupt lines: automatic through BIOS
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Product
KV CAPS
200 V
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Macom Technology Solutions Holdings Inc.
The MACOM KV CAPSTM Si high voltage capacitors feature very high working voltage ratings, very low loss and excellent stability by virtue of their novel internal construction and very high-quality dielectric layers. These capacitors are available as unpackaged chips. The chips have gold bonding surfaces on both terminals to enable excellent bonding and minimum contact resistance.
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Product
AAA Solar simulator
SS50AAA-PLC
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Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs) ■Gallium aluminum arsenide (GaAlAs) ■Gallium indium phosphite (GaInP)
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Product
Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Product
1.3 Million Pixel CMOS Image Sensor
Sapphire 1.3M
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This 1.3 million pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 60 fps in full resolution. Novel industrial machine vision application features such as multi ROI and histogram output are embedded on-chip. Very low power consumption enables this device to be used in battery powered applications.
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Product
Radiometry Calibration
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Trescal provides full Radiometry Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Radiometry Calibration services can be delivered at your site or at our lab. Accreditations for our radiometry calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Semiconductor Metrology Systems
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MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Product
Volume Calibration
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Trescal provides full Volume Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Volume Calibration services can be delivered at your site or at our lab. Accreditations for our volume calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Ultra-Low Noise 2 kHz Photoreceiver w/ Si-PIN Photodiode
PWPR-2K-SI
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Picowatt Photoreceiver series PWPR-2K with switchable gain (10 to the 9th V/A, 10 to the 10th V/A) and a bandwidth from DC to 2 kHz is the perfect choice for cw-measurements, time resolved signal acquisitions and highly sensitive modulated measurements. Si and InGaAs models cover the wavelength range from 320 to 1700 nm.
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Product
Process EDXRF Spectrometer
NEX LS
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Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Product
4-port Serial Interface, Modular, With/without Optical Isolation, 3.3V/5V, With 9-pin Connectors
APCI-7500-3/4C
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*This model has 4x 9-pin D-Sub male connectors on 2 brackets*RS232, RS422, RS485, 20 mA Current Loop*Modular structure through SI modules*With or without optical isolation*Mode configuration free for each port*128-byte FIFO-buffer, common interrupt*Transfer rate programmable up to 115,200 Baud*Option: up to 1 MBaud for RS485 and RS422*Automatic direction recognition for RS48*Mode: configurable RS232, RS422, RS485, 20 mA Current Loop (active, passive) with or without isolation (SI modules)
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Product
Avalanche Photodiodes
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Excelitas offers Avalanche Photodiodes (APDs) on both Silicon (Si) and InGaAs materials. Si APDs cover the spectral range of 400 nm to 1100 nm and the InGaAs APDs cover 950 nm to 1550 nm. An Avalanche Photodiode (APD) provides higher sensitivity than a standard photodiode and is for extreme low-level light (LLL) detection and photon counting.
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Product
GaN Power Amplifiers > 5W
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Macom Technology Solutions Holdings Inc.
MACOM GaN RF power amplifier solutions are designed with the latest GaN-on-SiC and GaN-on-Si technologies. Our MACOM PURE CARBIDE series of GaN-on-SiC power amplifiers offers high performance and reliability for the most demanding applications. Our expanding GaN portfolio is designed to address the challenging requirements of Aerospace & Defense, Industrial, Scientific and Medical applications and 5G wireless infrastructure. MACOM GaN products deliver output power levels ranging from 2 W to over 7 kW and exhibit best in class RF performance with respect to gain and efficiency. For sensitive Aerospace & Defense applications MACOM can offer a US only supply chain with AS9100D Certification.
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Product
Electrical Calibration
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Trescal provides full Electrical Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Electrical Calibration services can be delivered at your site or at our lab. Accreditations for our electrical calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Signal Integrity Studio, Analysis & Simulation SW for WAVEPULSER High-Speed Interconnect Analyzer
WavePulser-Signal Integrity (SI) Studio
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WavePulser Signal Integrity (SI) Studio is included as a single license in the WavePulser 40iX-BUNDLE or can be purchased as an additional license for offline access to additional users. WavePulser Signal Integrity (SI) Studio combines S-parameter, Impedance profiling and de-embedding measurements, channel and equalizer modeling, eye diagrams and jitter analysis in a single affordable software package for emulating the complete serial data channel.
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Product
IV Tester System
PET-CC
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Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs)
